Ohtaki; Mikio
Patent Applications and Registrations
Patent applications and USPTO patent grants for Ohtaki; Mikio.The latest application filed is for "method of testing circuit elements on a semiconductor wafer".
- Ohtaki; Mikio - Tokyo JP
| Patent | Date |
|---|---|
| Method of testing circuit elements on a semiconductor wafer Grant 7,639,027 - Ohtaki December 29, 2 | 2009-12-29 |
| Method for manufacturing and testing semiconductor devices on a resin-coated wafer Grant 7,262,610 - Ohtaki August 28, 2 | 2007-08-28 |
| Method of testing circuit elements on a semiconductor wafer App 20070194802 - Ohtaki; Mikio | 2007-08-23 |
| Method for manufacturing and batch testing semiconductor devices Grant 6,879,169 - Ohtaki April 12, 2 | 2005-04-12 |
| Semiconductor device test method App 20030076128 - Ohtaki, Mikio | 2003-04-24 |
| Semiconductor device test method App 20020030501 - Ohtaki, Mikio | 2002-03-14 |
| Semiconductor Device Test Apparatus App 20010053170 - OHTAKI, MIKIO | 2001-12-20 |
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