OTAKA; Akihiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for OTAKA; Akihiro.The latest application filed is for "inspection apparatus and inspection method".

Company Profile

5.9.10

OTAKA; Akihiro - Hamamatsu-shi Shizuoka
Otaka; Akihiro - Hamamatsu JP
Otaka; Akihiro - Yokosuka JP
Otaka; Akihiro - Yokosuka-shi JP
Otaka; Akihiro - Kanagawa JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Inspection Apparatus And Inspection Method App 20220198644 - NAKAMURA; Tomonori ; et al.	2022-06-23
Semiconductor device inspection method and semiconductor device inspection apparatus Grant 11,047,792 - Nakamura , et al. June 29, 2	2021-06-29
Image generating method, image generating device, image generating program, and storage medium Grant 11,009,531 - Otaka , et al. May 18, 2	2021-05-18
Image Generating Method, Image Generating Device, Image Generating Program, And Storage Medium App 20200241054 - OTAKA; Akihiro ; et al.	2020-07-30
Inspection method and inspection apparatus Grant 10,698,006 - Nakamura , et al.	2020-06-30
Image generating method, image generating device, image generating program, and storage medium Grant 10,656,187 - Otaka , et al.	2020-05-19
Semiconductor Device Inspection Method And Semiconductor Device Inspection Apparatus App 20190212252 - NAKAMURA; Tomonori ; et al.	2019-07-11
Image Generatiing Method, Image Generatiing Device, Image Generating Program, And Storage Medium App 20190064228 - OTAKA; Akihiro ; et al.	2019-02-28
Inspection Method And Inspection Apparatus App 20180031614 - NAKAMURA; Tomonori ; et al.	2018-02-01
Apparatus for testing a semiconductor device and method of testing a semiconductor device Grant 9,618,576 - Otaka , et al. April 11, 2	2017-04-11
Apparatus for frequency analyzing a measurement target and method of frequency analyzing a measurement target Grant 9,618,550 - Nakamura , et al. April 11, 2	2017-04-11
Optical line terminal and optical network unit Grant 9,596,046 - Kubo , et al. March 14, 2	2017-03-14
Apparatus For Testing A Semiconductor Device And Method Of Testing A Semiconductor Device App 20150153408 - OTAKA; Akihiro ; et al.	2015-06-04
Apparatus For Frequency Analyzing A Measurement Target And Method Of Frequency Analyzing A Measurement Target App 20150130474 - NAKAMURA; Tomonori ; et al.	2015-05-14
Optical line terminal and optical network unit Grant 8,929,737 - Kubo , et al. January 6, 2	2015-01-06
Optical Line Terminal And Optical Network Unit App 20130259468 - Kubo; Ryogo ; et al.	2013-10-03
Optical Line Terminal And Optical Network Unit App 20130202302 - KUBO; Ryogo ; et al.	2013-08-08
Optical Line Terminal And Optical Network Unit App 20110318008 - Kubo; Ryogo ; et al.	2011-12-29

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