Okada; Yoshikuni

Patent Applications and Registrations

Patent applications and USPTO patent grants for Okada; Yoshikuni.The latest application filed is for "method of making contact probe".

Company Profile

0.9.8

Okada; Yoshikuni - Tsukuba N/A JP
Okada; Yoshikuni - Tsukuba-shi JP
Okada; Yoshikuni - Ibaraki JP
Okada; Yoshikuni - Ibaragi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method of making contact probe Grant 9,134,346 - Aoyagi , et al. September 15, 2	2015-09-15
Method Of Making Contact Probe App 20110247209 - Aoyagi; Masahiro ; et al.	2011-10-13
Contact probe and method of making the same Grant 7,990,165 - Aoyagi , et al. August 2, 2	2011-08-02
Multi-layer fin wiring interposer fabrication process Grant 7,833,835 - Aoyagi , et al. November 16, 2	2010-11-16
Method of forming micro metal bump Grant 7,767,574 - Gomi , et al. August 3, 2	2010-08-03
Contact Prove And Method Of Making The Same App 20090224781 - Aoyagi; Masahiro ; et al.	2009-09-10
Method of Forming Micro Metal Bump App 20090104766 - Gomi; Yoshihiro ; et al.	2009-04-23
System in-package test inspection apparatus and test inspection method Grant 7,414,422 - Aoyagi , et al. August 19, 2	2008-08-19
Multi-layer fin wiring interposer fabrication process App 20080044950 - Aoyagi; Masahiro ; et al.	2008-02-21
Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probe Grant 7,227,352 - Aoyagi , et al. June 5, 2	2007-06-05
Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probe Grant 7,208,966 - Aoyagi , et al. April 24, 2	2007-04-24
Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probe App 20070065956 - Aoyagi; Masahiro ; et al.	2007-03-22
Contact probe, measuring pad used for the contact probe, and method of manufacturing the contact probe App 20050264313 - Aoyagi, Masahiro ; et al.	2005-12-01
System in-package test inspection apparatus and test inspection method App 20050236717 - Aoyagi, Masahiro ; et al.	2005-10-27
Multi-layer fine wiring interposer and manufacturing method thereof App 20040256727 - Aoyagi, Masahiro ; et al.	2004-12-23
Optical information exchange system Grant 4,358,858 - Tamura , et al. November 9, 1	1982-11-09

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