| Patent | Date |
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Transmissive Small-angle Scattering Device
App 20220170869 - Matsushima; Naoki ; et al. | 2022-06-02 |
Imaging Type X-ray Microscope
App 20220128487 - OMOTE; Kazuhiko ; et al. | 2022-04-28 |
Analysis method for fine structure, apparatus, and program
Grant 11,131,637 - Ito , et al. September 28, 2 | 2021-09-28 |
X-ray inspection device
Grant 11,079,345 - Matsushima , et al. August 3, 2 | 2021-08-03 |
Scattering Measurement Analysis Method, Scattering Measurement Analysis Device, And Non-Transitory Computer-Readable Storage Medium Storing Scattering Measurement Analysis Program
App 20210200922 - IWATA; Tomoyuki ; et al. | 2021-07-01 |
Fluorescent X-ray Analysis Apparatus
App 20210116399 - Ogata; Kiyoshi ; et al. | 2021-04-22 |
Hybrid inspection system
Grant 10,983,073 - Ogata , et al. April 20, 2 | 2021-04-20 |
Soller slit, X-ray diffraction apparatus, and method
Grant 10,964,439 - Pina , et al. March 30, 2 | 2021-03-30 |
X-ray Inspection Device
App 20210063326 - Matsushima; Naoki ; et al. | 2021-03-04 |
X-ray inspecting device, X-ray thin film inspecting method, and method for measuring rocking curve
Grant 10,876,978 - Ogata , et al. December 29, 2 | 2020-12-29 |
X-ray generator and x-ray analysis device
Grant 10,854,348 - Omote , et al. December 1, 2 | 2020-12-01 |
Analysis Method For Fine Structure, Apparatus, And Program
App 20200333268 - ITO; Yoshiyasu ; et al. | 2020-10-22 |
Analysis Method For Fine Structure, And Apparatus And Program Thereof
App 20200333267 - ITO; Yoshiyasu ; et al. | 2020-10-22 |
X-ray reflectometer
Grant 10,598,616 - Murakami , et al. | 2020-03-24 |
X-ray thin film inspection device
Grant 10,514,345 - Ogata , et al. Dec | 2019-12-24 |
X-ray thin film inspection device
Grant 10,473,598 - Ogata , et al. Nov | 2019-11-12 |
X-ray diffractometer with multilayer reflection-type monochromator
Grant 10,436,723 - Osakabe , et al. O | 2019-10-08 |
X-ray small angle optical system
Grant 10,429,325 - Ito , et al. October 1, 2 | 2019-10-01 |
X-ray Reflectometer
App 20190277781 - Murakami; Satoshi ; et al. | 2019-09-12 |
X-ray Generator And X-ray Analysis Device
App 20190272929 - Omote; Kazuhiko ; et al. | 2019-09-05 |
Hybrid Inspection System
App 20190227006 - Ogata; Kiyoshi ; et al. | 2019-07-25 |
X-ray Inspecting Device, X-ray Thin Film Inspecting Method, And Method For Measuring Rocking Curve
App 20190227005 - Ogata; Kiyoshi ; et al. | 2019-07-25 |
Grazing incidence x-ray fluorescence spectrometer and grazing incidence x-ray fluorescence analyzing method
Grant 10,302,579 - Omote , et al. | 2019-05-28 |
Soller Slit, X-ray Diffraction Apparatus, And Method
App 20190122782 - PINA; LADISLAV ; et al. | 2019-04-25 |
Beam generation unit and X-ray small-angle scattering apparatus
Grant 10,145,808 - Omote , et al. De | 2018-12-04 |
X-ray Thin Film Inspection Device
App 20170299528 - Ogata; Kiyoshi ; et al. | 2017-10-19 |
Grazing Incidence X-ray Fluorescence Spectrometer And Grazing Incidence X-ray Fluorescence Analyzing Method
App 20170284949 - OMOTE; Kazuhiko ; et al. | 2017-10-05 |
X-ray Thin Film Inspection Device
App 20170234814 - Ogata; Kiyoshi ; et al. | 2017-08-17 |
X-ray Diffractometer
App 20170191950 - OSAKABE; Takeshi ; et al. | 2017-07-06 |
X-ray topography apparatus
Grant 9,658,174 - Omote , et al. May 23, 2 | 2017-05-23 |
X-ray Small Angle Optical System
App 20170074809 - ITO; Kazuki ; et al. | 2017-03-16 |
Beam Generation Unit And X-ray Small-angle Scattering Apparatus
App 20170010226 - Omote; Kazuhiko ; et al. | 2017-01-12 |
X-ray topography apparatus
Grant 9,335,282 - Omote , et al. May 10, 2 | 2016-05-10 |
X-ray apparatus, method of using the same and X-ray irradiation method
Grant 9,336,917 - Ozawa , et al. May 10, 2 | 2016-05-10 |
X-ray imaging apparatus, and X-ray imaging method
Grant 9,250,199 - Omote , et al. February 2, 2 | 2016-02-02 |
X-ray generating apparatus
Grant 9,159,524 - Horvarth , et al. October 13, 2 | 2015-10-13 |
X-ray intensity correction method and X-ray diffractometer
Grant 9,086,367 - Mitsunaga , et al. July 21, 2 | 2015-07-21 |
X-ray Topography Apparatus
App 20150146858 - OMOTE; Kazuhiko ; et al. | 2015-05-28 |
Target for X-ray generator, method of manufacturing the same and X-ray generator
Grant 9,020,101 - Omote , et al. April 28, 2 | 2015-04-28 |
Surface microstructure measurement method, surface microstructure measurement data analysis method and X-ray scattering measurement device
Grant 8,908,830 - Omote , et al. December 9, 2 | 2014-12-09 |
X-ray scattering measurement device and X-ray scattering measurement method
Grant 8,767,918 - Omote , et al. July 1, 2 | 2014-07-01 |
Motion control system and X-ray measurement apparatus
Grant 8,712,013 - Kani , et al. April 29, 2 | 2014-04-29 |
X-ray Generating Apparatus
App 20140105367 - HORVARTH; Martin ; et al. | 2014-04-17 |
X-ray Imaging Apparatus, And X-ray Imaging Method
App 20140003578 - OMOTE; Kazuhiko ; et al. | 2014-01-02 |
X-ray Topography Apparatus
App 20130259200 - OMOTE; Kazuhiko ; et al. | 2013-10-03 |
Target For X-ray Generator, Method Of Manufacturing The Same And X-ray Generator
App 20130259207 - OMOTE; Kazuhiko ; et al. | 2013-10-03 |
X-ray Intensity Correction Method And X-ray Diffractometer
App 20130121460 - MITSUNAGA; Toru ; et al. | 2013-05-16 |
X-ray Image Photographing Method And X-ray Image Photographing Apparatus
App 20120087470 - OMOTE; Kazuhiko ; et al. | 2012-04-12 |
Surface Microstructure Measurement Method, Surface Microstructure Measurement Data Analysis Method And X-ray Scattering Measurement Device
App 20120087473 - Omote; Kazuhiko ; et al. | 2012-04-12 |
Motion Control System And X-ray Measurement Apparatus
App 20120053733 - KANI; Tetsuo ; et al. | 2012-03-01 |
X-ray Scattering Measurement Device And X-ray Scattering Measurement Method
App 20120051518 - Omote; Kazuhiko ; et al. | 2012-03-01 |
Method for X-ray wavelength measurement and X-ray wavelength measurement apparatus
Grant 8,085,900 - Omote December 27, 2 | 2011-12-27 |
X-ray Apparatus, Method Of Using The Same And X-ray Irradiation Method
App 20110268252 - Ozawa; Tetsuya ; et al. | 2011-11-03 |
Method For X-ray Wavelength Measurement And X-ray Wavelength Measurement Apparatus
App 20100111254 - OMOTE; Kazuhiko | 2010-05-06 |
Method for X-ray wavelength measurement and X-ray wavelength measurement apparatus
App 20080240354 - Omote; Kazuhiko | 2008-10-02 |
Method for measuring dead time of X-ray detector
Grant 7,342,997 - Ueda , et al. March 11, 2 | 2008-03-11 |
Method and apparatus for X-ray reflectance measurement
Grant 7,257,192 - Omote August 14, 2 | 2007-08-14 |
Method for analyzing membrane structure and apparatus therefor
Grant 7,248,669 - Ito , et al. July 24, 2 | 2007-07-24 |
Method for X-ray reflectance measurement
Grant 7,221,734 - Omote May 22, 2 | 2007-05-22 |
Method for measuring dead time of X-ray detector
App 20060285642 - Ueda; Tomoyasu ; et al. | 2006-12-21 |
Method and apparatus for film thickness measurement
Grant 7,130,373 - Omote , et al. October 31, 2 | 2006-10-31 |
Non-uniform density sample analyzing method, device and system
Grant 7,116,755 - Omote October 3, 2 | 2006-10-03 |
Method of performing analysis using propagation rays and apparatus for performing the same
Grant 7,098,459 - Omote , et al. August 29, 2 | 2006-08-29 |
Method for analyzing film structure and apparatus therefor
Grant 7,039,161 - Ito , et al. May 2, 2 | 2006-05-02 |
X-ray diffraction apparatus
Grant 7,035,373 - Omote April 25, 2 | 2006-04-25 |
Method and apparatus for X-ray reflectance measurement
App 20060013362 - Omote; Kazuhiko | 2006-01-19 |
Method and apparatus for measuring thin film, and thin film deposition system
Grant 6,970,532 - Hayashi , et al. November 29, 2 | 2005-11-29 |
Method and apparatus for film thickness measurement
App 20050220267 - Omote, Kazuhiko ; et al. | 2005-10-06 |
Method for X-ray reflectance measurement
App 20050207532 - Omote, Kazuhiko | 2005-09-22 |
Pole measuring method
Grant 6,937,694 - Yokoyama , et al. August 30, 2 | 2005-08-30 |
Density-nonuniform multilayer film analyzing method, and apparatus and system thereof
Grant 6,920,200 - Ito , et al. July 19, 2 | 2005-07-19 |
Method for analyzing film structure and apparatus therefor
App 20050105686 - Ito, Yoshiyasu ; et al. | 2005-05-19 |
Method for analyzing membrane structure and apparatus therefor
App 20050102110 - Ito, Yoshiyasu ; et al. | 2005-05-12 |
Method of estimating preferred orientation of polycrystalline material
Grant 6,873,681 - Toraya , et al. March 29, 2 | 2005-03-29 |
Non-uniform density sample analyzing method, device and system
App 20040195498 - Omote, Kazuhiko | 2004-10-07 |
X-ray diffraction apparatus
App 20040190681 - Omote, Kazuhiko | 2004-09-30 |
Density-nonuniform multilayer film analyzing method, and apparatus and system thereof
App 20040066893 - Ito, Yoshiyasu ; et al. | 2004-04-08 |
Method of estimating preferred orientation of polycrystalline material
App 20030235270 - Toraya, Hideo ; et al. | 2003-12-25 |
Method of performing analysis using propagation rays and apparatus for performing the same
App 20030231737 - Omote, Kazuhiko ; et al. | 2003-12-18 |
Analyzing method for non-uniform-density sample and device and system thereof
App 20030157559 - Omote, Kazuhiko ; et al. | 2003-08-21 |
Pole measuring method
App 20030012335 - Yokoyama, Ryouichi ; et al. | 2003-01-16 |
Combinatorial X-ray diffractor
Grant 6,459,763 - Koinuma , et al. October 1, 2 | 2002-10-01 |
Fluorescent x-ray analyzing method and apprartus
Grant 6,385,281 - Ozawa , et al. May 7, 2 | 2002-05-07 |
Method and apparatus for measuring thin film, and thin film deposition system
App 20010043668 - Hayashi, Seiichi ; et al. | 2001-11-22 |
Apparatus for x-ray analysis
Grant 6,249,566 - Hayashi , et al. June 19, 2 | 2001-06-19 |
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