Otis; Charles

Patent Applications and Registrations

Patent applications and USPTO patent grants for Otis; Charles.The latest application filed is for "wastewater treatment system".

Company Profile

3.10.17

Otis; Charles - Milwaukee WI
Otis; Charles - Corvallis OR
Otis; Charles - Hillsboro OR
Otis; Charles - Corvalis OR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Wastewater Treatment System App 20210276902 - Neu; Kenneth E. ; et al.	2021-09-09
Septic Tank Treatment System App 20210047211 - Otis; Charles ; et al.	2021-02-18
Bubble Generator App 20190315641 - Otis; Charles	2019-10-17
Reflectron-electromagnetostatic cell for ECD fragmentation in mass spectrometers Grant 10,283,335 - Voinov , et al.	2019-05-07
Reflectron-electromagnetostatic Cell For Ecd Fragmentation In Mass Spectrometers App 20170352526 - Voinov; Valery G. ; et al.	2017-12-07
Chicane blanker assemblies for charged particle beam systems and methods of using the same Grant 9,767,984 - Kagarice , et al. September 19, 2	2017-09-19
Plasma ion source for use with a focused ion beam column with selectable ions Grant 9,627,169 - Graupera , et al. April 18, 2	2017-04-18
Chicane Blanker Assemblies for Charged Particle Beam Systems and Methods of Using the Same App 20160093470 - Kagarice; Kevin ; et al.	2016-03-31
Inductively-coupled Plasma Ion Source For Use With A Focused Ion Beam Column With Selectable Ions App 20160027607 - Graupera; Anthony ; et al.	2016-01-28
Inductively-coupled plasma ion source for use with a focused ion beam column with selectable ions Grant 9,087,671 - Graupera , et al. July 21, 2	2015-07-21
Inductively-coupled Plasma Ion Source For Use With A Focused Ion Beam Column With Selectable Ions App 20150129759 - Graupera; Anthony ; et al.	2015-05-14
Inductively-coupled plasma ion source for use with a focused ion beam column with selectable ions Grant 8,822,913 - Graupera , et al. September 2, 2	2014-09-02
Retarding field analyzer integral with particle beam column Grant 8,803,102 - Tuggle , et al. August 12, 2	2014-08-12
Retarding Field Analyzer Integral with Particle Beam Column App 20140117233 - Tuggle; David William ; et al.	2014-05-01
Inductively-Coupled Plasma Ion Source for Use with a Focused Ion Beam Column with Selectable Ions App 20130140450 - Graupera; Anthony ; et al.	2013-06-06
Laser micromachining and methods of same Grant 7,893,386 - Otis , et al. February 22, 2	2011-02-22
System for optically analyzing a substance with a selected single-wavelength Grant 7,791,728 - Beatty , et al. September 7, 2	2010-09-07
Projection light source having multiple light emitting diodes Grant 7,506,985 - Radominski , et al. March 24, 2	2009-03-24
Electro-optical wobulator App 20070097323 - Otis; Charles ; et al.	2007-05-03
Projection light source having multiple light emitting diodes App 20070091281 - Radominski; George Z. ; et al.	2007-04-26
System for optically analyzing a substance App 20070037272 - Beatty; Christopher C. ; et al.	2007-02-15
Characterizing electron beams App 20060212977 - Otis; Charles ; et al.	2006-09-21
Laser micromachining and methods of same App 20050103758 - Otis, Charles ; et al.	2005-05-19
Method of preparing a surface for adhesion App 20030136505 - Wimmer, Phillip L. ; et al.	2003-07-24

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