Ohzawa; Sumito
Patent Applications and Registrations
Patent applications and USPTO patent grants for Ohzawa; Sumito.The latest application filed is for "concentration measuring method and fluorescent x-ray spectrometer".
- Ohzawa; Sumito - Kyoto JP
- OHZAWA; Sumito - Kyoto-shi JP
| Patent | Date |
|---|---|
| Concentration measuring method and fluorescent X-ray spectrometer Grant 8,582,717 - Ohzawa November 12, 2 | 2013-11-12 |
| Sample cell for fluorescent X-ray analysis and sample cell assembly instrument Grant 8,550,710 - Kishida , et al. October 8, 2 | 2013-10-08 |
| X-ray convergence element and X-ray irradiation device Grant 8,416,921 - Nakazawa , et al. April 9, 2 | 2013-04-09 |
| Concentration Measuring Method And Fluorescent X-ray Spectrometer App 20110103547 - OHZAWA; Sumito | 2011-05-05 |
| Sample Cell For Fluorescent X-ray Analysis And Sample Cell Assembly Instrument App 20110085638 - Kishida; Mayuko ; et al. | 2011-04-14 |
| X-ray Convergence Element And X-ray Irradiation Device App 20100226477 - Nakazawa; Hiromoto ; et al. | 2010-09-09 |
| X-ray analysis apparatus and method Grant 6,965,663 - Ohzawa November 15, 2 | 2005-11-15 |
| X-ray analysis apparatus and method App 20030215060 - Ohzawa, Sumito | 2003-11-20 |
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