Ono; Ryuei
Patent Applications and Registrations
Patent applications and USPTO patent grants for Ono; Ryuei.The latest application filed is for "method of measuring gap depth of thin film magnetic head for horizontal magnetic recording, and method of measuring neck height of thin film magnetic head for vertical magnetic recording".
- Ono; Ryuei - Kawasaki JP
| Patent | Date |
|---|---|
| Method of measuring gap depth of thin film magnetic head for horizontal magnetic recording, and method of measuring neck height of thin film magnetic head for vertical magnetic recording App 20080186513 - Ono; Ryuei | 2008-08-07 |
| Wafer and insulation characteristic monitoring method App 20080100960 - Kakehi; Masahiro ; et al. | 2008-05-01 |
| Evaluation method of fine pattern, manufacturing method of device having the fine pattern App 20080038849 - Orimoto; Takamitsu ; et al. | 2008-02-14 |
| Magnetic head App 20070297096 - Aoki; Tomoka ; et al. | 2007-12-27 |
| Magnetic head and method of producing the same App 20070285836 - Ono; Ryuei ; et al. | 2007-12-13 |
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