Otani; Seiji
Patent Applications and Registrations
Patent applications and USPTO patent grants for Otani; Seiji.The latest application filed is for "method of manufacturing screw thread and screw thread".
- Otani; Seiji - Okazaki N/A JP
- Otani; Seiji - Okazaki-shi JP
- Otani; Seiji - Hitachinaka JP
- Otani; Seiji - Kamisato JP
- Otani; Seiji - Hadano JP
| Patent | Date |
|---|---|
| Method of manufacturing screw thread and screw thread Grant 9,604,298 - Shimizu , et al. March 28, 2 | 2017-03-28 |
| Method of Manufacturing Screw Thread and Screw Thread App 20140141896 - Shimizu; Toshiyuki ; et al. | 2014-05-22 |
| Inspection apparatus and inspection method Grant 8,345,233 - Suga , et al. January 1, 2 | 2013-01-01 |
| Method of apparatus for detecting particles on a specimen Grant 8,289,507 - Hamamatsu , et al. October 16, 2 | 2012-10-16 |
| Inspection Apparatus And Inspection Method App 20120140212 - Suga; Tadashi ; et al. | 2012-06-07 |
| Optical apparatus for defect inspection Grant 8,154,717 - Otani , et al. April 10, 2 | 2012-04-10 |
| Inspection apparatus and inspection method Grant 8,102,522 - Suga , et al. January 24, 2 | 2012-01-24 |
| Method Of Apparatus For Detecting Particles On A Specimen App 20110228258 - HAMAMATSU; Akira ; et al. | 2011-09-22 |
| Method of apparatus for detecting particles on a specimen Grant 7,952,700 - Hamamatsu , et al. May 31, 2 | 2011-05-31 |
| Method Of Apparatus For Detecting Particles On A Specimen App 20110032515 - HAMAMATSU; Akira ; et al. | 2011-02-10 |
| Optical Apparatus For Defect Inspection App 20100315626 - OTANI; Seiji ; et al. | 2010-12-16 |
| Method of apparatus for detecting particles on a specimen Grant 7,817,261 - Hamamatsu , et al. October 19, 2 | 2010-10-19 |
| Optical apparatus for defect inspection Grant 7,787,115 - Otani , et al. August 31, 2 | 2010-08-31 |
| Inspection apparatus and inspection method App 20090262339 - Suga; Tadashi ; et al. | 2009-10-22 |
| Optical Apparatus For Defect Inspection App 20090251690 - Otani; Seiji ; et al. | 2009-10-08 |
| Optical apparatus for defect inspection Grant 7,557,913 - Otani , et al. July 7, 2 | 2009-07-07 |
| Method Of Apparatus For Detecting Particles On A Specimen App 20080204724 - Hamamatsu; Akira ; et al. | 2008-08-28 |
| Method of apparatus for detecting particles on a specimen Grant 7,369,223 - Hamamatsu , et al. May 6, 2 | 2008-05-06 |
| Optical apparatus for defect inspection App 20080002195 - Otani; Seiji ; et al. | 2008-01-03 |
| Method of apparatus for detecting particles on a specimen App 20050213086 - Hamamatsu, Akira ; et al. | 2005-09-29 |
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