Okuda; Yasushi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Okuda; Yasushi.The latest application filed is for "soot blower".

Company Profile

2.11.4

Okuda; Yasushi - Hiroshima JP
Okuda; Yasushi - Kyoto JP
Okuda; Yasushi - Osaka JP
Okuda, Yasushi - Kyoto-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Soot blower Grant 10,962,223 - Sakashita , et al. March 30, 2	2021-03-30
Soot Blower App 20190078779 - Sakashita; Gen ; et al.	2019-03-14
Method of manufacturing semiconductor device Grant 6,753,222 - Mimuro , et al. June 22, 2	2004-06-22
Nonvolatile semiconductor memory device and method for driving the same Grant 6,657,893 - Takahashi , et al. December 2, 2	2003-12-02
Method for manufacturing semiconductor device App 20030082878 - Mimuro, Ken ; et al.	2003-05-01
Method for fabricating semiconductor device using a CVD insulator film Grant 6,472,281 - Doi , et al. October 29, 2	2002-10-29
Nonvolatile semiconductor memory device and method for driving the same App 20020064071 - Takahashi, Keita ; et al.	2002-05-30
Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method Grant 6,323,663 - Nakata , et al. November 27, 2	2001-11-27
Method For Fabricating Semiconductor Device Using A Cvd Insulator Film App 20010026982 - DOI, HIROYUKI ; et al.	2001-10-04
Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method Grant 6,005,401 - Nakata , et al. December 21, 1	1999-12-21
Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method Grant 5,945,834 - Nakata , et al. August 31, 1	1999-08-31
Method for driving a non-volatile semiconductor memory Grant 5,715,196 - Odake , et al. February 3, 1	1998-02-03
Non-volatile semiconductor memory having an array of non-volatile memory cells and method for driving the same Grant 5,627,779 - Odake , et al. May 6, 1	1997-05-06
Semiconductor memory device having an energy gap for high speed operation Grant 5,359,554 - Odake , et al. October 25, 1	1994-10-25
Ink composition Grant 4,657,591 - Shioi , et al. April 14, 1	1987-04-14

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