Ong; Biow Hiem

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ong; Biow Hiem.The latest application filed is for "methods for fabricating microelectronic devices with contacts to conductive staircase steps, and related devices and systems".

Company Profile

1.9.8

Ong; Biow Hiem - Singapore SG

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods For Fabricating Microelectronic Devices With Contacts To Conductive Staircase Steps, And Related Devices And Systems App 20220045007 - Ong; Biow Hiem ; et al.	2022-02-10
Apparatus Including Conductive Lines And Contacts, And Related Methods And Memory Devices App 20210375670 - Zhang; Xiaosong ; et al.	2021-12-02
Methods for fabricating microelectronic devices with contacts to conductive staircase steps, and related devices and systems Grant 11,158,577 - Ong , et al. October 26, 2	2021-10-26
Apparatus comprising structures including contact vias and conductive lines, related methods, and memory devices Grant 11,101,171 - Zhang , et al. August 24, 2	2021-08-24
Methods For Fabricating Microelectronic Devices With Contacts To Conductive Staircase Steps, And Related Devices And Systems App 20210242131 - Ong; Biow Hiem ; et al.	2021-08-05
Apparatus Comprising Structures Including Contact Vias And Conductive Lines, Related Methods, And Memory Devices App 20210050252 - Zhang; Xiaosong ; et al.	2021-02-18
Systems and methods eliminating false defect detections Grant 9,689,805 - Ong , et al. June 27, 2	2017-06-27
Systems and Methods Eliminating False Defect Detections App 20150316489 - Ong; Biow-Hiem ; et al.	2015-11-05
Systems and methods eliminating false defect detections Grant 9,063,097 - Ong , et al. June 23, 2	2015-06-23
Rendered database image-to-inspection image optimization for inspection Grant 8,818,072 - Ong , et al. August 26, 2	2014-08-26
Contamination inspection Grant 8,629,407 - Lai , et al. January 14, 2	2014-01-14
Contamination Inspection App 20120261563 - Lai; Chien-Hung ; et al.	2012-10-18
Systems and Methods Eliminating False Defect Detections App 20120207381 - Ong; Biow-Hiem ; et al.	2012-08-16
Rendered Database Image-to-inspection Image Optimization For Inspection App 20120051621 - Ong; Biow-Hiem ; et al.	2012-03-01

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