| Patent | Date |
|---|
Film thickness measurement device, film thickness measurement method, film thickness measurement program, and recording medium for recording film thickness measurement program
Grant 11,280,604 - Ohtsuka March 22, 2 | 2022-03-22 |
Film Thickness Measurement Device, Film Thickness Measurement Method, Film Thickness Measurement Program, And Recording Medium For Recording Film Thickness Measurement Program
App 20210080250 - OHTSUKA; Kenichi | 2021-03-18 |
Self-aligned trench isolation in integrated circuits
Grant 10,256,137 - Lu , et al. | 2019-04-09 |
Semiconductor device
Grant 10,062,758 - Miura , et al. August 28, 2 | 2018-08-28 |
Self-aligned Trench Isolation In Integrated Circuits
App 20180166323 - LU; Ching-Huang ; et al. | 2018-06-14 |
Film thickness measurement method and film thickness measurement device
Grant 9,846,028 - Ohtsuka , et al. December 19, 2 | 2017-12-19 |
Self-aligned trench isolation in integrated circuits
Grant 9,831,114 - Lu , et al. November 28, 2 | 2017-11-28 |
Film Thickness Measurement Method And Film Thickness Measurement Device
App 20160349038 - OHTSUKA; Kenichi ; et al. | 2016-12-01 |
Semiconductor device and method for manufacturing the same
Grant 9,502,553 - Miura , et al. November 22, 2 | 2016-11-22 |
Self-aligned trench isolation in integrated circuits
Grant 9,437,470 - Lu , et al. September 6, 2 | 2016-09-06 |
Integrating transistors with different poly-silicon heights on the same die
Grant 9,431,503 - Lin , et al. August 30, 2 | 2016-08-30 |
Semiconductor device
Grant 9,324,782 - Miura , et al. April 26, 2 | 2016-04-26 |
Power semiconductor device
Grant 9,293,572 - Furukawa , et al. March 22, 2 | 2016-03-22 |
Semiconductor Device And Method For Manufacturing The Same
App 20150303297 - MIURA; Naruhisa ; et al. | 2015-10-22 |
Semiconductor device and method of fabricating same
Grant 9,153,443 - Ohtsuka , et al. October 6, 2 | 2015-10-06 |
Semiconductor device and method for manufacturing the same
Grant 9,105,715 - Miura , et al. August 11, 2 | 2015-08-11 |
Epitaxial wafer and semiconductor element
Grant 9,059,193 - Ohtsuka , et al. June 16, 2 | 2015-06-16 |
Power semiconductor device and method for manufacturing same
Grant 9,006,819 - Hino , et al. April 14, 2 | 2015-04-14 |
Self-aligned Trench Isolation In Integrated Circuits
App 20150097245 - LU; Ching-Huang ; et al. | 2015-04-09 |
Semiconductor device including a cell array having first cells and second cells interspersed around the arrangement of the first cells
Grant 8,963,276 - Watanabe , et al. February 24, 2 | 2015-02-24 |
Semiconductor Device
App 20150001549 - Miura; Naruhisa ; et al. | 2015-01-01 |
Silicon carbide epitaxial wafer and semiconductor device
Grant 8,916,880 - Ohtsuka , et al. December 23, 2 | 2014-12-23 |
Semiconductor Device
App 20140353686 - Miura; Naruhisa ; et al. | 2014-12-04 |
Film thickness measurement device and film thickness measurement method
Grant 8,885,173 - Ohtsuka , et al. November 11, 2 | 2014-11-11 |
Semiconductor device
Grant 8,860,039 - Miura , et al. October 14, 2 | 2014-10-14 |
Semiconductor Device
App 20140299891 - Hino; Shiro ; et al. | 2014-10-09 |
Patterned dummy wafers loading in batch type CVD
Grant 8,809,206 - Sugino , et al. August 19, 2 | 2014-08-19 |
Integrating Transistors With Different Poly-silicon Heights On The Same Die
App 20140117435 - LIN; Chuan ; et al. | 2014-05-01 |
Reflectivity measuring device, reflectivity measuring method, membrane thickness measuring device, and membrane thickness measuring method
Grant 8,699,023 - Ohtsuka , et al. April 15, 2 | 2014-04-15 |
Method of manufacturing silicon carbide epitaxial wafer
Grant 8,679,952 - Tomita , et al. March 25, 2 | 2014-03-25 |
Silicon carbide semiconductor device
Grant 8,680,538 - Tarui , et al. March 25, 2 | 2014-03-25 |
Integrating transistors with different poly-silicon heights on the same die
Grant 8,652,907 - Lin , et al. February 18, 2 | 2014-02-18 |
Film thickness measurement device and measurement method
Grant 8,649,023 - Ohtsuka , et al. February 11, 2 | 2014-02-11 |
Semiconductor Device And Method Of Fabricating Same
App 20140021490 - Ohtsuka; Kenichi ; et al. | 2014-01-23 |
Method and manufacture for embedded flash to achieve high quality spacers for core and high voltage devices and low temperature spacers for high performance logic devices
Grant 8,598,005 - Chan , et al. December 3, 2 | 2013-12-03 |
Method for manufacturing silicon carbide semiconductor device
Grant 8,569,123 - Matsuno , et al. October 29, 2 | 2013-10-29 |
Method for manufacturing silicon carbide semiconductor device
Grant 8,569,106 - Hamano , et al. October 29, 2 | 2013-10-29 |
Semiconductor Device
App 20130221477 - Watanabe; Hiroshi ; et al. | 2013-08-29 |
Power semiconductor device
Grant 8,492,836 - Miura , et al. July 23, 2 | 2013-07-23 |
Power Semiconductor Device
App 20130168700 - Furukawa; Akihiko ; et al. | 2013-07-04 |
Reflectivity Measuring Device, Reflectivity Measuring Method, Membrane Thickness Measuring Device, And Membrane Thickness Measuring Method
App 20130169968 - Ohtsuka; Kenichi ; et al. | 2013-07-04 |
Silicon Carbide Epitaxial Wafer And Manufacturing Method Therefor, Silicon Carbide Bulk Substrate For Epitaxial Growth And Manufacturing Method Therefor And Heat Treatment Apparatus
App 20130126906 - Tomita; Nobuyuki ; et al. | 2013-05-23 |
Epitaxial Wafer And Semiconductor Device
App 20130099253 - Ohtsuka; Kenichi ; et al. | 2013-04-25 |
Method for manufacturing silicon carbide semiconductor device
Grant 8,377,811 - Matsuno , et al. February 19, 2 | 2013-02-19 |
Method And Manufacture For Embedded Flash To Achieve High Quality Spacers For Core And High Voltage Devices And Low Temperature Spacers For High Performance Logic Devices
App 20130023101 - Chan; Simon Siu-Sing ; et al. | 2013-01-24 |
Power Semiconductor Device And Method For Manufacturing Same
App 20130020587 - Hino; Shiro ; et al. | 2013-01-24 |
Semiconductor Device
App 20130020586 - Miura; Naruhisa ; et al. | 2013-01-24 |
Silicon carbide semiconductor device and method for manufacturing the same
Grant 8,350,270 - Watanabe , et al. January 8, 2 | 2013-01-08 |
Semiconductor device having a groove and a junction termination extension layer surrounding a guard ring layer
Grant 8,304,901 - Watanabe , et al. November 6, 2 | 2012-11-06 |
Epitaxial Wafer And Semiconductor Element
App 20120241766 - Ohtsuka; Kenichi ; et al. | 2012-09-27 |
Integrating Transistors With Different Poly-silicon Heights On The Same Die
App 20120241871 - Lin; Chuan ; et al. | 2012-09-27 |
Film Thickness Measurement Device And Film Thickness Measurement Method
App 20120218561 - Ohtsuka; Kenichi ; et al. | 2012-08-30 |
Power Semiconductor Device
App 20120205669 - Miura; Naruhisa ; et al. | 2012-08-16 |
Patterned Dummy Wafers Loading In Batch Type Cvd
App 20120202355 - Sugino; Rinji ; et al. | 2012-08-09 |
Power Semiconductor Device
App 20120074508 - OHTSUKA; Kenichi ; et al. | 2012-03-29 |
Method For Manufacturing Silicon Carbide Semiconductor Device
App 20120028453 - Matsuno; Yoshinori ; et al. | 2012-02-02 |
Power semiconductor device
Grant 8,093,598 - Ohtsuka , et al. January 10, 2 | 2012-01-10 |
Method For Manufacturing Silicon Carbide Semiconductor Device
App 20110312161 - Hamano; Kenichi ; et al. | 2011-12-22 |
Film Thickness Measurement Device And Measurement Method
App 20110299097 - Ohtsuka; Kenichi ; et al. | 2011-12-08 |
Semiconductor Device And Method For Manufacturing The Same
App 20110284874 - Miura; Naruhisa ; et al. | 2011-11-24 |
Nitride semiconductor device including an electrode in ohmic contact with a P-type nitride semiconductor contact layer
Grant 7,939,943 - Shiozawa , et al. May 10, 2 | 2011-05-10 |
MOSFET and method for manufacturing MOSFET
Grant 7,928,469 - Fujihira , et al. April 19, 2 | 2011-04-19 |
Silicon Carbide Semiconductor Device And Method For Manufacturing The Same
App 20110012133 - Watanabe; Shoyu ; et al. | 2011-01-20 |
Semiconductor Device
App 20110001209 - Watanabe; Hiroshi ; et al. | 2011-01-06 |
Silicon Carbide Semiconductor Device
App 20100314629 - Tarui; Yoichiro ; et al. | 2010-12-16 |
Silicon carbide semiconductor device
Grant 7,847,296 - Sugimoto , et al. December 7, 2 | 2010-12-07 |
Semiconductor laser
Grant 7,796,661 - Ohtsuka September 14, 2 | 2010-09-14 |
Method of manufacturing semiconductor device including gallium-nitride semiconductor structure and a palladium contact
Grant 7,678,597 - Ohtsuka , et al. March 16, 2 | 2010-03-16 |
Semiconductor Laser
App 20090190622 - Ohtsuka; Kenichi | 2009-07-30 |
Semiconductor device having junction termination extension
Grant 7,564,072 - Ohtsuka , et al. July 21, 2 | 2009-07-21 |
Mosfet And Method For Manufacturing Mosfet
App 20090173997 - Fujihira; Keiko ; et al. | 2009-07-09 |
Method Of Manufacturing Semiconductor Device
App 20090170304 - Tarui; Yoichiro ; et al. | 2009-07-02 |
Method Of Manufacturing Semiconductor Device
App 20090142871 - Ohtsuka; Kenichi ; et al. | 2009-06-04 |
Nitride Semiconductor Device And Method Of Manufacturing The Same
App 20090140389 - Shiozawa; Katsuomi ; et al. | 2009-06-04 |
Silicon Carbide Semiconductor Device
App 20090134404 - Sugimoto; Hiroshi ; et al. | 2009-05-28 |
Method For Manufacturing Silicon Carbide Semiconductor Device
App 20090098719 - MATSUNO; Yoshinori ; et al. | 2009-04-16 |
Power Semiconductor Device
App 20090020766 - Ohtsuka; Kenichi ; et al. | 2009-01-22 |
Semiconductor device
App 20060118812 - Ohtsuka; Kenichi ; et al. | 2006-06-08 |
Seat for watercraft
Grant 5,918,564 - Ohtsuka , et al. July 6, 1 | 1999-07-06 |
Semiconductor laser device
Grant 5,020,072 - Abe , et al. May 28, 1 | 1991-05-28 |
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