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Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device
Grant 7,348,595 - Takeoka , et al. March 25, 2 | 2008-03-25 |
Methods for evaluating quality of test sequences for delay faults and related technology
Grant 7,302,658 - Takeoka , et al. November 27, 2 | 2007-11-27 |
Semiconductor integrated circuit and testing method for the same
App 20070250284 - Takeoka; Sadami ; et al. | 2007-10-25 |
Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the same
App 20070106965 - Ohta; Mitsuyasu ; et al. | 2007-05-10 |
Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the same
Grant 7,203,913 - Ohta , et al. April 10, 2 | 2007-04-10 |
Semiconductor integrated circuit and testing method for the same
Grant 7,197,725 - Takeoka , et al. March 27, 2 | 2007-03-27 |
Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device
Grant 7,171,600 - Takeoka , et al. January 30, 2 | 2007-01-30 |
Test pattern generation method
App 20070011543 - Yoshimura; Shinichi ; et al. | 2007-01-11 |
Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device
Grant 7,032,196 - Takeoka , et al. April 18, 2 | 2006-04-18 |
Methods for evaluating quality of test sequences for delay faults and related technology
App 20050010839 - Takeoka, Sadami ; et al. | 2005-01-13 |
Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device
App 20040197941 - Takeoka, Sadami ; et al. | 2004-10-07 |
Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device
App 20040199840 - Takeoka, Sadami ; et al. | 2004-10-07 |
Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device
App 20040195672 - Takeoka, Sadami ; et al. | 2004-10-07 |
Functional block for integrated circuit, semiconductor integrated circuit, method for testing semiconductor integrated circuit, and method for designing semiconductor integrated circuit
App 20040139376 - Ohta, Mitsuyasu ; et al. | 2004-07-15 |
Semiconductor device having a device for testing the semiconductor
Grant 6,734,549 - Takeoka , et al. May 11, 2 | 2004-05-11 |
Functional block for integrated circuit, semiconductor integrated circuit, inspection method for semiconductor integrated circuit, and designing method therefor
Grant 6,708,301 - Ohta , et al. March 16, 2 | 2004-03-16 |
Method of design for testability, test sequence generation method and semiconductor integrated circuit
Grant 6,651,206 - Hosokawa , et al. November 18, 2 | 2003-11-18 |
Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the same
Grant 6,625,784 - Ohta , et al. September 23, 2 | 2003-09-23 |
Database for designing integrated circuit device, and method for designing integrated circuit device
Grant 6,615,389 - Ohta , et al. September 2, 2 | 2003-09-02 |
Semiconductor integrated circuit device, method of testing the same, database for design of the same and method of designing the same
App 20030046643 - Ohta, Mitsuyasu ; et al. | 2003-03-06 |
Semiconductor wiring substrate, semiconductor device, method for testing semiconductor device, and method for mounting semiconductor device
App 20030025191 - Takeoka, Sadami ; et al. | 2003-02-06 |
Semiconductor integrated circuit and testing method for the same
App 20030021464 - Takeoka, Sadami ; et al. | 2003-01-30 |
Method of design for testability, test sequence generation method and semiconductor integrated circuit
App 20020026611 - Hosokawa, Toshinori ; et al. | 2002-02-28 |
Method of design for testability test sequence generation method and semiconductor integrated circuit
Grant 6,253,343 - Hosokawa , et al. June 26, 2 | 2001-06-26 |
Semiconductor integrated circuit
Grant 6,119,250 - Nishimura , et al. September 12, 2 | 2000-09-12 |
Semiconductor circuit system, method for testing semiconductor integrated circuits, and method for generating a test sequence for testing thereof
Grant 5,978,948 - Ohta November 2, 1 | 1999-11-02 |
Method for generating test sequences for detecting faults in target scan logical blocks
Grant 5,617,427 - Ohta , et al. April 1, 1 | 1997-04-01 |
Method of test sequence generation
Grant 5,305,328 - Motohara , et al. April 19, 1 | 1994-04-19 |
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