ORBON; Jacob J.
Patent Applications and Registrations
Patent applications and USPTO patent grants for ORBON; Jacob J..The latest application filed is for "systems, methods and apparatus that employ statistical analysis of structural test information to identify yield loss mechanisms".
- ORBON; Jacob J. - Cupertino CA US
- Orbon; Jacob J - Morgan Hill CA
- Orbon; Jacob J. - Morgan Hill CA
| Patent | Date |
|---|---|
| Systems, Methods And Apparatus That Employ Statistical Analysis Of Structural Test Information To Identify Yield Loss Mechanisms App 20170220706 - ORBON; Jacob J. ; et al. | 2017-08-03 |
| Method for operating a secure semiconductor IP server to support failure analysis Grant 8,060,851 - Dokken , et al. November 15, 2 | 2011-11-15 |
| Grouping systematic defects with feedback from electrical inspection Grant 7,760,929 - Orbon , et al. July 20, 2 | 2010-07-20 |
| Method For Operating A Secure Semiconductor Ip Server To Support Failure Analysis App 20100031092 - DOKKEN; RICHARD C. ; et al. | 2010-02-04 |
| Grouping Systematic Defects With Feedback From Electrical Inspection App 20070052963 - ORBON; JACOB J. ; et al. | 2007-03-08 |
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