Oominami; Yuusuke
Patent Applications and Registrations
Patent applications and USPTO patent grants for Oominami; Yuusuke.The latest application filed is for "chemical susceptibility inspection method".
- Oominami; Yuusuke - Tokyo JP
| Patent | Date |
|---|---|
| Charged particle beam device Grant 11,239,051 - Yoshihara , et al. February 1, 2 | 2022-02-01 |
| Chemical Susceptibility Inspection Method App 20210269847 - MATSUBARA; Shigeki ; et al. | 2021-09-02 |
| Charged Particle Microscope and Method of Imaging Sample App 20210233740 - SHOUJI; Minami ; et al. | 2021-07-29 |
| Cell Analysis Apparatus And Cell Analysis Method App 20210181127 - HISADA; Akiko ; et al. | 2021-06-17 |
| Support System For Specified Inspection, Support Method For Specified Inspection, And Non-transitory Computer Readable Medium App 20200278303 - TADA; Nobuyoshi ; et al. | 2020-09-03 |
| Charged Particle Beam Device App 20190378687 - YOSHIHARA; Mai ; et al. | 2019-12-12 |
| Method for adjusting height of sample and observation system Grant 10,141,157 - Nakabayashi , et al. Nov | 2018-11-27 |
| Charged particle beam device Grant 10,134,564 - Okumura , et al. November 20, 2 | 2018-11-20 |
| Method for Adjusting Height of Sample and Observation System App 20180174796 - NAKABAYASHI; Makoto ; et al. | 2018-06-21 |
| Electron scanning microscope and image generation method Grant 9,875,877 - Kawanishi , et al. January 23, 2 | 2018-01-23 |
| Charged Particle Beam Device App 20170330724 - OKUMURA; Taiga ; et al. | 2017-11-16 |
| Sample holder with light emitting and transferring elements for a charged particle beam apparatus Grant 9,812,288 - Shouji , et al. November 7, 2 | 2017-11-07 |
| Sample Holder, Observation System, And Image Generation Method App 20170069458 - SHOUJI; Minami ; et al. | 2017-03-09 |
| Electron Scanning Microscope And Image Generation Method App 20160343538 - KAWANISHI; Shinsuke ; et al. | 2016-11-24 |
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