ONISHI; Shuhei
Patent Applications and Registrations
Patent applications and USPTO patent grants for ONISHI; Shuhei.The latest application filed is for "temperature measurement method".
- ONISHI; Shuhei - Kyoto-shi JP
- Onishi; Shuhei - Tokyo JP
- Onishi; Shuhei - Kyoto JP
- Onishi, Shuhei - Ibaraki-shi JP
| Patent | Date |
|---|---|
| Temperature Measurement Method App 20220277972 - ONISHI; Shuhei ; et al. | 2022-09-01 |
| Information Processing Apparatus, System, Method And Program App 20210149355 - Yamaguchi; Norio ; et al. | 2021-05-20 |
| Display device and x-ray CT device Grant 10,724,971 - Harada , et al. | 2020-07-28 |
| Display Device And X-ray Ct Device App 20180328864 - HARADA; Daisuke ; et al. | 2018-11-15 |
| Section reconstruction method and radiographic apparatus App 20030021373 - Ukita, Masaaki ; et al. | 2003-01-30 |
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