OKAZAKI; Kenya
Patent Applications and Registrations
Patent applications and USPTO patent grants for OKAZAKI; Kenya.The latest application filed is for "microscopy system, refractive-index calculating method, and recording medium".
- OKAZAKI; Kenya - Tokyo JP
- Okazaki; Kenya - Hachioji JP
- Okazaki; Kenya - Hachioji-shi JP
| Patent | Date |
|---|---|
| Microscopy System, Refractive-index Calculating Method, And Recording Medium App 20170017071 - UE; Yoshihiro ; et al. | 2017-01-19 |
| Immersion objective lens, fluorometric analyzer, and inverted microscope Grant 7,619,829 - Okazaki , et al. November 17, 2 | 2009-11-17 |
| Measuring apparatus Grant 7,369,220 - Okazaki May 6, 2 | 2008-05-06 |
| Measuring apparatus App 20070103687 - Okazaki; Kenya | 2007-05-10 |
| Immersion objective lens, fluorometric analyzer, and inverted microscope App 20060274424 - Okazaki; Kenya ; et al. | 2006-12-07 |
| Scanner system and piezoelectric micro-inching mechansim used in scanning probe microscope Grant 6,437,343 - Okazaki , et al. August 20, 2 | 2002-08-20 |
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