OHTSUKI; Tsuyoshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for OHTSUKI; Tsuyoshi.The latest application filed is for "method for evaluating semiconductor substrate".

Company Profile

2.18.21

OHTSUKI; Tsuyoshi - Annaka-shi JP
Ohtsuki; Tsuyoshi - Annaka JP
Ohtsuki; Tsuyoshi - Gunma N/A JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method For Evaluating Semiconductor Substrate App 20220285228 - OHTSUKI; Tsuyoshi	2022-09-08
Anodic-oxidation equipment, anodic-oxidation method, and method for producing cathode of anodic-oxidation equipment Grant 11,248,306 - Ohtsuki , et al. February 15, 2	2022-02-15
Anodic-oxidation Equipment, Anodic-oxidation Method, And Method For Producing Cathode Of Anodic-oxidation Equipment App 20210238762 - OHTSUKI; Tsuyoshi ; et al.	2021-08-05
Silicon Single Crystal Substrate And Silicon Epitaxial Wafer For Solid-state Image Sensor And Solid-state Image Sensor App 20210159259 - ABE; Takao ; et al.	2021-05-27
Method for manufacturing semiconductor device and method for evaluating semiconductor device Grant 10,886,129 - Ohtsuki , et al. January 5, 2	2021-01-05
Method For Manufacturing Semiconductor Device And Method For Evaluating Semiconductor Device App 20190267239 - OHTSUKI; Tsuyoshi ; et al.	2019-08-29
Method for evaluating a semiconductor wafer Grant 9,935,021 - Ohtsuki April 3, 2	2018-04-03
Method for evaluating SOI substrate Grant 9,780,006 - Ohtsuki October 3, 2	2017-10-03
Method for evaluating semiconductor substrate Grant 9,748,151 - Ohtsuki , et al. August 29, 2	2017-08-29
Semiconductor substrate evaluating method, semiconductor substrate for evaluation, and semiconductor device Grant 9,696,368 - Ohtsuki July 4, 2	2017-07-04
Method For Evaluating Soi Substrate App 20170047258 - Ohtsuki; Tsuyoshi	2017-02-16
Method For Evaluating Semiconductor Substrate App 20160365293 - OHTSUKI; Tsuyoshi ; et al.	2016-12-15
Semiconductor Substrate For Flash Lamp Anneal, Anneal Substrate, Semiconductor Device, And Method For Manufacturing Semiconductor Device App 20160351415 - OHTSUKI; Tsuyoshi ; et al.	2016-12-01
Method For Evaluating A Semiconductor Wafer App 20160079130 - OHTSUKI; Tsuyoshi	2016-03-17
Semiconductor Substrate Evaluating Method, Semiconductor Substrate For Evaluation, And Semiconductor Device App 20150145551 - Ohtsuki; Tsuyoshi	2015-05-28
Bonded substrate and manufacturing method thereof Grant 8,900,971 - Ohtsuki , et al. December 2, 2	2014-12-02
Method for manufacturing bonded substrate having an insulator layer in part of bonded substrate Grant 8,877,609 - Ohtsuki , et al. November 4, 2	2014-11-04
Method For Manufacturing Bonded Substrate Having An Insulator Layer In Part Of Bonded Substrate App 20140120695 - Ohtsuki; Tsuyoshi ; et al.	2014-05-01
Bonded Substrate And Manufacturing Method Thereof App 20130341763 - Ohtsuki; Tsuyoshi ; et al.	2013-12-26
Semiconductor substrate having multilayer film and method to reuse the substrate by delaminating a porous layer Grant 8,575,722 - Mitani , et al. November 5, 2	2013-11-05
Method for evaluating oxide dielectric breakdown voltage of a silicon single crystal wafer Grant 8,551,246 - Tahara , et al. October 8, 2	2013-10-08
Semiconductor Wafer Having Multilayer Film, Method For Producing The Same, And Method For Producing Semiconductor Device App 20110266655 - Mitani; Kiyoshi ; et al.	2011-11-03
Method for forming oxide film on silicon wafer Grant 8,043,871 - Ohtsuki , et al. October 25, 2	2011-10-25
Silicon Single Crystal Wafer And Method For Manufacturing Silicon Single Crystal Wafer, And Method For Evaluating Silicon Single Crystal Wafer App 20110045246 - Tahara; Fumio ; et al.	2011-02-24
Method For Forming Oxide Film On Silicon Wafer App 20110033958 - Ohtsuki; Tsuyoshi ; et al.	2011-02-10
Method for evaluating semiconductor wafer App 20100022038 - Ohtsuki; Tsuyoshi ; et al.	2010-01-28
Method for evaluating semiconductor wafer and apparatus for evaluating semiconductor wafer Grant 7,633,305 - Ohtsuki , et al. December 15, 2	2009-12-15
Apparatus for evaluating semiconductor wafer Grant 7,525,327 - Ohtsuki , et al. April 28, 2	2009-04-28
Method For Evaluating Soi Wafer App 20080054920 - Ohtsuki; Tsuyoshi ; et al.	2008-03-06
Method For Evaluating Semiconductor Wafer And Apparatus For Evaluating Semiconductor Wafer App 20070279080 - Ohtsuki; Tsuyoshi ; et al.	2007-12-06
Apparatus for Evaluating Semiconductor Wafer App 20070273397 - Ohtsuki; Tsuyoshi ; et al.	2007-11-29

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