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name:-0.011352062225342
name:-0.010167121887207
name:-0.00054216384887695
Ono; Yusaku Patent Filings

Ono; Yusaku

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ono; Yusaku.The latest application filed is for "semiconductor device and its manufacturing method thereof, mask for semiconductor manufacture, and optical proximity correction method".

Company Profile
0.9.7
  • Ono; Yusaku - Tokyo JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Semiconductor device which is subjected to optical proximity correction
Grant 8,719,740 - Taoka , et al. May 6, 2
2014-05-06
Semiconductor Device And Its Manufacturing Method Thereof, Mask For Semiconductor Manufacture, And Optical Proximity Correction Method
App 20130249597 - TAOKA; Hironobu ;   et al.
2013-09-26
Semiconductor device including logic circuit having areas of different optical proximity accuracy
Grant 8,458,627 - Taoka , et al. June 4, 2
2013-06-04
Semiconductor Device And Manufacturing Method Thereof, Mask For Semiconductor Manufacture, And Optical Proximity Correction Method
App 20120091510 - TAOKA; Hironobu ;   et al.
2012-04-19
Semiconductor device and its manufacturing method, semiconductor manufacturing mask, and optical proximity processing method
Grant 8,103,977 - Taoka , et al. January 24, 2
2012-01-24
Method for designing a semiconductor integrated circuit layout capable of reducing the processing time for optical proximity effect correction
Grant 7,844,934 - Ono , et al. November 30, 2
2010-11-30
Semiconductor Device and its Manufacturing Method, Semiconductor Manufacturing Mask, and Optical Proximity Processing Method
App 20090278569 - Taoka; Hironobu ;   et al.
2009-11-12
Method for designing semiconductor integrated circuit layout
App 20070124714 - Ono; Yusaku ;   et al.
2007-05-31
Apparatus for correcting data of layout pattern
Grant 6,848,096 - Ono January 25, 2
2005-01-25
Correction of layout pattern data during semiconductor patterning process
Grant 6,687,885 - Ono February 3, 2
2004-02-03
Apparatus for correcting data of layout pattern
App 20030208741 - Ono, Yusaku
2003-11-06
Apparatus and method of correcting layout pattern data, method of manufacturing semiconductor devices and recording medium
Grant 6,536,015 - Ono March 18, 2
2003-03-18
Correction of layout pattern data during semiconductor patterning process
App 20020026624 - Ono, Yusaku
2002-02-28
Apparatus and method of correcting layout pattern data, method of manufacturing semiconductor devices and recording medium
App 20020007481 - Ono, Yusaku
2002-01-17
Apparatus and method for inhibiting pattern distortions to correct pattern data in a semiconductor device
Grant 6,298,473 - Ono , et al. October 2, 2
2001-10-02

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