OJIMA; Yuki
Patent Applications and Registrations
Patent applications and USPTO patent grants for OJIMA; Yuki.The latest application filed is for "template creation device for sample observation device, and sample observation device".
- OJIMA; Yuki - Tokyo JP
- Ojima; Yuki - Mito JP
- Ojima; Yuki - Hitachinaka JP
| Patent | Date |
|---|---|
| Template Creation Device for Sample Observation Device, and Sample Observation Device App 20160140287 - OJIMA; Yuki ; et al. | 2016-05-19 |
| Scanning electron microscope Grant 8,487,253 - Yamazaki , et al. July 16, 2 | 2013-07-16 |
| Scanning Electron Microscope App 20120061566 - YAMAZAKI; Minoru ; et al. | 2012-03-15 |
| Scanning electron microscope Grant 8,080,790 - Yamazaki , et al. December 20, 2 | 2011-12-20 |
| Observation method with electron beam Grant 7,723,681 - Ojima , et al. May 25, 2 | 2010-05-25 |
| Scanning Electron Microscope App 20090224170 - YAMAZAKI; Minoru ; et al. | 2009-09-10 |
| Observation Method With Electron Beam App 20080265160 - OJIMA; Yuki ; et al. | 2008-10-30 |
| Method of monitoring an exposure process Grant 6,929,892 - Shishido , et al. August 16, 2 | 2005-08-16 |
| Method of monitoring an exposure process App 20050037271 - Shishido, Chie ; et al. | 2005-02-17 |
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