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Method for a predicting a pattern shape by using an actual measured dissolution rate of a photosensitive resist Grant 7,319,944 - Nakamura , et al. January 15, 2 | 2008-01-15 |
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Semiconductor device manufacturing method to form resist pattern, and substrate processing apparatus App 20070128554 - Kawamura; Daisuke ;   et al. | 2007-06-07 |
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Pattern forming method, underlayer film forming composition, and method of manufacturing semiconductor device App 20060115990 - Seino; Yuriko ;   et al. | 2006-06-01 |
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Computer implemented method for development profile simulation, computer program product for controlling a computer system so as to simulate development profile, and computer implemented method for mask pattern data correction App 20040236548 - Nakamura, Hiroko ;   et al. | 2004-11-25 |
Method for forming a pattern and method of manufacturing semiconductor device Grant 6,806,021 - Sato , et al. October 19, 2 | 2004-10-19 |
Photosensitive composition having uniform concentration distribution of components and pattern formation method using the same Grant 6,703,181 - Hayashi , et al. March 9, 2 | 2004-03-09 |
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Manufacturing method of semiconductor device using mask pattern having high etching resistance Grant 6,576,562 - Ohuchi , et al. June 10, 2 | 2003-06-10 |
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