| Patent | Date |
|---|
Nonvolatile semiconductor memory device capable of uniformly inputting/outputting data
Grant 7,173,857 - Kato , et al. February 6, 2 | 2007-02-06 |
Nonvolatile semiconductor memory device capable of uniformly inputting/outputting data
App 20050128811 - Kato, Hiroshi ; et al. | 2005-06-16 |
Semiconductor integrated circuit device including semiconductor memory with tester circuit capable of analyzing redundancy repair
Grant 6,895,537 - Kawagoe , et al. May 17, 2 | 2005-05-17 |
Method of erasing information in non-volatile semiconductor memory device
Grant 6,891,760 - Ohtani May 10, 2 | 2005-05-10 |
Semiconductor memory device for improvement of defective data line relief rate
Grant 6,888,775 - Ohtani May 3, 2 | 2005-05-03 |
Nonvolatile semiconductor memory device capable of uniformly inputting/outputting data
Grant 6,856,550 - Kato , et al. February 15, 2 | 2005-02-15 |
Non-volatile semiconductor memory device and manufacturing method therefor
App 20040217411 - Ohtani, Jun ; et al. | 2004-11-04 |
Non-volatile semiconductor memory device having a memory cell which stably retains information
Grant 6,813,188 - Ohtani November 2, 2 | 2004-11-02 |
Non-volatile semiconductor memory device capable of rapid operation
Grant 6,809,969 - Ohtani , et al. October 26, 2 | 2004-10-26 |
Semiconductor memory device
Grant 6,807,101 - Ooishi , et al. October 19, 2 | 2004-10-19 |
Thin film magnetic memory device capable of stably writing/reading data and method of fabricating the same
Grant 6,778,432 - Ohtani August 17, 2 | 2004-08-17 |
Semiconductor memory device with word line shift configuration
Grant 6,765,832 - Ohtani July 20, 2 | 2004-07-20 |
Semiconductor memory device for improvement of defective data line relief rate
App 20040114449 - Ohtani, Jun | 2004-06-17 |
Non-volatile semiconductor memory device capable of high-speed data reading
Grant 6,744,672 - Ohtani , et al. June 1, 2 | 2004-06-01 |
Non-volatile semiconductor memory device capable of rapid operation
App 20040076038 - Ohtani, Jun ; et al. | 2004-04-22 |
Semiconductor memory device with latch circuit and two magneto-resistance elements
Grant 6,717,844 - Ohtani April 6, 2 | 2004-04-06 |
Thin film magnetic memory device capable of stably writing/reading data and method of fabricating the same
App 20040052107 - Ohtani, Jun | 2004-03-18 |
Semiconductor Memory Device With Latch Circuit And Two Magneto-resistance Elements
App 20040052106 - Ohtani, Jun | 2004-03-18 |
Non-volatile semiconductor memory device
App 20040027859 - Ohtani, Jun | 2004-02-12 |
Thin film magnetic memory device having redundancy repair function
Grant 6,671,213 - Ohtani December 30, 2 | 2003-12-30 |
Method of erasing information in non-volatile semiconductor memory device
App 20030223273 - Ohtani, Jun | 2003-12-04 |
Nonvolatile semiconductor memory device capable of uniformly inputting/outputting data
App 20030218897 - Kato, Hiroshi ; et al. | 2003-11-27 |
Non-volatile semiconductor memory device capable of high-speed data reading
App 20030210570 - Ohtani, Jun ; et al. | 2003-11-13 |
Semiconductor integrated circuit device provided with a self-testing circuit for carrying out an analysis for repair by using a redundant memory cell
Grant 6,625,072 - Ohtani , et al. September 23, 2 | 2003-09-23 |
Semiconductor memory device
App 20030169622 - Ooishi, Tsukasa ; et al. | 2003-09-11 |
Non-volatile semiconductor memory device and manufacturing method therefor
App 20030157758 - Ohtani, Jun ; et al. | 2003-08-21 |
Thin film magnetic memory device having redundancy repair function
App 20030133334 - Ohtani, Jun | 2003-07-17 |
Semiconductor integrated circuit device provided with a self-testing circuit for carrying out ananalysis for repair by using a redundant memory cell
App 20020196683 - Ohtani, Jun ; et al. | 2002-12-26 |
Semiconductor integrated circuit device capable of self-analyzing redundancy replacement adapting to capacities of plural memory circuits integrated therein
Grant 6,421,286 - Ohtani , et al. July 16, 2 | 2002-07-16 |
Semiconductor memory device allowing spare memory cell to be tested efficiently
App 20020003732 - Ohtani, Jun ; et al. | 2002-01-10 |
Semiconductor integrated circuit device including semiconductor memory with tester circuit capable of analyzing redundancy repair
App 20010056557 - Kawagoe, Tomoya ; et al. | 2001-12-27 |
Memory integrated circuit device including a memory having a configuration suitable for mixture with logic
Grant 6,130,852 - Ohtani , et al. October 10, 2 | 2000-10-10 |
Clock synchronous semiconductor memory device for determining an operation mode
Grant 5,835,448 - Ohtani , et al. November 10, 1 | 1998-11-10 |
Clock synchronous semiconductor memory device
Grant 5,708,622 - Ohtani , et al. January 13, 1 | 1998-01-13 |
Clock synchronous semiconductor memory device
Grant 5,521,878 - Ohtani , et al. May 28, 1 | 1996-05-28 |
| 