Osaki; Mayuka

Patent Applications and Registrations

Patent applications and USPTO patent grants for Osaki; Mayuka.The latest application filed is for "electronic microscope device".

Company Profile

6.8.11

Osaki; Mayuka - Tokyo JP
Osaki; Mayuka - Yokohama N/A JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Electronic microscope device Grant 11,355,304 - Nishihata , et al. June 7, 2	2022-06-07
Electron microscope apparatus, inspection system using electron microscope apparatus, and inspection method using electron microscope apparatus Grant 11,302,513 - Nishihata , et al. April 12, 2	2022-04-12
Pattern cross-sectional shape estimation system and program Grant 11,211,226 - Yokosuka , et al. December 28, 2	2021-12-28
Scanning electron microscope and calculation method for three-dimensional structure depth Grant 11,164,720 - Yasui , et al. November 2, 2	2021-11-02
Electronic Microscope Device App 20210225608 - NISHIHATA; Takahiro ; et al.	2021-07-22
Scanning Electron Microscopy System And Pattern Depth Measurement Method App 20210027983 - Nishihata; Takahiro ; et al.	2021-01-28
Electron Microscope Apparatus, Inspection System Using Electron Microscope Apparatus, And Inspection Method Using Electron Microscope Apparatus App 20210012998 - Nishihata; Takahiro ; et al.	2021-01-14
Pattern Cross-sectional Shape Estimation System And Program App 20200321189 - YOKOSUKA; Toshiyuki ; et al.	2020-10-08
Scanning Electron Microscope And Calculation Method For Three-dimensional Structure Depth App 20200234916 - YASUI; Kenji ; et al.	2020-07-23
Scanning electron microscope Grant 10,186,399 - Osaki , et al. Ja	2019-01-22
Scanning Electron Microscope App 20170301513 - OSAKI; Mayuka ; et al.	2017-10-19
Pattern evaluation method and pattern evaluation device Grant 9,488,815 - Miyamoto , et al. November 8, 2	2016-11-08
Charged Particle Microscope System and Measurement Method Using Same App 20150235804 - Osaki; Mayuka ; et al.	2015-08-20
Pattern Evaluation Method And Pattern Evaluation Device App 20140320627 - Miyamoto; Atsushi ; et al.	2014-10-30
Estimating shape based on comparison between actual waveform and library in lithography process Grant 8,671,366 - Tanaka , et al. March 11, 2	2014-03-11
Pattern Shape Estimation Method and Pattern Measuring Device App 20120151428 - Tanaka; Maki ; et al.	2012-06-14
Pattern Shape Selection Method And Pattern Measuring Device App 20120126116 - Tanaka; Maki ; et al.	2012-05-24
Method For Evaluating Superimposition Of Pattern App 20110268363 - Osaki; Mayuka ; et al.	2011-11-03

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