Oshima; Hiromi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Oshima; Hiromi.The latest application filed is for "tester hardware".
- Oshima; Hiromi - Gunma N/A JP
- Oshima; Hiromi - Tokyo JP
- Oshima; Hiromi - Tochigi JP
- Oshima; Hiromi - Saitama JP
| Patent | Date |
|---|---|
| Test apparatus and test method Grant 8,981,786 - Oshima March 17, 2 | 2015-03-17 |
| Test apparatus and test method Grant 8,898,531 - Oshima November 25, 2 | 2014-11-25 |
| Test apparatus and test method Grant 8,718,123 - Yoshiba , et al. May 6, 2 | 2014-05-06 |
| Tester Hardware App 20130326299 - Oshima; Hiromi | 2013-12-05 |
| Test Apparatus And Test Method App 20120331346 - OSHIMA; Hiromi | 2012-12-27 |
| Test Apparatus And Test Method App 20120299606 - OSHIMA; Hiromi | 2012-11-29 |
| Test Apparatus And Test Method App 20120299600 - OSHIMA; Hiromi | 2012-11-29 |
| Test Apparatus And Test Method App 20120300826 - YOSHIBA; Kazumichi ; et al. | 2012-11-29 |
| Test Apparatus And Test Method App 20120304009 - OSHIMA; Hiromi | 2012-11-29 |
| Tool head, machine tool and boring method of bore of cylinder block using the machine tool Grant 8,287,214 - Sadaoka , et al. October 16, 2 | 2012-10-16 |
| Tool Head, Machine Tool And Boring Method Of Bore Of Cylinder Block Using The Machine Tool App 20090129879 - Sadaoka; Hideki ; et al. | 2009-05-21 |
| Memory testing method and memory testing apparatus Grant 6,877,118 - Oshima , et al. April 5, 2 | 2005-04-05 |
| Memory testing method and memory testing apparatus App 20010052093 - Oshima, Hiromi ; et al. | 2001-12-13 |
| Semiconductor memory test system Grant 5,757,815 - Shimogama , et al. May 26, 1 | 1998-05-26 |
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