Oka; Kenji

Patent Applications and Registrations

Patent applications and USPTO patent grants for Oka; Kenji.The latest application filed is for "microstrip antenna".

Company Profile

3.79.70

Oka; Kenji - Kobe JP
Oka; Kenji - Yokohama JP
OKA; Kenji - Kobe-shi JP
Oka; Kenji - Beijing CN
Oka; Kenji - Yokohama-shi JP
Oka; Kenji - Anan JP
Oka; Kenji - Kanagawa JP
Oka; Kenji - Hitachinaka JP
OKA; Kenji - Anan-shi JP
Oka; Kenji - Hokkaido JP
Oka; Kenji - Kanagawa-ken N/A JP
OKA; Kenji - Hitachinaka-shi JP
Oka; Kenji - Ohtake JP
Oka; Kenji - Hyogo JP
Oka; Kenji - Hiroshima JP
Oka; Kenji - Fujisawa JP
Oka; Kenji - Saitama JP
Oka; Kenji - Chitose JP
Oka; Kenji - Fujisawa-shi JP
Oka, Kenji - Chitose-shi JP
Oka, Kenji - Ohtake-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Microstrip antenna Grant 10,608,332 - Nishimoto , et al.	2020-03-31
Radar device and method of determining phase difference folding Grant 10,466,347 - Matsui , et al. No	2019-11-05
Antenna apparatus Grant 10,283,874 - Tsuchiya , et al.	2019-05-07
Verifying integrity of backup file in a multiple operating system environment Grant 10,032,029 - Kawano , et al. July 24, 2	2018-07-24
Microstrip Antenna App 20180198198 - NISHIMOTO; Norihisa ; et al.	2018-07-12
Antenna Apparatus App 20180115084 - TSUCHIYA; Junzoh ; et al.	2018-04-26
Operating environment switching between a primary and a secondary operating system Grant 9,910,677 - Kawano , et al. March 6, 2	2018-03-06
Control method for shared devices and electronic device Grant 9,886,073 - Yamazaki , et al. February 6, 2	2018-02-06
Radar Device And Method Of Determining Phase Difference Folding App 20170307745 - MATSUI; Isao ; et al.	2017-10-26
Operating system management of second operating system Grant 9,753,739 - Kawano , et al. September 5, 2	2017-09-05
Arrangement for secure independent operating environments in a computer Grant 9,483,278 - Kawano , et al. November 1, 2	2016-11-01
Radar Device And Signal Processing Method App 20160178732 - OKA; Kenji ; et al.	2016-06-23
Verifying Integrity Of Backup File In A Multiple Operating System Environment App 20160012233 - Kawano; Seiichi ; et al.	2016-01-14
Operating Environment Switching Between A Primary And A Secondary Operating System App 20160004539 - Kawano; Seiichi ; et al.	2016-01-07
Method for manufacturing semiconductor light emitting device Grant 9,159,868 - Wakai , et al. October 13, 2	2015-10-13
Apparatus for controlling vehicle opening/closing element Grant 9,030,291 - Muramatsu , et al. May 12, 2	2015-05-12
Pupil detection device and pupil detection method Grant 8,983,235 - Tsukizawa , et al. March 17, 2	2015-03-17
Surface inspecting apparatus and method for calibrating same Grant 8,949,043 - Oka , et al. February 3, 2	2015-02-03
Method For Manufacturing Semiconductor Light Emitting Device App 20140370630 - WAKAI; Yohei ; et al.	2014-12-18
Arrangement For Secure Independent Operating Environments In A Computer App 20140337610 - Kawano; Seiichi ; et al.	2014-11-13
Method for manufacturing semiconductor light emitting device Grant 8,883,529 - Wakai , et al. November 11, 2	2014-11-11
Operating System Management Of Second Operating System App 20140317392 - Kawano; Seiichi ; et al.	2014-10-23
Inspecting apparatus and an inspecting method Grant 8,831,899 - Nemoto , et al. September 9, 2	2014-09-09
Pupil detection device and pupil detection method Grant 8,810,642 - Tsukizawa , et al. August 19, 2	2014-08-19
Inspection method and inspection apparatus Grant 8,804,108 - Mitomo , et al. August 12, 2	2014-08-12
Appearance inspection apparatus Grant 8,699,017 - Oka , et al. April 15, 2	2014-04-15
External light glare assessment device, line of sight detection device and external light glare assessment method Grant 8,659,751 - Tsukizawa , et al. February 25, 2	2014-02-25
Pupil detection device and pupil detection method Grant 8,649,583 - Tsukizawa , et al. February 11, 2	2014-02-11
Method for manufacturing semiconductor light emitting device App 20140038328 - WAKAI; Yohei ; et al.	2014-02-06
Component With Countermeasure Against Static Electricity And Method Of Manufacturing Same App 20130335189 - Abe; Yuuichi ; et al.	2013-12-19
Method of inspecting a semiconductor device and an apparatus thereof Grant 8,559,000 - Hamamatsu , et al. October 15, 2	2013-10-15
Semiconductor light emitting device and method for manufacturing the same Grant 8,552,445 - Wakai , et al. October 8, 2	2013-10-08
Appearance Inspection Apparatus App 20130242293 - OKA; Kenji ; et al.	2013-09-19
Associating biometric information with passwords Grant 8,539,248 - Hagiwara , et al. September 17, 2	2013-09-17
Apparatus For Controlling Vehicle Opening/closing Element App 20130200995 - MURAMATSU; Hirokazu ; et al.	2013-08-08
Visual line estimating apparatus Grant 8,503,737 - Oka , et al. August 6, 2	2013-08-06
Pupil Detection Device And Pupil Detection Method App 20130170754 - Tsukizawa; Sotaro ; et al.	2013-07-04
Appearance inspection apparatus Grant 8,462,327 - Oka , et al. June 11, 2	2013-06-11
Control Method for Shared Devices and Electronic Device App 20130132748 - YAMAZAKI; Mitsuhiro ; et al.	2013-05-23
Method Of Inspecting A Semiconductor Device And An Apparatus Thereof App 20120312104 - HAMAMATSU; Akira ; et al.	2012-12-13
Method of inspecting a semiconductor device and an apparatus thereof Grant 8,274,651 - Hamamatsu , et al. September 25, 2	2012-09-25
Appearance Inspection Apparatus App 20120194808 - OKA; Kenji ; et al.	2012-08-02
Pupil Detection Device And Pupil Detection Method App 20120177266 - Tsukizawa; Sotaro ; et al.	2012-07-12
External Light Glare Assessment Device, Line Of Sight Detection Device And External Light Glare Assessment Method App 20120170027 - Tsukizawa; Sotaro ; et al.	2012-07-05
Defect Inspection Method And Apparatus App 20120128230 - Maeda; Shunji ; et al.	2012-05-24
Appearance inspection apparatus Grant 8,169,606 - Oka , et al. May 1, 2	2012-05-01
Visual Line Estimating Apparatus App 20120076438 - Oka; Kenji ; et al.	2012-03-29
Inspection Method And Inspection Apparatus App 20120050729 - Mitomo; Kenji ; et al.	2012-03-01
Pupil Detection Device And Pupil Detection Method App 20120050516 - Tsukizawa; Sotaru ; et al.	2012-03-01
Surface Inspecting Apparatus And Method For Calibrating Same App 20120046884 - Oka; Kenji ; et al.	2012-02-23
Method for producing cyclic olefin compound Grant 8,115,043 - Takai , et al. February 14, 2	2012-02-14
Defect inspection method and apparatus Grant 8,107,717 - Maeda , et al. January 31, 2	2012-01-31
Method Of Inspecting A Semiconductor Device And An Apparatus Thereof App 20120006131 - Hamamatsu; Akira ; et al.	2012-01-12
Image Capturing Device, Operator Monitoring Device, Method For Measuring Distance To Face, And Program App 20110304746 - Iijima; Tomokuni ; et al.	2011-12-15
Reference Wafer For Calibration Of Dark-field Inspection Apparatus,method Of Manufacturing Reference Wafer For Calibration Of Dark-field Inspection Apparatus, Method Of Calibrating Dark-field Inspection Apparatus, Dark-field Inspection Apparatus, And A Wafer Inspection Method App 20110276299 - Nemoto; Kazunori ; et al.	2011-11-10
Method of inspecting a semiconductor device and an apparatus thereof Grant 8,040,503 - Hamamatsu , et al. October 18, 2	2011-10-18
Defect Inspection Method And Apparatus App 20110170765 - MAEDA; Shunji ; et al.	2011-07-14
Defect inspection method and apparatus Grant 7,916,929 - Maeda , et al. March 29, 2	2011-03-29
Bias adjustment of radio frequency unit in radar apparatus Grant 7,821,447 - Oka , et al. October 26, 2	2010-10-26
Semiconductor Light Emitting Device And Method For Manufacturing The Same App 20100264443 - Wakai; Yohei ; et al.	2010-10-21
Appearance Inspection Apparatus App 20100259750 - OKA; Kenji ; et al.	2010-10-14
Dielectric porcelain composition, and method for manufacturing capacitor using the same Grant 7,786,036 - Komatsu , et al. August 31, 2	2010-08-31
Appearance inspection apparatus Grant 7,773,210 - Oka , et al. August 10, 2	2010-08-10
Method Of Inspecting A Semiconductor Device And An Apparatus Thereof App 20100140474 - HAMAMATSU; Akira ; et al.	2010-06-10
Ranging device utilizing image processing Grant 7,729,516 - Shima , et al. June 1, 2	2010-06-01
Method of inspecting a semiconductor device and an apparatus thereof Grant 7,643,138 - Hamamatsu , et al. January 5, 2	2010-01-05
Monopulse radar apparatus and antenna switch Grant 7,612,706 - Honda , et al. November 3, 2	2009-11-03
Appearance Inspection Apparatus App 20090244529 - Oka; Kenji ; et al.	2009-10-01
Defect Inspection Method And Apparatus App 20090214102 - Maeda; Shunji ; et al.	2009-08-27
Appearance inspection apparatus Grant 7,557,911 - Oka , et al. July 7, 2	2009-07-07
Method and Apparatus for Observing and Inspecting Defects App 20090141264 - Shibata; Yukihiro ; et al.	2009-06-04
Bias adjustment of radio frequency unit in radar apparatus App 20090102702 - Oka; Kenji ; et al.	2009-04-23
Defect inspection method and apparatus Grant 7,512,259 - Maeda , et al. March 31, 2	2009-03-31
Method for Producing Cyclic Olefin Compound App 20090062580 - Takai; Hideyuki ; et al.	2009-03-05
Method and apparatus for observing and inspecting defects Grant 7,499,162 - Shibata , et al. March 3, 2	2009-03-03
Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected Grant 7,460,220 - Maeda , et al. December 2, 2	2008-12-02
Method Of Inspecting A Semiconductor Device And An Apparatus Thereof App 20080291437 - Hamamatsu; Akira ; et al.	2008-11-27
Inspection apparatus and inspection method App 20080239291 - Miyanohara; Yasuhiro ; et al.	2008-10-02
Method of inspecting a semiconductor device and an apparatus thereof Grant 7,417,723 - Hamamatsu , et al. August 26, 2	2008-08-26
Radar apparatus and failure detection method thereof Grant 7,397,419 - Nakano , et al. July 8, 2	2008-07-08
Dielectric Porcelain Composition, and Method for Manufacturing Capacitor Using the Same App 20080115876 - Komatsu; Kazuhiro ; et al.	2008-05-22
Target detection system using radar and image processing Grant 7,376,247 - Ohta , et al. May 20, 2	2008-05-20
Defect Inspection Method And Apparatus App 20080101685 - MAEDA; Shunji ; et al.	2008-05-01
Metal Portion-Containing Article, Coin, And Method Of Producing The Same App 20080060907 - Oka; Kenji	2008-03-13
Method for manufacturing multilayer ceramic capacitor Grant 7,335,328 - Hirata , et al. February 26, 2	2008-02-26
Appearance Inspection Apparatus App 20080024765 - OKA; Kenji ; et al.	2008-01-31
Ranging Device Utilizing Image Processing App 20070291992 - Shima; Nobukazu ; et al.	2007-12-20
Defect inspection method and apparatus Grant 7,274,813 - Maeda , et al. September 25, 2	2007-09-25
Ranging device utilizing image processing Grant 7,266,221 - Shima , et al. September 4, 2	2007-09-04
Monopulse radar apparatus and antenna switch App 20070182619 - Honda; Kanako ; et al.	2007-08-09
Radar Apparatus And Failure Detection Method Thereof App 20070171123 - Nakano; Masao ; et al.	2007-07-26
Method and device for distance measurement by pulse radar Grant 7,233,279 - Moriya , et al. June 19, 2	2007-06-19
Method and apparatus for picking up 2D image of an object to be sensed Grant 7,221,486 - Makihira , et al. May 22, 2	2007-05-22
Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected App 20070070336 - Maeda; Shunji ; et al.	2007-03-29
Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected Grant 7,180,584 - Maeda , et al. February 20, 2	2007-02-20
Apparatus for switching between a combination of operating modes such that the power consumed is reduced relative to the time of switching Grant 7,181,634 - Katoh , et al. February 20, 2	2007-02-20
Method for controlling the switching of operating modes of an information processor according to the time of switching of the operating modes Grant 7,167,992 - Katoh , et al. January 23, 2	2007-01-23
Method and apparatus for observing and inspecting defects App 20060238760 - Shibata; Yukihiro ; et al.	2006-10-26
Method of inspecting a semiconductor device and an apparatus thereof App 20060215153 - Hamamatsu; Akira ; et al.	2006-09-28
Method and apparatus for observing and inspecting defects Grant 7,092,095 - Shibata , et al. August 15, 2	2006-08-15
Allowing or disallowing firmware upgrade based on comparison of firmware-related bits App 20060136710 - Oka; Kenji ; et al.	2006-06-22
Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns on an object to be inspected Grant 7,061,600 - Maeda , et al. June 13, 2	2006-06-13
Method of inspecting a semiconductor device and an apparatus thereof Grant 7,061,602 - Hamamatsu , et al. June 13, 2	2006-06-13
Associating biometric information with passwords App 20060075256 - Hagiwara; Mikio ; et al.	2006-04-06
Method and device for distance measurement by pulse radar App 20060055590 - Moriya; Masayoshi ; et al.	2006-03-16
Defect inspection method and apparatus App 20060038987 - Maeda; Shunji ; et al.	2006-02-23
Target detection system using radar and image processing App 20050271253 - Ohta, Akihiro ; et al.	2005-12-08
Process for producing laminated ceramic capacitor Grant 6,947,276 - Hirata , et al. September 20, 2	2005-09-20
Defect inspection method and apparatus Grant 6,947,587 - Maeda , et al. September 20, 2	2005-09-20
Method of inspecting a semiconductor device and an apparatus thereof App 20050196033 - Hamamatsu, Akira ; et al.	2005-09-08
Method, service and program for variation reduction in an information processor having multiple power levels App 20050138449 - Katoh, Takayuki ; et al.	2005-06-23
Method for manufacturing multilayer ceramic capacitor App 20050116393 - Hirata, Kazuki ; et al.	2005-06-02
Process for producing laminated ceramic capacitor App 20050102808 - Hirata, Kazuki ; et al.	2005-05-19
Method of inspecting a semiconductor device and an apparatus thereof Grant 6,888,959 - Hamamatsu , et al. May 3, 2	2005-05-03
Variation reduction in an information processor having multiple power levels App 20040181700 - Katoh, Takayuki ; et al.	2004-09-16
Method and apparatus for observing and inspecting defects App 20040150821 - Shibata, Yukihiro ; et al.	2004-08-05
Utilizing the suspend state of an information handling system App 20040107359 - Kawano, Seiichi ; et al.	2004-06-03
Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected App 20040075837 - Maeda, Shunji ; et al.	2004-04-22
Method and apparatus for observing and inspecting defects Grant 6,690,469 - Shibata , et al. February 10, 2	2004-02-10
Defect inspection method and apparatus therefor Grant 6,674,890 - Maeda , et al. January 6, 2	2004-01-06
Ranging device utilizing image processing App 20030081815 - Shima, Nobukazu ; et al.	2003-05-01
Method and apparatus for picking up 2D image of an object to be sensed App 20030030853 - Makihira, Hiroshi ; et al.	2003-02-13
Method and apparatus for picking up 2D image of an object to be sensed Grant 6,507,417 - Makihira , et al. January 14, 2	2003-01-14
Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns on an object to be inspected App 20020154303 - Maeda, Shunji ; et al.	2002-10-24
Method and apparatus for processing inspection data Grant 6,456,951 - Maeda , et al. September 24, 2	2002-09-24
Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns on an object to be inspected Grant 6,404,498 - Maeda , et al. June 11, 2	2002-06-11
Defect inspection method and apparatus therefor App 20020031248 - Maed, Shunji ; et al.	2002-03-14
Method of producing sesamol formic acid ester and sesamol App 20020016479 - Tanigawa, Hiroto ; et al.	2002-02-07
Method of inspecting a semiconductor device and an apparatus thereof App 20010048761 - Hamamatsu, Akira ; et al.	2001-12-06
Target detection system using radar and image processing App 20010031068 - Ohta, Akihiro ; et al.	2001-10-18
Manufacturing method of semiconductor substrate and method and apparatus for inspecting defects of patterns of an object to be inspected Grant 6,263,099 - Maeda , et al. July 17, 2	2001-07-17
Defect inspection method and apparatus therefor Grant 6,169,282 - Maeda , et al. January 2, 2	2001-01-02
Automatic focus detection method, automatic focus detection apparatus, and inspection apparatus Grant 6,091,075 - Shibata , et al. July 18, 2	2000-07-18
Process for preparation of aliphatic diisocyanate compounds Grant 5,789,614 - Yagii , et al. August 4, 1	1998-08-04
Manufacturing method of semiconductor substrative and method and apparatus for inspecting defects of patterns on an object to be inspected Grant 5,774,222 - Maeda , et al. June 30, 1	1998-06-30

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