OKANO; Taichi

Patent Applications and Registrations

Patent applications and USPTO patent grants for OKANO; Taichi.The latest application filed is for "disk device".

Company Profile

4.9.15

OKANO; Taichi - Yokohama Kanagawa JP
Okano; Taichi - Fuchu Tokyo JP
Okano; Taichi - Tokyo JP
Okano; Taichi - Miyagi JP
Okano; Taichi - Chichibu JP
OKANO; Taichi - Chichibu-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Disk Device App 20220301595 - OKANO; Taichi ; et al.	2022-09-22
Disk Device And Electronic Device App 20220301591 - OKANO; Taichi ; et al.	2022-09-22
Drive incorporating wireless components Grant 11,437,076 - Okano , et al. September 6, 2	2022-09-06
Disk Device App 20220247064 - LIU; Jia ; et al.	2022-08-04
Disk device Grant 11,342,650 - Liu , et al. May 24, 2	2022-05-24
Electronic device, storage device, and disk device Grant 11,289,129 - Okano , et al. March 29, 2	2022-03-29
Disk Device App 20220037761 - LIU; Jia ; et al.	2022-02-03
Disk Device App 20210407550 - OKANO; Taichi ; et al.	2021-12-30
Processing method and plasma processing apparatus Grant 11,211,229 - Oikawa , et al. December 28, 2	2021-12-28
Disk Device App 20210295876 - Okano; Taichi ; et al.	2021-09-23
Electronic Device, Storage Device, And Disk Device App 20210225412 - Okano; Taichi ; et al.	2021-07-22
Processing Method And Plasma Processing Apparatus App 20200227326 - OIKAWA; Sho ; et al.	2020-07-16
Processing Method And Plasma Processing Apparatus App 20200227241 - OIKAWA; Sho ; et al.	2020-07-16
Etching Method And Substrate Processing Apparatus App 20200168468 - ISHII; Takayuki ; et al.	2020-05-28
Target Object Processing Method And Plasma Processing Apparatus App 20200144034 - Yokoyama; Seiji ; et al.	2020-05-07
Semiconductor wafer evaluation method, semiconductor wafer evaluation device, and probe for semiconductor evaluation device Grant 9,431,307 - Okano August 30, 2	2016-08-30
Method of manufacturing semiconductor device, semiconductor device, and semiconductor apparatus Grant 8,679,882 - Okano March 25, 2	2014-03-25
Semiconductor Wafer Evaluation Method, Semiconductor Wafer Evaluation Device, And Probe For Semiconductor Evaluation Device App 20140017826 - OKANO; Taichi	2014-01-16
Method Of Manufacturing Semiconductor Device, Semiconductor Device, And Semiconductor Apparatus App 20110272711 - Okano; Taichi	2011-11-10
Compound semiconductor multilayer structure and bipolar transistor using the same Grant 6,876,013 - Okano , et al. April 5, 2	2005-04-05
Method for fabricating a GaInP epitaxial stacking structure Grant 6,841,435 - Udagawa , et al. January 11, 2	2005-01-11
Compound semiconductor multilayer structure and bipolar transistor using the same App 20030183816 - Okano, Taichi ; et al.	2003-10-02
GaInP epitaxial stacking structure and fabrication method thereof and a FET transistor using this structure App 20030008440 - Udagawa, Takashi ; et al.	2003-01-09

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