Onizawa; Akihiro
Patent Applications and Registrations
Patent applications and USPTO patent grants for Onizawa; Akihiro.The latest application filed is for "pattern measurement device, and computer program for measuring pattern".
- Onizawa; Akihiro - Tokyo JP
- Onizawa; Akihiro - Mito N/A JP
| Patent | Date |
|---|---|
| Pattern measurement device, and computer program for measuring pattern Grant 10,545,018 - Yamaguchi , et al. Ja | 2020-01-28 |
| Pattern Measurement Device, and Computer Program for Measuring Pattern App 20160320182 - YAMAGUCHI; Satoru ; et al. | 2016-11-03 |
| Global alignment using multiple alignment pattern candidates Grant 9,057,873 - Miyamoto , et al. June 16, 2 | 2015-06-16 |
| Pattern Evaluation Device And Pattern Evaluation Method App 20150146967 - Miyamoto; Atsushi ; et al. | 2015-05-28 |
| Global Alignment Using Multiple Alignment Pattern Candidates App 20130234019 - Miyamoto; Atsushi ; et al. | 2013-09-12 |
| Pattern measurement apparatus Grant 8,445,871 - Matsuoka , et al. May 21, 2 | 2013-05-21 |
| Pattern Measurement Apparatus App 20100202654 - MATSUOKA; Ryoichi ; et al. | 2010-08-12 |
| Pattern measurement apparatus Grant 7,732,792 - Matsuoka , et al. June 8, 2 | 2010-06-08 |
| Pattern Measurement Apparatus App 20090039263 - MATSUOKA; Ryoichi ; et al. | 2009-02-12 |
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