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Patent applications and USPTO patent grants for OKI; Katsuo.The latest application filed is for "semiconductor inspection device".
Patent | Date |
---|---|
Semiconductor Inspection Device App 20210270891 - KOMORI; Masaaki ;   et al. | 2021-09-02 |
Semiconductor Inspection Device and Probe Unit App 20210263075 - KOMORI; Masaaki ;   et al. | 2021-08-26 |
Dynamic response analysis prober device Grant 10,782,340 - Komori , et al. Sept | 2020-09-22 |
Dynamic Response Analysis Prober Device App 20180299504 - KOMORI; Masaaki ;   et al. | 2018-10-18 |
Inspection device Grant 8,816,712 - Nakamura , et al. August 26, 2 | 2014-08-26 |
Inspection Device App 20110140729 - Nakamura; Mitsuhiro ;   et al. | 2011-06-16 |
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