Ooki; Hiroshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ooki; Hiroshi.The latest application filed is for "illumination optical assembly, exposure apparatus, and device manufacturing method".

Company Profile

3.13.8

Ooki; Hiroshi - Tokyo JP
Ooki; Hiroshi - Yokohama JP
Ooki; Hiroshi - Yokohama-shi JP
Ooki; Hiroshi - Kanagawa JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Illumination optical assembly, exposure apparatus, and device manufacturing method Grant 10,578,973 - Tanaka , et al.	2020-03-03
Optical characteristic measuring method, optical characteristic adjusting method, exposure apparatus, exposing method, and exposure apparatus manufacturing method by detecting a light amount of measuring light Grant 10,222,293 - Ooki , et al.	2019-03-05
Copy processing management system and copy processing management method Grant 9,880,765 - Sakai , et al. January 30, 2	2018-01-30
Illumination Optical Assembly, Exposure Apparatus, And Device Manufacturing Method App 20170045824 - Tanaka; Hirohisa ; et al.	2017-02-16
Copy Processing Management System And Copy Processing Management Method App 20160357465 - SAKAI; Atsushi ; et al.	2016-12-08
Illumination optical assembly, exposure apparatus, and device manufacturing method Grant 9,513,560 - Tanaka , et al. December 6, 2	2016-12-06
Illumination Optical Assembly, Exposure Apparatus, And Device Manufacturing Method App 20140307245 - Tanaka; Hirohisa ; et al.	2014-10-16
Microscope Grant 8,081,378 - Osawa , et al. December 20, 2	2011-12-20
Optical characteristic measuring method, optical characteristic adjusting method, exposure apparatus, exposing method, and exposure apparatus manufacturing method App 20100195072 - Ooki; Hiroshi ; et al.	2010-08-05
Microscope App 20090268280 - Osawa; Hisao ; et al.	2009-10-29
Fluorescence Detection Using Lyman-alpha Line Illumination App 20090236543 - Ooki; Hiroshi ; et al.	2009-09-24
Microscope Observation Method, Microscope, Differentiation Interference Microscope, Phase Difference Microscope, Interference Microscope, Image Processing Method, and Image Processing Device App 20070242133 - Ooki; Hiroshi	2007-10-18
Wave surface aberration measurement device, wave surface aberration measurement method, and projection lens fabricated by the device and the method Grant 6,693,704 - Ooki , et al. February 17, 2	2004-02-17
Microscope App 20010030802 - Ooki, Hiroshi ; et al.	2001-10-18
Image formation method with photosensitive material Grant 6,291,145 - Kokubo , et al. September 18, 2	2001-09-18
Linear/rotary actuator and winding machine including same Grant 6,081,051 - Kitazawa , et al. June 27, 2	2000-06-27
Projection exposure system and method Grant 5,847,812 - Ooki , et al. December 8, 1	1998-12-08
Apparatus for observing a surface using polarized light Grant 5,764,363 - Ooki , et al. June 9, 1	1998-06-09
Exposure method and apparatus Grant 5,739,898 - Ozawa , et al. April 14, 1	1998-04-14
Laser scanning microscope utilizing detection of a far-field diffraction pattern with 2-dimensional detection Grant 5,621,532 - Ooki , et al. April 15, 1	1997-04-15

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