Otani; Yukitoshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Otani; Yukitoshi.The latest application filed is for "imaging apparatus for obtaining image of polarizing film, inspection apparatus, and inspection method".

Company Profile

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Otani; Yukitoshi - Utsunomiya JP
Otani; Yukitoshi - Utsunomiya-shi JP
Otani; Yukitoshi - Musashino JP
Otani; Yukitoshi - Tokyo JP
Otani; Yukitoshi - Koganei JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Imaging apparatus for obtaining image of polarizing film, inspection apparatus, and inspection method Grant 10,746,664 - Sasaki , et al. A	2020-08-18
Imaging Apparatus For Obtaining Image Of Polarizing Film, Inspection Apparatus, And Inspection Method App 20190033226 - Sasaki; Shunsuke ; et al.	2019-01-31
Axially symmetric polarization conversion element Grant 9,612,449 - Wakayama , et al. April 4, 2	2017-04-04
Axially Symmetric Polarization Conversion Element App 20150002934 - Wakayama; Toshitaka ; et al.	2015-01-01
Optical characteristic measuring apparatus and optical characteristics measuring method Grant 8,107,075 - Otani , et al. January 31, 2	2012-01-31
Measuring apparatus, measuring method, and characteristic measurement unit Grant 7,796,257 - Otani , et al. September 14, 2	2010-09-14
Optical Characteristic Measuring Apparatus, Optical Characteristic Measuring Method, and Optical Characteristic Measuring Unit App 20100103417 - Otani; Yukitoshi ; et al.	2010-04-29
Optical Characteristic Measuring Apparatus and Optical Characteristics Measuring Method App 20090213374 - Otani; Yukitoshi ; et al.	2009-08-27
Measuring Apparatus, Measuring Method, and Characteristic Measurement Unit App 20090051916 - Otani; Yukitoshi ; et al.	2009-02-26
Measuring Apparatus and Measuring Method App 20090040522 - Otani; Yukitoshi ; et al.	2009-02-12
Optical characteristic measuring apparatus and optical characteristic measuring method App 20090033936 - Otani; Yukitoshi ; et al.	2009-02-05
Surface shape measuring system Grant 6,906,809 - Fujiwara , et al. June 14, 2	2005-06-14
Method of measuring an inner stress state of disk substrate Grant 6,665,059 - Kanno , et al. December 16, 2	2003-12-16
Surface shape measuring system App 20030179385 - Fujiwara, Hisatoshi ; et al.	2003-09-25
Method of measuring inner stress state of disk substrate App 20010028451 - Kanno, Toshiyuki ; et al.	2001-10-11
Optical isolator device having a wider cutoff wavelength band for a return light beam Grant 5,375,009 - Otani , et al. December 20, 1	1994-12-20

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