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name:-0.0061981678009033
name:-0.0034890174865723
name:-0.00046706199645996
Ophir; Boaz Patent Filings

Ophir; Boaz

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ophir; Boaz.The latest application filed is for "machine learning for metrology measurements".

Company Profile
0.3.5
  • Ophir; Boaz - Haifa IL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Machine learning for metrology measurements
Grant 11,410,290 - Ophir , et al. August 9, 2
2022-08-09
Machine Learning for Metrology Measurements
App 20210142466 - Ophir; Boaz ;   et al.
2021-05-13
Automatic image segmentation
Grant 9,999,402 - Chevion , et al. June 19, 2
2018-06-19
Automatic Image Segmentation
App 20160015360 - Chevion; Dan ;   et al.
2016-01-21
Optical character recognition verification
Grant 8,249,399 - Barkan , et al. August 21, 2
2012-08-21
Optical Character Recognition Verification
App 20100067794 - Barkan; Ella ;   et al.
2010-03-18
Method For Extracting Text From A Compound Digital Image
App 20090148043 - Ophir; Boaz ;   et al.
2009-06-11
Method and computer program product for generating recognition error correction information
App 20090144056 - Aizenbud-Reshef; Netta ;   et al.
2009-06-04

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