loadpatents
name:-0.042042970657349
name:-0.049463987350464
name:-0.014883995056152
ONISHI; Atsushi Patent Filings

ONISHI; Atsushi

Patent Applications and Registrations

Patent applications and USPTO patent grants for ONISHI; Atsushi.The latest application filed is for "herbicidal composition".

Company Profile
7.21.27
  • ONISHI; Atsushi - Osaka JP
  • Onishi; Atsushi - Nagoya Aichi JP
  • Onishi; Atsushi - Tokyo JP
  • Onishi; Atsushi - Nagoya JP
  • Onishi; Atsushi - Kyoto JP
  • ONISHI; Atsushi - Kyoto-shi JP
  • Onishi; Atsushi - Tsukuba JP
  • Onishi; Atsushi - Yokohama JP
  • Onishi; Atsushi - Ibaraki JP
  • Onishi; Atsushi - Kanagawa JP
  • Onishi; Atsushi - Yokkaichi JP
  • Onishi; Atsushi - Tsukuba-shi JP
  • Onishi; Atsushi - Kanagawa-ken JP
  • Onishi; Atsushi - Yokkaichi-Shi JP
  • Onishi; Atsushi - Yokohama-Shi JP
  • Onishi; Atsushi - Inaraki JP
  • Onishi, Atsushi - Ibara JP
  • Onishi; Atsushi - Kobe JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Herbicidal Composition
App 20220202018 - SUGANUMA; Taketo ;   et al.
2022-06-30
Defect inspection apparatus and defect inspection method
Grant 10,943,048 - Nojima , et al. March 9, 2
2021-03-09
Non-fried potato chips
Grant 10,750,767 - Onishi , et al. A
2020-08-25
Floodlight
Grant 10,711,989 - Ishizawa , et al.
2020-07-14
Defect Inspection Apparatus And Defect Inspection Method
App 20200089838 - NOJIMA; Kazuhiro ;   et al.
2020-03-19
SEM inspection apparatus and pattern matching method
Grant 10,546,374 - Onishi , et al. Ja
2020-01-28
Sem Inspection Apparatus And Pattern Matching Method
App 20190080445 - ONISHI; Atsushi ;   et al.
2019-03-14
Floodlight
App 20190041049 - ISHIZAWA; Hirotoshi ;   et al.
2019-02-07
Culture container
Grant 10,138,454 - Obi , et al. Nov
2018-11-27
Culture Container
App 20170067006 - OBI; Naoko ;   et al.
2017-03-09
Culture Container
App 20170051241 - OBI; Naoko ;   et al.
2017-02-23
Defect Inspection Apparatus And Defect Inspection Method
App 20160093465 - NAGANO; Osamu ;   et al.
2016-03-31
Non-fried Potato Chips And Production Method Therefor
App 20150320094 - ONISHI; Atsushi ;   et al.
2015-11-12
Non-fried Potato Chips And Production Method Therefor
App 20150272180 - Onishi; Atsushi ;   et al.
2015-10-01
Non-fried Potato Chips
App 20150079267 - Onishi; Atsushi ;   et al.
2015-03-19
Separating agent for an enantiomeric isomer
Grant 8,092,677 - Suzuki , et al. January 10, 2
2012-01-10
Pattern matching method, program and semiconductor device manufacturing method
Grant 8,036,445 - Onishi , et al. October 11, 2
2011-10-11
Filler used for separating optical isomers and process for separating optical isomers with the filler
Grant 7,749,389 - Onishi , et al. July 6, 2
2010-07-06
Mask pattern inspection method, exposure condition verification method, and manufacturing method of semiconductor device
Grant 7,674,570 - Nagahama , et al. March 9, 2
2010-03-09
Substrate inspection method, method of manufacturing semiconductor device, and substrate inspection apparatus
Grant 7,645,988 - Nagahama , et al. January 12, 2
2010-01-12
Method of producing ethyl (3R, 5S, 6E)-7-[2 cyclopropyl-4-(fluorophenyl) quinoline-3-yl]-3, 5-dihydroxy-6-heptenoate
Grant 7,550,596 - Onishi , et al. June 23, 2
2009-06-23
Defect inspecting apparatus for semiconductor wafer
Grant 7,512,501 - Morinaga , et al. March 31, 2
2009-03-31
Separating agent for an Enantiomeric Isomer
App 20080199630 - Suzuki; Shinsuke ;   et al.
2008-08-21
Separating agent for an optical enantiomeric isomer
Grant 7,407,576 - Suzuki , et al. August 5, 2
2008-08-05
Packing material for separation of optical isomer and method of separating optical isomer with the same
Grant 7,399,409 - Onishi , et al. July 15, 2
2008-07-15
Electron beam apparatus with detailed observation function and sample inspecting and observing method using electron beam apparatus
Grant 7,352,195 - Watanabe , et al. April 1, 2
2008-04-01
Defect inspecting apparatus, defect inspecting method, semiconductor device manufacturing system, and semiconductor device manufacturing method
App 20080052021 - Morinaga; Hiroyuki ;   et al.
2008-02-28
Electron beam apparatus with detailed observation function and sample inspecting and observing method using electron beam apparatus
App 20070200569 - Watanabe; Kenji ;   et al.
2007-08-30
Substrate inspection apparatus, substrate inspection method and semiconductor device manufacturing method
App 20070194232 - Nagahama; Ichirota ;   et al.
2007-08-23
Process for producing packing for resolving optical isomers
Grant 7,258,794 - Ikeda , et al. August 21, 2
2007-08-21
Electron beam apparatus with detailed observation function and sample inspecting and observing method using electron beam apparatus
Grant 7,212,017 - Watanabe , et al. May 1, 2
2007-05-01
Filler used for separating optical isomers and process for separating optical isomers with the filler
App 20070084796 - Onishi; Atsushi ;   et al.
2007-04-19
Mask pattern inspection method, exposure condition verification method, and manufacturing method of semiconductor device
App 20070009811 - Nagahama; Ichirota ;   et al.
2007-01-11
Defect inspection apparatus, program, and manufacturing method of semiconductor device
Grant 7,148,479 - Onishi , et al. December 12, 2
2006-12-12
Pattern matching method, program and semiconductor device manufacturing method
App 20060110042 - Onishi; Atsushi ;   et al.
2006-05-25
Method of producing Ethyl (3R, 5S, 6E)-7-[2 cyclopropyl-4-(fluorophenyl) quinoline-3-yl]-3, 5-dihydroxy-6-heptenoate
App 20060089381 - Onishi; Atsushi ;   et al.
2006-04-27
Separating agent for optical isomers
App 20060081522 - Onishi; Atsushi ;   et al.
2006-04-20
Optical isomer separating filler, production method therefor and application method therefor
Grant 6,991,729 - Ikeda , et al. January 31, 2
2006-01-31
Process for producing packing for resolving optical isomers
App 20060016756 - Ikeda; Hirokazu ;   et al.
2006-01-26
Separating agent for optical isomer
App 20060011533 - Suzuki; Shinsuke ;   et al.
2006-01-19
Substrate inspection method, method of manufacturing semiconductor device, and substrate inspection apparatus
App 20050263701 - Nagahama, Ichirota ;   et al.
2005-12-01
Defect inspection apparatus, program, and manufacturing method of semiconductor device
App 20050230618 - Onishi, Atsushi ;   et al.
2005-10-20
Process for producing optically active ethyl (3R, 5S, 6E)-7-[2-cycloproply-4-(4-fluorophenyl)quinolin-3-yl]-3,5-dihydroxy-6-hept enoate
Grant 6,946,557 - Onishi , et al. September 20, 2
2005-09-20
Electron beam apparatus with detailed observation function and sample inspecting and observing method using electron beam apparatus
App 20050199807 - Watanabe, Kenji ;   et al.
2005-09-15
Process for producing optically active ethly (3r, 5s, 6e)-7- [2-cycloproply-4-(4-fluorophenyl)quinolin-3-yl]-3,5-dihydroxy-6-heptenoat- e
App 20050075502 - Onishi, Atsushi ;   et al.
2005-04-07
Optical isomer separating filler, production method therefor and application method therefor
App 20040112830 - Ikeda, Hirokazu ;   et al.
2004-06-17
Packing material for separation of optical isomer and method of separating optical isomer with the same
App 20040060871 - Onishi, Atsushi ;   et al.
2004-04-01
Control apparatus for hydraulic excavator
Grant 5,999,872 - Kinugawa , et al. December 7, 1
1999-12-07

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