OHT Inc.

Patent Applications and Registrations

Patent applications and USPTO patent grants for OHT Inc..The latest application filed is for "capacitive sensor and manufacturing method of capacitive sensor".

Company Profile

0.27.6

OHT Inc. - Hiroshima JP
OHT Inc. - Fukayasu-Gun JP
OHT Inc. - Hiroshima-ken JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Capacitive Sensor And Manufacturing Method Of Capacitive Sensor App 20220011255 - YASUDA; Toshiro ; et al.	2022-01-13
Capacitance Detection Area Sensor And Conductive Pattern Sensing Apparatus Having Capacitance Detection Area Sensor App 20210293866 - SUGAWA; Shigetoshi ; et al.	2021-09-23
Wire harness checker and wire harness checking method Grant 7,495,452 - Hayashi , et al. February 24, 2	2009-02-24
Conductor inspection apparatus and conductor inspection method Grant 7,332,914 - Yamaoka , et al. February 19, 2	2008-02-19
Apparatus and method for inspecting electronic circuits Grant 7,239,127 - Odan , et al. July 3, 2	2007-07-03
Sensor for inspection instrument and inspection instrument Grant 7,173,445 - Fujii , et al. February 6, 2	2007-02-06
Device and method for inspection Grant 7,138,805 - Ishioka , et al. November 21, 2	2006-11-21
Circuit pattern inspection instrument and pattern inspection method Grant 7,088,107 - Yamaoka , et al. August 8, 2	2006-08-08
Inspection device and inspection method Grant 7,049,826 - Okano , et al. May 23, 2	2006-05-23
Low-noise active RC signal processing circuit Grant 7,026,870 - Nakamura , et al. April 11, 2	2006-04-11
Circuit pattern inspection apparatus, circuit pattern inspection method, and recording medium Grant 6,995,566 - Yamaoka , et al. February 7, 2	2006-02-07
Device and method for substrate displacement detection Grant 6,992,493 - Yamaoka , et al. January 31, 2	2006-01-31
Device and method for inspecting circuit board Grant 6,972,573 - Ishioka , et al. December 6, 2	2005-12-06
Apparatus and method for inspecting electronic circuits Grant 6,967,498 - Odan , et al. November 22, 2	2005-11-22
Inspecting apparatus and inspecting method for circuit board Grant 6,958,619 - Yamaoka , et al. October 25, 2	2005-10-25
Inspection method and apparatus for testing fine pitch traces Grant 6,952,104 - Yamaoka , et al. October 4, 2	2005-10-04
Apparatus and method for inspecting electrical continuity of circuit board, jig for use therein, and recording medium thereon Grant 6,947,853 - Yamaoka September 20, 2	2005-09-20
Circuit pattern inspection device, circuit pattern inspection method, and recording medium Grant 6,943,559 - Yamaoka , et al. September 13, 2	2005-09-13
Electronic circuit inspection sensor and inspection system using same Grant 6,933,740 - Odan , et al. August 23, 2	2005-08-23
Inspection unit and method of manufacturing substrate Grant 6,894,515 - Okano , et al. May 17, 2	2005-05-17
Inspection apparatus for conductive patterns of a circuit board, and a holder thereof Grant 6,861,863 - Ishioka , et al. March 1, 2	2005-03-01
Apparatus and method for inspecting a board used in a liquid crystal panel Grant 6,859,062 - Fujii , et al. February 22, 2	2005-02-22
Apparatus and method for inspecting electrical continuity of circuit board, jig for use therein, and recording medium thereon App 20050038613 - Yamaoka, Shuji	2005-02-17
Inspecting apparatus and inspecting method for circuit board Grant 6,842,026 - Yamaoka , et al. January 11, 2	2005-01-11
Tester and testing method App 20040243345 - Fujii, Tatsuhisa ; et al.	2004-12-02
Method and apparatus for circuit board continuity test, tool for continuity test, and recording medium Grant 6,825,673 - Yamaoka November 30, 2	2004-11-30
Inspection apparatus and sensor Grant 6,734,692 - Fujii , et al. May 11, 2	2004-05-11
Method and apparatus for inspection Grant 6,710,607 - Fujii , et al. March 23, 2	2004-03-23
Sensor probe for use in board inspection and manufacturing method thereof App 20040027146 - Odan, Yuji ; et al.	2004-02-12
Sensor probe for use in board inspection and manufacturing method thereof Grant 6,614,250 - Odan , et al. September 2, 2	2003-09-02
Non-contact board inspection probe Grant 6,201,398 - Takada March 13, 2	2001-03-13
Inspection method of conductive patterns Grant 6,160,409 - Nurioka December 12, 2	2000-12-12

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