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Onishi; Fujio Patent Filings

Onishi; Fujio

Patent Applications and Registrations

Patent applications and USPTO patent grants for Onishi; Fujio.The latest application filed is for "automatic analyzer and optical measurement method".

Company Profile
1.5.7
  • Onishi; Fujio - Tokyo JP
  • Onishi; Fujio - Yokohama JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Automatic Analyzer And Optical Measurement Method
App 20210310933 - Suzuki; Kosuke ;   et al.
2021-10-07
Light amount detection device, immune analyzing apparatus and charged particle beam apparatus that each use the light amount detection device
Grant 10,168,208 - Kasai , et al. J
2019-01-01
Charged particle beam device provided with ion pump
Grant 10,121,631 - Tone , et al. November 6, 2
2018-11-06
Charged Particle Beam Device Provided With Ion Pump
App 20180158648 - TONE; Masazumi ;   et al.
2018-06-07
Light Amount Detection Device, Immune Analyzing Apparatus And Charged Particle Beam Apparatus That Each Use The Light Amount Detection Device
App 20180066986 - KASAI; Yutaka ;   et al.
2018-03-08
Light signal detecting circuit, light amount detecting device, and charged particle beam device
Grant 9,322,711 - Onishi , et al. April 26, 2
2016-04-26
Light Signal Detecting Circuit, Light Amount Detecting Device, And Charged Particle Beam Device
App 20150153223 - Onishi; Fujio ;   et al.
2015-06-04
Light quantity detection method and device therefor
Grant 8,797,522 - Namba , et al. August 5, 2
2014-08-05
Light Quantity Detection Method and Device Therefor
App 20130114073 - Namba; Akihiro ;   et al.
2013-05-09
Patterned Medium Inspection Method And Inspection Apparatus
App 20120194939 - NISHIMOTO; Takuma ;   et al.
2012-08-02

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