Okai; Nobuhiro
Patent Applications and Registrations
Patent applications and USPTO patent grants for Okai; Nobuhiro.The latest application filed is for "image processing system".
- Okai; Nobuhiro - Tokyo JP
- Okai; Nobuhiro - Otsu JP
- Okai; Nobuhiro - Kokubunji N/A JP
| Patent | Date |
|---|---|
| Image Processing System App 20220042936 - Okai; Nobuhiro ; et al. | 2022-02-10 |
| Charged particle beam apparatus Grant 11,211,224 - Okai , et al. December 28, 2 | 2021-12-28 |
| Charged Particle Beam Apparatus App 20210249221 - OKAI; Nobuhiro ; et al. | 2021-08-12 |
| Charged particle beam apparatus Grant 10,121,632 - Okai , et al. November 6, 2 | 2018-11-06 |
| Charged Particle Beam Apparatus App 20170316915 - OKAI; Nobuhiro ; et al. | 2017-11-02 |
| Charged particle beam microscope Grant 9,261,360 - Okai , et al. February 16, 2 | 2016-02-16 |
| Scanning electron microscope Grant 8,969,801 - Okai , et al. March 3, 2 | 2015-03-03 |
| Charged particle beam device Grant 8,907,267 - Wang , et al. December 9, 2 | 2014-12-09 |
| Scanning Electron Microscope App 20140299769 - Okai; Nobuhiro ; et al. | 2014-10-09 |
| Charged Particle Beam Device App 20140217274 - Wang; Zhigang ; et al. | 2014-08-07 |
| Electron microscope Grant 8,742,342 - Okai , et al. June 3, 2 | 2014-06-03 |
| Scanning electron microscope optical condition setting method and scanning electron microscope Grant 8,692,197 - Wang , et al. April 8, 2 | 2014-04-08 |
| Method for controlling charging of sample and scanning electron microscope Grant 8,487,251 - Fukaya , et al. July 16, 2 | 2013-07-16 |
| Charged Particle Beam Microscope App 20120327213 - Okai; Nobuhiro ; et al. | 2012-12-27 |
| Scanning Electron Microscope Optical Condition Setting Method and Scanning Electron Microscope App 20120318977 - Wang; Zhigang ; et al. | 2012-12-20 |
| Electron Microscope App 20120217393 - Okai; Nobuhiro ; et al. | 2012-08-30 |
| Scanning electron microscope Grant 8,125,518 - Okai , et al. February 28, 2 | 2012-02-28 |
| Method and apparatus for inspecting reticle Grant 8,064,681 - Okai , et al. November 22, 2 | 2011-11-22 |
| Scanning Electron Microscope App 20110249110 - Okai; Nobuhiro ; et al. | 2011-10-13 |
| Method For Controlling Charging Of Sample And Scanning Electron Microscope App 20110139981 - Fukaya; Ritsuo ; et al. | 2011-06-16 |
| Method and apparatus for inspecting reticle App 20090136116 - Okai; Nobuhiro ; et al. | 2009-05-28 |
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