Ose; Yoichi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Ose; Yoichi.The latest application filed is for "electron beam apparatus".
Company Profile
4.65.58
- Ose; Yoichi - Tokyo JP
- Ose; Yoichi - Mito JP
- Ose, Yoichi - Mito-shi JP
- Ose; Yoichi - Hitachi JP
Patent Activity
| Patent | Date |
|---|---|
| Electron Beam Apparatus App 20220165536 - Ohshima; Takashi ; et al. | 2022-05-26 |
| Electron microscope Grant 11,251,011 - Ohshima , et al. February 15, 2 | 2022-02-15 |
| Electron microscope Grant 11,087,947 - Ohshima , et al. August 10, 2 | 2021-08-10 |
| Electron Microscope App 20200303152 - OHSHIMA; Takashi ; et al. | 2020-09-24 |
| Electron source and electron beam device using the same Grant 10,707,046 - Kusunoki , et al. | 2020-07-07 |
| Field emission electron source, method for manufacturing same, and electron beam device Grant 10,586,674 - Kusunoki , et al. | 2020-03-10 |
| Electron Source and Electron Beam Device Using the Same App 20190385809 - KUSUNOKI; Toshiaki ; et al. | 2019-12-19 |
| Field Emission Electron Source, Method for Manufacturing Same, and Electron Beam Device App 20190066966 - KUSUNOKI; Toshiaki ; et al. | 2019-02-28 |
| Charged particle-beam device Grant 9,653,256 - Ikegami , et al. May 16, 2 | 2017-05-16 |
| Ion source and ion beam device using same Grant 9,640,360 - Shichi , et al. May 2, 2 | 2017-05-02 |
| Charged particle beam device and arithmetic device Grant 9,530,614 - Urano , et al. December 27, 2 | 2016-12-27 |
| Charged-Particle-Beam Device App 20160300690 - IKEGAMI; Akira ; et al. | 2016-10-13 |
| Electron microscope and electron beam detector Grant 9,355,815 - Imamura , et al. May 31, 2 | 2016-05-31 |
| Electron gun and charged particle beam device having an aperture with flare-suppressing coating Grant 9,293,293 - Watanabe , et al. March 22, 2 | 2016-03-22 |
| Observation specimen for use in electron microscopy, electron microscopy, electron microscope, and device for producing observation specimen Grant 9,202,668 - Miwa , et al. December 1, 2 | 2015-12-01 |
| Device for correcting diffraction aberration of electron beam Grant 9,123,501 - Fukuda , et al. September 1, 2 | 2015-09-01 |
| Charged particle microscope Grant 9,111,716 - Matsubara , et al. August 18, 2 | 2015-08-18 |
| Electron Microscope And Electron Beam Detector App 20150214002 - Imamura; Shin ; et al. | 2015-07-30 |
| Scanning ion microscope and secondary particle control method Grant 9,058,959 - Kawanami , et al. June 16, 2 | 2015-06-16 |
| Charged Particle Microscope App 20150083930 - Matsubara; Shinichi ; et al. | 2015-03-26 |
| Charged Particle Beam Device And Arithmetic Device App 20150060654 - Urano; Kotoko ; et al. | 2015-03-05 |
| Scanning Ion Microscope And Secondary Particle Control Method App 20150048247 - Kawanami; Yoshimi ; et al. | 2015-02-19 |
| Ion Source And Ion Beam Device Using Same App 20140299768 - Shichi; Hiroyasu ; et al. | 2014-10-09 |
| Gas field ion source and method for using same, ion beam device, and emitter tip and method for manufacturing same Grant 8,847,173 - Kawanami , et al. September 30, 2 | 2014-09-30 |
| Observation Specimen For Use In Electron Microscopy, Electron Microscopy, Electron Microscope, And Device For Producing Observation Specimen App 20140264018 - Miwa; Takafumi ; et al. | 2014-09-18 |
| Sample electrification measurement method and charged particle beam apparatus Grant 8,835,844 - Ezumi , et al. September 16, 2 | 2014-09-16 |
| Electron Gun And Charged Particle Beam Device App 20140197336 - Watanabe; Shun-ichi ; et al. | 2014-07-17 |
| Device For Correcting Diffraction Aberration Of Electron Beam App 20140124664 - Fukuda; Muneyuki ; et al. | 2014-05-08 |
| Scanning electron microscope Grant 8,698,080 - Arai , et al. April 15, 2 | 2014-04-15 |
| Ion microscope Grant 8,455,841 - Saho , et al. June 4, 2 | 2013-06-04 |
| Charged Particle Microscope and Ion Microscope App 20130126731 - Shichi; Hiroyasu ; et al. | 2013-05-23 |
| Gas Field Ion Source And Method For Using Same, Ion Beam Device, And Emitter Tip And Method For Manufacturing Same App 20130119252 - Kawanami; Yoshimi ; et al. | 2013-05-16 |
| Gas Field Ionization Ion Source, Scanning Charged Particle Microscope, Optical Axis Adjustment Method And Specimen Observation Method App 20130087704 - ISHITANI; Tohru ; et al. | 2013-04-11 |
| Charged Particle Microscope App 20120217391 - Shichi; Hiroyasu ; et al. | 2012-08-30 |
| Ion Microscope App 20120097863 - Saho; Norihide ; et al. | 2012-04-26 |
| Scanning electron microscope having a monochromator Grant 8,067,733 - Mori , et al. November 29, 2 | 2011-11-29 |
| Sample Electrification Measurement Method and Charged Particle Beam Apparatus App 20100294929 - Ezumi; Makoto ; et al. | 2010-11-25 |
| Monochromator and scanning electron microscope using the same Grant 7,838,827 - Ose , et al. November 23, 2 | 2010-11-23 |
| Electron beam apparatus with aberration corrector Grant 7,825,377 - Kawasaki , et al. November 2, 2 | 2010-11-02 |
| Sample electrification measurement method and charged particle beam apparatus Grant 7,700,918 - Ezumi , et al. April 20, 2 | 2010-04-20 |
| Scanning Electron Microscope Having A Monochromator App 20100044565 - MORI; Wataru ; et al. | 2010-02-25 |
| Scanning electron microscope having a monochromator Grant 7,612,336 - Mori , et al. November 3, 2 | 2009-11-03 |
| Electron beam apparatus and method for production of its specimen chamber Grant 7,566,892 - Inanobe , et al. July 28, 2 | 2009-07-28 |
| Gas field ionization ion source, scanning charged particle microscope, optical axis adjustment method and specimen observation method App 20090152462 - Ishitani; Tohru ; et al. | 2009-06-18 |
| Scanning electron microscope App 20090065694 - Arai; Noriaki ; et al. | 2009-03-12 |
| Electron beam apparatus with aberration corrector App 20090008551 - Kawasaki; Takeshi ; et al. | 2009-01-08 |
| Scanning electron microscope Grant 7,459,681 - Arai , et al. December 2, 2 | 2008-12-02 |
| Electron beam apparatus and method for production of its specimen chamber Grant 7,435,958 - Inanobe , et al. October 14, 2 | 2008-10-14 |
| Monochromator and scanning electron microscope using the same App 20080237463 - Ose; Yoichi ; et al. | 2008-10-02 |
| Sample electrification measurement method and charged particle beam apparatus App 20080201091 - Ezumi; Makoto ; et al. | 2008-08-21 |
| Focused ion beam apparatus and focused ion beam irradiation method Grant 7,411,192 - Takeuchi , et al. August 12, 2 | 2008-08-12 |
| Charged particle beam apparatus and charged particle beam irradiation method Grant 7,408,172 - Sato , et al. August 5, 2 | 2008-08-05 |
| Scanning electron microscope Grant 7,399,966 - Todokoro , et al. July 15, 2 | 2008-07-15 |
| Electron beam apparatus with aberration corrector Grant 7,375,323 - Kawasaki , et al. May 20, 2 | 2008-05-20 |
| Sample electrification measurement method and charged particle beam apparatus Grant 7,372,028 - Ezumi , et al. May 13, 2 | 2008-05-13 |
| Electron Beam Apparatus and Method for Production of Its Specimen Chamber App 20080048118 - Inanobe; Tsuyoshi ; et al. | 2008-02-28 |
| Charged Particle Beam Apparatus And Charged Particle Beam Irradiation Method App 20080042074 - SATO; MITSUGU ; et al. | 2008-02-21 |
| Monochromator and scanning electron microscope using the same Grant 7,315,024 - Ose , et al. January 1, 2 | 2008-01-01 |
| Scanning electron microscope Grant 7,294,835 - Todokoro , et al. November 13, 2 | 2007-11-13 |
| Charged particle beam apparatus and charged particle beam irradiation method Grant 7,282,722 - Sato , et al. October 16, 2 | 2007-10-16 |
| Scanning electron microscope App 20070221846 - Todokoro; Hideo ; et al. | 2007-09-27 |
| Scanning electron microscope having a monochromator App 20070181805 - Mori; Wataru ; et al. | 2007-08-09 |
| Electron beam apparatus with aberration corrector App 20070114409 - Kawasaki; Takeshi ; et al. | 2007-05-24 |
| Electron beam apparatus and method for production of its specimen chamber Grant 7,205,550 - Inanobe , et al. April 17, 2 | 2007-04-17 |
| Electron beam apparatus with aberration corrector Grant 7,199,365 - Kawasaki , et al. April 3, 2 | 2007-04-03 |
| Scanning electron microscope App 20070057183 - Arai; Noriaki ; et al. | 2007-03-15 |
| Electron beam apparatus and method for production of its specimen chamber App 20060232445 - Inanobe; Tsuyoshi ; et al. | 2006-10-19 |
| Electron beam apparatus and method for production of its specimen chamber App 20060219946 - Inanobe; Tsuyoshi ; et al. | 2006-10-05 |
| Sample electrification measurement method and charged particle beam apparatus App 20060219918 - Ezumi; Makoto ; et al. | 2006-10-05 |
| Monochromator and scanning electron microscope using the same App 20060219910 - Ose; Yoichi ; et al. | 2006-10-05 |
| Sample electrification measurement method and charged particle beam apparatus Grant 7,087,899 - Ezumi , et al. August 8, 2 | 2006-08-08 |
| Scanning electron microscope Grant 7,075,078 - Ose , et al. July 11, 2 | 2006-07-11 |
| Scanning electron microscope App 20060113474 - Todokoro; Hideo ; et al. | 2006-06-01 |
| Scanning electron microscope Grant 7,049,591 - Todokoro , et al. May 23, 2 | 2006-05-23 |
| Electron beam apparatus and method for production of its specimen chamber Grant 7,030,376 - Inanobe , et al. April 18, 2 | 2006-04-18 |
| Monochromator and scanning electron microscope using the same Grant 7,022,983 - Ose , et al. April 4, 2 | 2006-04-04 |
| Focused ion beam apparatus and focused ion beam irradiation method App 20060022150 - Takeuchi; Koichiro ; et al. | 2006-02-02 |
| Electron beam apparatus with aberration corrector App 20060016991 - Kawasaki; Takeshi ; et al. | 2006-01-26 |
| Electron beam apparatus with aberration corrector Grant 6,982,427 - Kawasaki , et al. January 3, 2 | 2006-01-03 |
| Scanning electron microscope Grant 6,979,821 - Suzuki , et al. December 27, 2 | 2005-12-27 |
| Charged particle beam apparatus and charged particle beam irradiation method App 20050253083 - Sato, Mitsugu ; et al. | 2005-11-17 |
| Charged particle beam apparatus and charged particle beam irradiation method Grant 6,956,211 - Sato , et al. October 18, 2 | 2005-10-18 |
| Sample electrification measurement method and charged particle beam apparatus Grant 6,946,656 - Ezumi , et al. September 20, 2 | 2005-09-20 |
| Sample electrification measurement method and charged particle beam apparatus App 20050161600 - Ezumi, Makoto ; et al. | 2005-07-28 |
| Scanning electron microscope App 20050139773 - Ose, Yoichi ; et al. | 2005-06-30 |
| Scanning electron microscope App 20050133719 - Todokoro, Hideo ; et al. | 2005-06-23 |
| Scanning electron microscope Grant 6,885,001 - Ose , et al. April 26, 2 | 2005-04-26 |
| Scanning electron microscope Grant 6,872,944 - Todokoro , et al. March 29, 2 | 2005-03-29 |
| Scanning electron microscope Grant 6,847,038 - Todokoro , et al. January 25, 2 | 2005-01-25 |
| Sample electrification measurement method and charged particle beam apparatus App 20040211899 - Ezumi, Makoto ; et al. | 2004-10-28 |
| Scanning electron microscope App 20040188612 - Ose, Yoichi ; et al. | 2004-09-30 |
| Monochromator and scanning electron microscope using the same App 20040188607 - Ose, Yoichi ; et al. | 2004-09-30 |
| Electron beam apparatus with aberration corrector App 20040188635 - Kawasaki, Takeshi ; et al. | 2004-09-30 |
| Scanning electron microscope Grant 6,787,772 - Ose , et al. September 7, 2 | 2004-09-07 |
| Electron beam apparatus and method for production of its specimen chamber App 20040135082 - Inanobe, Tsuyoshi ; et al. | 2004-07-15 |
| Charged particle beam apparatus and charged particle beam irradiation method App 20040119022 - Sato, Mitsugu ; et al. | 2004-06-24 |
| Scanning electron microscope App 20040113074 - Suzuki, Naomasa ; et al. | 2004-06-17 |
| Scanning electron microscope App 20040089805 - Todokoro, Hideo ; et al. | 2004-05-13 |
| Scanning electron microscope App 20040051041 - Todokoro, Hideo ; et al. | 2004-03-18 |
| Scanning electron microscope Grant 6,667,476 - Todokoro , et al. December 23, 2 | 2003-12-23 |
| Scanning electron microscope Grant 6,646,262 - Todokoro , et al. November 11, 2 | 2003-11-11 |
| Scanning Electron Microscope App 20030127604 - TODOKORO, HIDEO ; et al. | 2003-07-10 |
| Scanning electron microscope App 20030122074 - Suzuki, Naomasa ; et al. | 2003-07-03 |
| Scanning electron microscope Grant 6,555,819 - Suzuki , et al. April 29, 2 | 2003-04-29 |
| Scanning electron microscope Grant 6,501,077 - Sawahata , et al. December 31, 2 | 2002-12-31 |
| Scanning electron microscope App 20010010357 - Ose, Yoichi ; et al. | 2001-08-02 |
| Ion trap mass spectrometer Grant 6,121,610 - Yoshinari , et al. September 19, 2 | 2000-09-19 |
| Scanning electron microscope and its analogous device Grant 5,894,124 - Iwabuchi , et al. April 13, 1 | 1999-04-13 |
| Apparatus for suppressing electrification of sample in charged beam irradiation apparatus Grant 5,668,368 - Sakai , et al. September 16, 1 | 1997-09-16 |
| Mass spectrometry apparatus Grant 5,633,496 - Sakairi , et al. May 27, 1 | 1997-05-27 |
| Apparatus and method for ion beam neutralization Grant 5,576,538 - Sakai , et al. November 19, 1 | 1996-11-19 |
| Apparatus and method for suppressing electrification of sample in charged beam irradiation apparatus Grant 5,466,929 - Sakai , et al. November 14, 1 | 1995-11-14 |
| Secondary charged particle analyzing apparatus and secondary charged particle extracting section Grant 5,089,699 - Ose , et al. February 18, 1 | 1992-02-18 |
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