loadpatents
name:-0.01780891418457
name:-0.014665842056274
name:-0.0061938762664795
Onishi; Takako Patent Filings

Onishi; Takako

Patent Applications and Registrations

Patent applications and USPTO patent grants for Onishi; Takako.The latest application filed is for "zeolite and manufacturing method thereof".

Company Profile
4.12.14
  • Onishi; Takako - Tokyo JP
  • Onishi; Takako - Kyotanabe JP
  • ONISHI; Takako - Kyotanabe-shi JP
  • Onishi; Takako - Kyoto JP
  • Onishi; Takako - Sodegaura N/A JP
  • Onishi; Takako - Chiba JP
  • Onishi; Takako - Sodegaura-shi JP
  • Onishi; Takako - Toyokawa JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Zeolite and Manufacturing Method Thereof
App 20220073360 - Wakihara; Toru ;   et al.
2022-03-10
Inspection management system, inspection management apparatuses, and inspection management method
Grant 11,154,001 - Mori , et al. October 19, 2
2021-10-19
Inspection management system, inspection management apparatuses, and inspection management method
Grant 10,876,977 - Mori , et al. December 29, 2
2020-12-29
X-ray inspection apparatus and X-ray inspection method
Grant 10,605,748 - Sugita , et al.
2020-03-31
Inspection apparatus
Grant 10,545,101 - Sugita , et al. Ja
2020-01-28
Inspection Management System, Inspection Management Apparatuses, And Inspection Management Method
App 20190219521 - MORI; Hiroyuki ;   et al.
2019-07-18
Inspection Management System, Inspection Management Apparatuses, And Inspection Management Method
App 20190223337 - MORI; Hiroyuki ;   et al.
2019-07-18
X-ray inspection apparatus and control method
Grant 10,054,432 - Kasahara , et al. August 21, 2
2018-08-21
X-ray Inspection Apparatus And Control Method
App 20180080763 - KASAHARA; Hironori ;   et al.
2018-03-22
Inspection Apparatus
App 20170356860 - SUGITA; Shinji ;   et al.
2017-12-14
X-ray Inspection Apparatus And X-ray Inspection Method
App 20170356859 - SUGITA; Shinji ;   et al.
2017-12-14
Data Structure, Library Creation Device, Electronic Device Analysis Device, And Library Provision System
App 20160267443 - Hisano; Atsushi ;   et al.
2016-09-15
Compound with amyloid affinity
Grant 9,211,350 - Okumura , et al. December 15, 2
2015-12-15
Compound having affinity for amyloid
Grant 9,149,546 - Okumura , et al. October 6, 2
2015-10-06
Novel Compound Having Affinity For Amyloid
App 20140228569 - Okumura; Yuki ;   et al.
2014-08-14
Novel Compound With Amyloid Affinity
App 20140121377 - Okumura; Yuki ;   et al.
2014-05-01
Board inspecting apparatus, its parameter setting method and parameter setting apparatus
Grant 7,822,261 - Moriya , et al. October 26, 2
2010-10-26
PC board inspecting method and apparatus and inspection logic setting method and apparatus
Grant 7,715,616 - Moriya , et al. May 11, 2
2010-05-11
Board inspecting apparatus, its parameter setting method and parameter setting apparatus
App 20060291713 - Moriya; Toshihiro ;   et al.
2006-12-28
PC board inspecting method and apparatus and inspection logic setting method and apparatus
App 20060204074 - Moriya; Toshihiro ;   et al.
2006-09-14
PC board inspecting apparatus, inspection logic setting method, and inspection logic setting apparatus
App 20060153439 - Moriya; Toshihiro ;   et al.
2006-07-13
Remote controller for a printer
Grant D290,969 - Sutou , et al. July 21, 1
1987-07-21

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