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OKUDA; Masaki Patent Filings

OKUDA; Masaki

Patent Applications and Registrations

Patent applications and USPTO patent grants for OKUDA; Masaki.The latest application filed is for "growth evaluation device, growth evaluation method, and growth evaluation program".

Company Profile
0.16.21
  • OKUDA; Masaki - Tsukuba-shi JP
  • Okuda; Masaki - Shinjuku JP
  • Okuda; Masaki - Shiga JP
  • Okuda; Masaki - Kawasaki-shi JP
  • Okuda; Masaki - Kawasaki JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Growth Evaluation Device, Growth Evaluation Method, And Growth Evaluation Program
App 20220189192 - SUKEGAWA; Shin ;   et al.
2022-06-16
Estrus Determination Device For Sow, Method For Determining Estrus Of Sow, And Program For Determining Estrus Of Sow
App 20220183811 - SUKEGAWA; Shin ;   et al.
2022-06-16
Ferroelectric memory device and timing circuit to control the boost level of a word line
Grant 9,401,192 - Okuda , et al. July 26, 2
2016-07-26
Semiconductor Memory Device
App 20150109875 - Okuda; Masaki ;   et al.
2015-04-23
Electroconductive fine particles, anisotropic electroconductive material, and electroconductive connection structure
Grant 8,609,246 - Sun , et al. December 17, 2
2013-12-17
Grid Computing System, Management Apparatus, And Method For Managing A Plurality Of Nodes
App 20100205306 - Kayanuma; Hiroshi ;   et al.
2010-08-12
Electroconductive Fine Particles, Anisotropic Electroconductive Material, And Electroconductive Connection Structure
App 20100112353 - Sun; Ren-de ;   et al.
2010-05-06
Semiconductor memory, test method of semiconductor memory and system
Grant 7,675,773 - Mori , et al. March 9, 2
2010-03-09
Semiconductor memory and operating method of same
Grant 7,649,796 - Okuda , et al. January 19, 2
2010-01-19
Forced termination condition monitoring device, forced termination condition monitoring method and storage medium embodying forced termination condition monitoring program
Grant 7,650,536 - Takahasi , et al. January 19, 2
2010-01-19
Semiconductor integrated circuit for voltage detection
Grant 7,642,844 - Okuda January 5, 2
2010-01-05
Semiconductor device
Grant 7,557,645 - Okuda July 7, 2
2009-07-07
Semiconductor Memory, Test Method Of Semiconductor Memory And System
App 20090040850 - Mori; Kaoru ;   et al.
2009-02-12
Semiconductor integrated circuit for voltage detection
App 20080246540 - Okuda; Masaki
2008-10-09
Semiconductor device having a power supply capacitor
Grant 7,427,885 - Okuda September 23, 2
2008-09-23
Semiconductor memory and operating method of same
App 20080159041 - Okuda; Masaki ;   et al.
2008-07-03
Input/output logical circuit
Grant 7,330,062 - Kobayashi , et al. February 12, 2
2008-02-12
Forced termination condition monitoring device, forced termination condition monitoring method and storage medium embodying forced termination condition monitoring program
App 20070234119 - Takahasi; Kouitirou ;   et al.
2007-10-04
Semiconductor device
App 20070216463 - Okuda; Masaki
2007-09-20
Logical circuit
App 20070103218 - Kobayashi; Hiroyuki ;   et al.
2007-05-10
Logical circuit
Grant 7,190,204 - Kobayashi , et al. March 13, 2
2007-03-13
Service charge management apparatus, service charge management method and storage medium
App 20070036305 - Takahasi; Kouitirou ;   et al.
2007-02-15
Data transfer method, data transfer program, information processing terminal device, and information system
App 20060174013 - Katsumata; Akira ;   et al.
2006-08-03
Semiconductor device
App 20060044038 - Okuda; Masaki
2006-03-02
Server providing computer resources to user terminals
App 20050289070 - Takahasi, Kouitirou ;   et al.
2005-12-29
Logical circuit
App 20050168245 - Kobayashi, Hiroyuki ;   et al.
2005-08-04
Semiconductor memory device capable of simultaneously reading data and refreshing data
Grant 6,922,750 - Okuda July 26, 2
2005-07-26
Semiconductor memory
Grant 6,754,126 - Yamaguchi , et al. June 22, 2
2004-06-22
Semiconductor memory
Grant 6,728,157 - Yagishita , et al. April 27, 2
2004-04-27
Semiconductor memory
App 20040004883 - Yagishita, Yoshimasa ;   et al.
2004-01-08
Semiconductor memory device
Grant 6,667,913 - Okuda , et al. December 23, 2
2003-12-23
Semiconductor Memory Device
App 20030210577 - Okuda, Masaki ;   et al.
2003-11-13
Semiconductor memory
App 20030026161 - Yamaguchi, Shusaku ;   et al.
2003-02-06
Semiconductor Memory Device Having Error Correction Function For Data Reading During Refresh Operation
App 20030007410 - Okuda, Masaki ;   et al.
2003-01-09
Semiconductor memory device
App 20020156967 - Okuda, Masaki
2002-10-24
Memory device
Grant 6,104,659 - Yagishita , et al. August 15, 2
2000-08-15

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