Ota; Norihiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ota; Norihiro.The latest application filed is for "contact terminal, inspection jig, and inspection device".

Company Profile

9.12.17

Ota; Norihiro - Kyoto JP
Ota; Norihiro - Saitama JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Contact probe and electrical connection jig Grant 11,415,599 - Yamamoto , et al. August 16, 2	2022-08-16
Contact Terminal, Inspection Jig, And Inspection Device App 20220178968 - YOKOTA; Yusuke ; et al.	2022-06-09
Contact Terminal, Inspection Jig, And Inspection Device App 20220155346 - KAIDA; Michio ; et al.	2022-05-19
Contact Terminal, Inspection Jig, And Inspection Device App 20220155345 - OTA; Norihiro	2022-05-19
Inspection jig, and inspection device including the same Grant 11,327,094 - Ota May 10, 2	2022-05-10
Contact Terminal, Inspection Jig, And Inspection Apparatus App 20220026481 - OTA; Norihiro ; et al.	2022-01-27
Inspection Jig, Inspection Device, And Contact Terminal App 20210364553 - OTA; Norihiro ; et al.	2021-11-25
Inspection Jig, And Inspection Device Including The Same App 20210063438 - OTA; Norihiro	2021-03-04
Inspection jig provided with probe, substrate inspection device provided with same, and method for manufacturing inspection jig Grant 10,914,758 - Yamazaki , et al. February 9, 2	2021-02-09
Inspection jig, substrate inspection device, and method for manufacturing inspection jig Grant 10,877,069 - Ota December 29, 2	2020-12-29
Inspection jig and inspection device Grant 10,877,085 - Kanai , et al. December 29, 2	2020-12-29
Method For Producing Mi Element And Mi Element App 20200300930 - YAMAMOTO; Masami ; et al.	2020-09-24
Contact probe Grant 10,782,317 - Yamamoto , et al. Sept	2020-09-22
Inspection Jig, Method For Manufacturing Inspection Jig, And Inspection Apparatus Including Inspection Jig App 20200200797 - YAMAZAKI; Hidekazu ; et al.	2020-06-25
Contact terminal, inspection jig, and inspection device Grant 10,656,179 - Ota	2020-05-19
Contact terminal, inspection jig, and inspection device Grant 10,649,005 - Ota	2020-05-12
Contact terminal, inspection jig, and inspection apparatus Grant 10,649,004 - Ota	2020-05-12
Contact Probe And Electrical Connection Jig App 20190383858 - YAMAMOTO; Masami ; et al.	2019-12-19
Contact Terminal, Inspection Jig, And Inspection Device App 20190346485 - OTA; Norihiro	2019-11-14
Inspection Jig And Inspection Device App 20190302170 - KANAI; Toshihiko ; et al.	2019-10-03
Inspection Jig, Substrate Inspection Device Provided With Same, And Method For Manufacturing Inspection Jig App 20190271722 - YAMAZAKI; Hidekazu ; et al.	2019-09-05
Inspection Jig, Substrate Inspection Device, And Method For Manufacturing Inspection Jig App 20190265276 - OTA; Norihiro	2019-08-29
Contact Terminal, Inspection Jig, And Inspection Device App 20190178910 - OTA; Norihiro	2019-06-13
Contact Terminal, Inspection Jig, And Inspection Apparatus App 20190011479 - OTA; Norihiro	2019-01-10
Contact Probe App 20180340960 - YAMAMOTO; Masami ; et al.	2018-11-29
Inspection jig Grant 9,733,299 - Ota , et al. August 15, 2	2017-08-15
Inspection Jig App 20150123693 - OTA; Norihiro ; et al.	2015-05-07
Tunable semiconductor laser Grant 4,532,632 - Yamashita , et al. July 30, 1	1985-07-30
Optical switch device Grant 4,491,384 - Yamashita , et al. January 1, 1	1985-01-01

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