Openganden; Gennady
Patent Applications and Registrations
Patent applications and USPTO patent grants for Openganden; Gennady.The latest application filed is for "high-resolution x-ray diffraction measurement with enhanced sensitivity".
- Openganden; Gennady - Kiryat Yam IL
| Patent | Date |
|---|---|
| High-resolution X-ray diffraction measurement with enhanced sensitivity Grant 8,731,138 - Yokhin , et al. May 20, 2 | 2014-05-20 |
| Enhancing accuracy of fast high-resolution X-ray diffractometry Grant 8,687,766 - Wormington , et al. April 1, 2 | 2014-04-01 |
| High-Resolution X-Ray Diffraction Measurement with Enhanced Sensitivity App 20120281814 - Yokhin; Boris ; et al. | 2012-11-08 |
| High-resolution X-ray diffraction measurement with enhanced sensitivity Grant 8,243,878 - Yokhin , et al. August 14, 2 | 2012-08-14 |
| Enhancing Accuracy Of Fast High-resolution X-ray Diffractometry App 20120014508 - Wormington; Matthew ; et al. | 2012-01-19 |
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