Oshima; Yoshimasa
Patent Applications and Registrations
Patent applications and USPTO patent grants for Oshima; Yoshimasa.The latest application filed is for "inspection apparatus".
Company Profile
0.38.31
- Oshima; Yoshimasa - Yokohama JP
- Oshima; Yoshimasa - Tokyo N/A JP
Patent Activity
| Patent | Date |
|---|---|
| Inspection apparatus Grant 9,506,872 - Oshima , et al. November 29, 2 | 2016-11-29 |
| Surface defect inspection method and apparatus Grant 8,934,092 - Oshima , et al. January 13, 2 | 2015-01-13 |
| Inspection Apparatus App 20140192353 - OSHIMA; Yoshimasa ; et al. | 2014-07-10 |
| Surface Defect Inspection Method And Apparatus App 20140176943 - OSHIMA; Yoshimasa ; et al. | 2014-06-26 |
| Inspection apparatus Grant 8,705,026 - Oshima , et al. April 22, 2 | 2014-04-22 |
| Inspecting method and inspecting apparatus for substrate surface Grant 8,654,350 - Hamamatsu , et al. February 18, 2 | 2014-02-18 |
| Surface Defect Inspection Method And Apparatus App 20130208271 - OSHIMA; Yoshimasa ; et al. | 2013-08-15 |
| Defect inspection method Grant 8,482,727 - Nakao , et al. July 9, 2 | 2013-07-09 |
| Defect inspection apparatus Grant 8,477,302 - Urano , et al. July 2, 2 | 2013-07-02 |
| Inspecting Method and Inspecting Apparatus For Substrate Surface App 20130107247 - Hamamatsu; Akira ; et al. | 2013-05-02 |
| Surface defect inspection method and apparatus Grant 8,400,629 - Oshima , et al. March 19, 2 | 2013-03-19 |
| Inspection Apparatus App 20120320373 - Oshima; Yoshimasa ; et al. | 2012-12-20 |
| Method and its apparatus for inspecting defects Grant 8,314,929 - Urano , et al. November 20, 2 | 2012-11-20 |
| Inspecting method and inspecting apparatus for substrate surface Grant 8,310,665 - Hamamatsu , et al. November 13, 2 | 2012-11-13 |
| Inspection apparatus Grant 8,264,679 - Oshima , et al. September 11, 2 | 2012-09-11 |
| Apparatus and method for inspecting defects Grant 8,218,138 - Nakano , et al. July 10, 2 | 2012-07-10 |
| Inspecting Method and Inspecting Apparatus for Substrate Surface App 20120162665 - Hamamatsu; Akira ; et al. | 2012-06-28 |
| Inspection Apparatus App 20120140211 - OSHIMA; Yoshimasa ; et al. | 2012-06-07 |
| Defect Inspection Method App 20120133926 - Nakao; Toshiyuki ; et al. | 2012-05-31 |
| Inspecting method and inspecting apparatus for substrate surface Grant 8,144,337 - Hamamatsu , et al. March 27, 2 | 2012-03-27 |
| Inspection apparatus Grant 8,120,766 - Oshima , et al. February 21, 2 | 2012-02-21 |
| Defect inspection method and apparatus Grant 8,115,915 - Nakao , et al. February 14, 2 | 2012-02-14 |
| Surface Defect Inspection Method And Apparatus App 20120008138 - OSHIMA; Yoshimasa ; et al. | 2012-01-12 |
| Apparatus and Method for Inspecting Defects App 20110255074 - Nakano; Hiroyuki ; et al. | 2011-10-20 |
| Surface defect inspection method and apparatus Grant 8,035,808 - Oshima , et al. October 11, 2 | 2011-10-11 |
| Method And Its Apparatus For Inspecting Defects App 20110211191 - Urano; Yuta ; et al. | 2011-09-01 |
| Apparatus and method for inspecting defects Grant 7,973,920 - Nakano , et al. July 5, 2 | 2011-07-05 |
| Method and apparatus for detecting defect on a surface of a specimen Grant 7,970,199 - Yoshida , et al. June 28, 2 | 2011-06-28 |
| Method and its apparatus for inspecting defects Grant 7,965,386 - Urano , et al. June 21, 2 | 2011-06-21 |
| Defect Inspection Method App 20110128534 - NAKAO; Toshiyuki ; et al. | 2011-06-02 |
| Method and Its Apparatus For Inspecting Defects App 20110080578 - Urano; Yuta ; et al. | 2011-04-07 |
| Defect inspection method Grant 7,916,288 - Nakao , et al. March 29, 2 | 2011-03-29 |
| Apparatus And Method For Inspecting Defects App 20110063603 - Nakano; Hiroyuki ; et al. | 2011-03-17 |
| Method and its apparatus for inspecting defects Grant 7,869,024 - Urano , et al. January 11, 2 | 2011-01-11 |
| Apparatus And Method For Inspecting Defects App 20100265496 - Nakano; Hiroyuki ; et al. | 2010-10-21 |
| Surface Defect Inspection Method And Apparatus App 20100265494 - Oshima; Yoshimasa ; et al. | 2010-10-21 |
| Defect Inspection Tool For Sample Surface And Defect Detection Method Therefor App 20100225904 - Oshima; Yoshimasa ; et al. | 2010-09-09 |
| Apparatus and method for inspecting defects Grant 7,768,635 - Nakano , et al. August 3, 2 | 2010-08-03 |
| Defect Inspection Method App 20100149528 - Nakao; Toshiyuki ; et al. | 2010-06-17 |
| Defect inspecting device for sample surface and defect detection method therefor Grant 7,719,673 - Oshima , et al. May 18, 2 | 2010-05-18 |
| Surface defect inspection method and apparatus Grant 7,710,557 - Oshima , et al. May 4, 2 | 2010-05-04 |
| Inspection Apparatus App 20100060895 - OSHIMA; Yoshimasa ; et al. | 2010-03-11 |
| Defect inspection method Grant 7,675,613 - Nakao , et al. March 9, 2 | 2010-03-09 |
| Inspecting Method and Inspecting Apparatus for Substrate Surface App 20090290168 - HAMAMATSU; Akira ; et al. | 2009-11-26 |
| Defect Inspection Apparatus App 20090279081 - Urano; Yuta ; et al. | 2009-11-12 |
| Method and Its Apparatus for Inspecting Defects App 20090257058 - URANO; Yuta ; et al. | 2009-10-15 |
| Defect Inspection Method App 20090195775 - Nakao; Toshiyuki ; et al. | 2009-08-06 |
| Apparatus And Method For Inspecting Defects App 20090122303 - Nakano; Hiroyuki ; et al. | 2009-05-14 |
| Surface Defect Inspection Method And Apparatus App 20080304055 - OSHIMA; Yoshimasa ; et al. | 2008-12-11 |
| Defect Inspection Tool For Sample Surface And Defect Detection Method Therefor App 20080151235 - Oshima; Yoshimasa ; et al. | 2008-06-26 |
| Apparatus And Method For Inspecting Defects App 20080144024 - Nakano; Hiroyuki ; et al. | 2008-06-19 |
| Apparatus and method for inspecting defects Grant 7,333,192 - Nakano , et al. February 19, 2 | 2008-02-19 |
| Method And Apparatus For Detecting Defect On A Surface Of A Specimen App 20070285670 - Yoshida; Minoru ; et al. | 2007-12-13 |
| Apparatus and method for inspecting defects App 20070177136 - Nakano; Hiroyuki ; et al. | 2007-08-02 |
| Method for detecting foreign matter and device for realizing same Grant 5,046,847 - Nakata , et al. September 10, 1 | 1991-09-10 |
| Automatic contaminants detection apparatus Grant 4,614,427 - Koizumi , et al. September 30, 1 | 1986-09-30 |
| Pattern detection system Grant 4,508,453 - Hara , et al. April 2, 1 | 1985-04-02 |
| Method and apparatus for inspecting specimen surface Grant 4,423,331 - Koizumi , et al. December 27, 1 | 1983-12-27 |
| Method and apparatus for projection type mask alignment Grant 4,362,389 - Koizumi , et al. December 7, 1 | 1982-12-07 |
| Apparatus for automatically checking external appearance of object Grant 4,242,702 - Kuni , et al. December 30, 1 | 1980-12-30 |
| Alignment pattern detecting apparatus Grant 4,115,762 - Akiyama , et al. September 19, 1 | 1978-09-19 |
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