Olympus NDT, Inc.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Olympus NDT, Inc..The latest application filed is for "aparatus and method for conducting and real-time application of ec probe calibration".

Company Profile

0.30.29

Olympus NDT, Inc. - Waltham MA US
Olympus NDT Inc. -

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Ultrasonic testing instrument with dithery pulsing Grant 9,638,673 - Langlois , et al. May 2, 2	2017-05-02
Automatic calibration for phased array inspection of girth weld Grant 9,476,859 - Habermehl , et al. October 25, 2	2016-10-25
Method and circuitry for removing circling drifts in NDT/NDI measurement display Grant 9,350,985 - Thomas May 24, 2	2016-05-24
Method for monitoring the integrity of an eddy current inspection channel Grant 9,316,618 - LePage April 19, 2	2016-04-19
Sizing of a defect using phased array system Grant 9,222,918 - St-Laurent , et al. December 29, 2	2015-12-29
Instrument and method of measuring the concentration of a target element in a multi-layer thin coating Grant 9,182,363 - Chen November 10, 2	2015-11-10
Hall effect probe with exchangeable wear tips Grant 9,182,212 - Stanton , et al. November 10, 2	2015-11-10
X-ray analysis apparatus with detector window protection feature Grant 9,176,080 - Drummy November 3, 2	2015-11-03
Aparatus And Method For Conducting And Real-time Application Of Ec Probe Calibration App 20150276371 - XU; Xiangdeng ; et al.	2015-10-01
Assembly with a universal manipulator for inspecting dovetail of different sizes Grant 9,110,036 - Lepage August 18, 2	2015-08-18
Packet Based Dds Minimizing Mathematical And Dac Noise App 20150212184 - Thomas; Andrew	2015-07-30
Method And Circuitry For Removing Circling Drifts In Ndt/ndi Measurement Display App 20150085143 - THOMAS; Andrew	2015-03-26
Method And System Of Signal Representation For Ndt/ndi Devices App 20150049108 - Bourgelas; Tommy	2015-02-19
System And Method Of Non-destructive Inspection With A Visual Scanning Guide App 20150039245 - Langlois; Pierre ; et al.	2015-02-05
Reciprocal interface panels suitable for multi-purpose actuators Grant 8,913,006 - DeAngelo , et al. December 16, 2	2014-12-16
2D coil and a method of obtaining EC response of 3D coils using the 2D coil configuration Grant 8,896,300 - Lepage November 25, 2	2014-11-25
Apparatus for and a method of improved timing control for non-destructive testing and inspection Grant 8,829,763 - Thomas September 9, 2	2014-09-09
Eddy current array configuration with reduced length and thickness Grant 8,816,680 - LePage August 26, 2	2014-08-26
Sizing Of A Defect Using Phased Array System App 20140236499 - St-Laurent; Martin ; et al.	2014-08-21
Rotating array probe system for non-destructive testing Grant 8,798,940 - Imbert , et al. August 5, 2	2014-08-05
X-ray analysis apparatus with radiation monitoring feature Grant 8,787,523 - Sackett July 22, 2	2014-07-22
Hall Effect Measurement Instrument With Temperature Compensation App 20140132254 - Thomas; Andrew ; et al.	2014-05-15
Circuitry for measuring and compensating phase and amplitude differences in NDT/NDI operation Grant 8,712,716 - Thomas , et al. April 29, 2	2014-04-29
Ultrasonic Testing Instrument With Dithery Pulsing App 20140109675 - Langlois; Pierre ; et al.	2014-04-24
Shielded eddy current coils and methods for forming same on printed circuit boards Grant 8,704,513 - Lepage April 22, 2	2014-04-22
Multi-frequency bond testing Grant 8,700,342 - Lepage , et al. April 15, 2	2014-04-15
Bench top X-ray fluorescence (XRF) instrument Grant D702,350 - Nasella April 8, 2	2014-04-08
Non-destructive Testing Instrument With Display Features Indicating Signal Saturation App 20140088921 - Hayot; Hanan ; et al.	2014-03-27
Non-destructive inspection instrument employing multiple sensor technologies in an integral enclosure Grant 8,670,952 - Drummy March 11, 2	2014-03-11
Assembly With A Universal Manipulator For Inspecting Dovetail Of Different Sizes App 20140035568 - Lepage; Benoit	2014-02-06
Eddy Current Array Configuration With Reduced Length And Thickness App 20140002072 - LEPAGE; Benoit	2014-01-02
Method And System Of Using 1.5d Phased Array Probe For Cylindrical Parts Inspection App 20130283918 - Habermehl; Jason ; et al.	2013-10-31
Eddy Current Array Probe And Method For Lift-off Compensation During Operation Without Known Lift References App 20130249540 - Lepage; Benoit	2013-09-26
System and method of conducting refraction angle verification for phased array probes using standard calibration blocks Grant 8,521,446 - Zhang , et al. August 27, 2	2013-08-27
Orthogonal eddy current probe for multi-directional inspection Grant 8,519,702 - Lepage August 27, 2	2013-08-27
Method And A Device Of Phased Array Inspection With Pulse Rate Optimization App 20130197841 - SIMARD; Christian ; et al.	2013-08-01
Image Processing System And Method For Ndt/ndi Testing Devices App 20130060488 - Ghabour; Ehab ; et al.	2013-03-07
Weld seam tracking system using phased array ultrasonic devices Grant 8,365,602 - Imbert , et al. February 5, 2	2013-02-05
Circuitry For Measuring And Compensating Phase And Amplitude Differences In Ndt/ndi Operation App 20130030726 - THOMAS; Andrew ; et al.	2013-01-31
Automatic calibration error detection for ultrasonic inspection devices Grant 8,336,365 - Deangelo , et al. December 25, 2	2012-12-25
Non-destructive Inspection Instrument Employing Multiple Sensor Technologies In An Integral Enclosure App 20120265491 - DRUMMY; Michael	2012-10-18
Casing of NDT/NDI instrument Grant D668,564 - Poirier October 9, 2	2012-10-09
Shielded Eddy Current Coils And Methods For Forming Same On Printed Circuit Boards App 20120206132 - Lepage; Benoit	2012-08-16
System And Method Of Conducting Refraction Angle Verification For Phased Array Probes Using Standard Calibration Blocks App 20120130653 - ZHANG; Jinchi ; et al.	2012-05-24
Material inspection methods and devices Grant 8,174,407 - LaBreck , et al. May 8, 2	2012-05-08
System and method for derivation and real-time application of acoustic V-path correction data Grant 8,156,784 - DeAngelo , et al. April 17, 2	2012-04-17
High dynamic range NDT/NDI inspection device with selective noise averaging Grant 8,156,813 - Thomas April 17, 2	2012-04-17
Orthogonal Eddy Current Probe For Multi-directional Inspection App 20120025816 - LEPAGE; Benoit	2012-02-02
2d Coil And A Method Of Obtaining Ec Response Of 3d Coils Using The 2d Coil Configuration App 20120007595 - Lepage; Benoit	2012-01-12
Rotating Array Probe System For Non-destructive Testing App 20110257903 - IMBERT; Christophe ; et al.	2011-10-20
Over-molding of a casing for a non-destructive inspection instrument Grant D640,580 - Bibeau , et al. June 28, 2	2011-06-28
High Dynamic Range Ndt/ndi Inspection Device With Selective Noise Averaging App 20110132092 - Thomas; Andrew	2011-06-09
Ultrasonic Internal Rotating Inspection Probe That Self-eliminates Air Bubbles App 20110113883 - Bourgelas; Tommy	2011-05-19
User Designated Measurement Display System And Method For Ndt/ndi With High Rate Input Data App 20100100344 - Patel; Jayesh ; et al.	2010-04-22

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.