On-Chip Technologies, Inc.

Patent Applications and Registrations

Patent applications and USPTO patent grants for On-Chip Technologies, Inc..The latest application filed is for "serially decoded digital device testing".

Company Profile

0.9.13

On-Chip Technologies, Inc. - Aptos CA
ON-CHIP TECHNOLOGIES, INC. -
On-Chip Technologies, Inc. - Los Gatos CA
ON-CHIP TECHNOLOGIES, INC. - 495 Sleeper Avenue Mountain View CA
On-Chip Technologies, Inc. - Los Altos Hills CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Serially decoded digital device testing Grant 7,797,595 - Cooke September 14, 2	2010-09-14
Serially Decoded Digital Device Testing App 20090316506 - Cooke; Laurence H.	2009-12-24
Variable Clocked Scan Test Improvements App 20080163020 - Cooke; Laurence H. ; et al.	2008-07-03
Variable clocked scan test improvements Grant 7,353,470 - Cooke , et al. April 1, 2	2008-04-01
Scan string segmentation for digital test compression App 20070168798 - Cooke; Laurence H.	2007-07-19
Accelerated Scan Circuitry and Method for Reducing Scan Test Data Volume and Execution Time App 20070162803 - Dervisoglu; Bulent ; et al.	2007-07-12
Variable clocked scan test circuitry and method Grant 7,234,092 - Cooke June 19, 2	2007-06-19
Accelerated scan circuitry and method for reducing scan test data volume and execution time Grant 7,200,784 - Dervisoglu , et al. April 3, 2	2007-04-03
Accelerated scan circuitry and method for reducing scan test data volume and execution time Grant 7,197,681 - Dervisoglu , et al. March 27, 2	2007-03-27
Accelerated scan circuitry and method for reducing scan test data volume and execution time Grant 7,188,286 - Dervisoglu , et al. March 6, 2	2007-03-06
Hashing and serial decoding techniques App 20070050596 - Cooke; Laurence H.	2007-03-01
Variable clocked scan test improvements App 20060195746 - Cooke; Laurence H. ; et al.	2006-08-31
On-chip service processor Grant 7,080,301 - Dervisoglu , et al. July 18, 2	2006-07-18
On-chip service processor App 20060064615 - Dervisoglu; Bulent ; et al.	2006-03-23
Design techniques to increase testing efficiency App 20060041798 - Cooke; Laurence H.	2006-02-23
On-chip service processor Grant 6,964,001 - Dervisoglu , et al. November 8, 2	2005-11-08
Accelerated scan circuitry and method for reducing scan test data volume and execution time App 20050154948 - Dervisoglu, Bulent ; et al.	2005-07-14
Accelerated scan circuitry and method for reducing scan test data volume and execution time App 20050028060 - Dervisoglu, Bulent ; et al.	2005-02-03
On-chip service processor App 20040187054 - Dervisoglu, Bulent ; et al.	2004-09-23
Accelerated scan circuitry and method for reducing scan test data volume and execution time App 20040148554 - Dervisoglu, Bulent ; et al.	2004-07-29
On-chip service processor for test and debug of integrated circuits Grant 6,687,865 - Dervisoglu , et al. February 3, 2	2004-02-03
Variable clocked scan test circuitry and method App 20030229834 - Cooke, Laurence H.	2003-12-11

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