Ohshima; Yoshimasa

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ohshima; Yoshimasa.The latest application filed is for "method of inspecting a semiconductor device and an apparatus thereof".

Company Profile

0.52.41

Ohshima; Yoshimasa - Yokohama N/A JP
Ohshima; Yoshimasa - Yokohamai JP
Ohshima; Yoshimasa - Yokohama-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method of inspecting a semiconductor device and an apparatus thereof Grant 8,559,000 - Hamamatsu , et al. October 15, 2	2013-10-15
Defects inspecting apparatus and defects inspecting method Grant 8,508,727 - Uto , et al. August 13, 2	2013-08-13
Method Of Inspecting A Semiconductor Device And An Apparatus Thereof App 20120312104 - HAMAMATSU; Akira ; et al.	2012-12-13
Defects Inspecting Apparatus And Defects Inspecting Method App 20120262709 - Uto; Sachio ; et al.	2012-10-18
Method of apparatus for detecting particles on a specimen Grant 8,289,507 - Hamamatsu , et al. October 16, 2	2012-10-16
Method of inspecting a semiconductor device and an apparatus thereof Grant 8,274,651 - Hamamatsu , et al. September 25, 2	2012-09-25
Inspection method and inspection apparatus Grant 8,269,959 - Hamamatsu , et al. September 18, 2	2012-09-18
Defects inspecting apparatus and defects inspecting method Grant 8,228,495 - Uto , et al. July 24, 2	2012-07-24
Inspection Method And Inspection Apparatus App 20120133929 - HAMAMATSU; Akira ; et al.	2012-05-31
Method Of Inspecting A Semiconductor Device And An Apparatus Thereof App 20120006131 - Hamamatsu; Akira ; et al.	2012-01-12
Inspection method and inspection apparatus Grant 8,094,295 - Hamamatsu , et al. January 10, 2	2012-01-10
Defects Inspecting Apparatus And Defects Inspecting Method App 20110310382 - UTO; Sachio ; et al.	2011-12-22
Method of inspecting a semiconductor device and an apparatus thereof Grant 8,040,503 - Hamamatsu , et al. October 18, 2	2011-10-18
Method Of Apparatus For Detecting Particles On A Specimen App 20110228258 - HAMAMATSU; Akira ; et al.	2011-09-22
Defects inspecting apparatus and defects inspecting method Grant 8,013,989 - Uto , et al. September 6, 2	2011-09-06
Method of apparatus for detecting particles on a specimen Grant 7,952,700 - Hamamatsu , et al. May 31, 2	2011-05-31
Method of detecting defects on an object Grant 7,940,383 - Noguchi , et al. May 10, 2	2011-05-10
Method for inspecting defect and apparatus for inspecting defect Grant 7,903,244 - Hamamatsu , et al. March 8, 2	2011-03-08
Method Of Apparatus For Detecting Particles On A Specimen App 20110032515 - HAMAMATSU; Akira ; et al.	2011-02-10
Method of apparatus for detecting particles on a specimen Grant 7,817,261 - Hamamatsu , et al. October 19, 2	2010-10-19
Defects Inspecting Apparatus And Defects Inspecting Method App 20100259751 - UTO; Sachio ; et al.	2010-10-14
Defects inspecting apparatus and defects inspecting method Grant 7,768,634 - Uto , et al. August 3, 2	2010-08-03
Method Of Inspecting A Semiconductor Device And An Apparatus Thereof App 20100140474 - HAMAMATSU; Akira ; et al.	2010-06-10
Method And Apparatus For Detecting Defects App 20100103409 - OHSHIMA; Yoshimasa ; et al.	2010-04-29
Apparatus And Method For Testing Defects App 20100088042 - NOGUCHI; Minori ; et al.	2010-04-08
Apparatus and method for testing defects Grant 7,692,779 - Noguchi , et al. April 6, 2	2010-04-06
Inspection Method And Inspection Apparatus App 20100002227 - HAMAMATSU; Akira ; et al.	2010-01-07
Method of inspecting a semiconductor device and an apparatus thereof Grant 7,643,138 - Hamamatsu , et al. January 5, 2	2010-01-05
Method and apparatus for detecting defects Grant 7,643,139 - Ohshima , et al. January 5, 2	2010-01-05
Method For Inspecting Defect And Apparatus For Inspecting Defect App 20090323054 - HAMAMATSU; Akira ; et al.	2009-12-31
Apparatus and method for testing defects Grant 7,639,350 - Noguchi , et al. December 29, 2	2009-12-29
Method for inspecting defect and apparatus for inspecting defect Grant 7,586,594 - Hamamatsu , et al. September 8, 2	2009-09-08
Inspection method and inspection apparatus Grant 7,586,593 - Hamamatsu , et al. September 8, 2	2009-09-08
Method and apparatus for detecting defects on a wafer Grant 7,567,343 - Ohshima , et al. July 28, 2	2009-07-28
Defects Inspecting Apparatus And Defects Inspecting Method App 20090033924 - Uto; Sachio ; et al.	2009-02-05
Method Of Inspecting A Semiconductor Device And An Apparatus Thereof App 20080291437 - Hamamatsu; Akira ; et al.	2008-11-27
Apparatus and method for testing defects Grant 7,443,496 - Noguchi , et al. October 28, 2	2008-10-28
Method and apparatus for detecting defects Grant 7,426,023 - Ohshima , et al. September 16, 2	2008-09-16
Method Of Apparatus For Detecting Particles On A Specimen App 20080204724 - Hamamatsu; Akira ; et al.	2008-08-28
Method of inspecting a semiconductor device and an apparatus thereof Grant 7,417,723 - Hamamatsu , et al. August 26, 2	2008-08-26
Defect detector and defect detecting method Grant 7,417,721 - Uto , et al. August 26, 2	2008-08-26
Method and its apparatus for inspecting particles or defects of a semiconductor device Grant 7,411,207 - Nishiyama , et al. August 12, 2	2008-08-12
Method of apparatus for detecting particles on a specimen Grant 7,369,223 - Hamamatsu , et al. May 6, 2	2008-05-06
Semiconductor device inspection method Grant 7,332,359 - Hamamatsu , et al. February 19, 2	2008-02-19
Inspection method and inspection apparatus Grant 7,315,363 - Hamamatsu , et al. January 1, 2	2008-01-01
Method And Its Apparatus For Inspecting Particles Or Defects Of A Semiconductor Device App 20070265797 - Nishiyama; Hidetoshi ; et al.	2007-11-15
Method For Inspecting Defect And Apparatus For Inspecting Defect App 20070247616 - HAMAMATSU; AKIRA ; et al.	2007-10-25
Method and its apparatus for inspecting particles or defects of a semiconductor device Grant 7,262,425 - Nishiyama , et al. August 28, 2	2007-08-28
Method for inspecting defect and apparatus for inspecting defect Grant 7,248,352 - Hamamatsu , et al. July 24, 2	2007-07-24
Apparatus And Method For Testing Defects App 20070146697 - Noguchi; Minori ; et al.	2007-06-28
Apparatus And Method For Testing Defects App 20070146696 - Noguchi; Minori ; et al.	2007-06-28
Inspection method and inspection apparatus App 20070070339 - Hamamatsu; Akira ; et al.	2007-03-29
Method and apparatus for detecting defects on a wafer App 20070070337 - Ohshima; Yoshimasa ; et al.	2007-03-29
Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process Grant 7,177,020 - Morioka , et al. February 13, 2	2007-02-13
Method of inspecting a semiconductor device and an apparatus thereof App 20060215153 - Hamamatsu; Akira ; et al.	2006-09-28
Apparatus and method for testing defects Grant 7,098,055 - Noguchi , et al. August 29, 2	2006-08-29
Method and apparatus for detecting defects App 20060139629 - Ohshima; Yoshimasa ; et al.	2006-06-29
Defect detector and defect detecting method App 20060124874 - Uto; Sachio ; et al.	2006-06-15
Method of inspecting a semiconductor device and an apparatus thereof Grant 7,061,602 - Hamamatsu , et al. June 13, 2	2006-06-13
Apparatus and method for testing defects Grant 7,037,735 - Noguchi , et al. May 2, 2	2006-05-02
Method and apparatus for detecting defects App 20060068512 - Ohshima; Yoshimasa ; et al.	2006-03-30
Apparatus and method for testing defects App 20060030060 - Noguchi; Minori ; et al.	2006-02-09
Apparatus and method for testing defects App 20060030059 - Noguchi; Minori ; et al.	2006-02-09
Method and its apparatus for inspecting particles or defects of a semiconductor device App 20050264798 - Nishiyama, Hidetoshi ; et al.	2005-12-01
Method and apparatus for detecting defects App 20050264797 - Nakano, Hiroyuki ; et al.	2005-12-01
Method of apparatus for detecting particles on a specimen App 20050213086 - Hamamatsu, Akira ; et al.	2005-09-29
Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process App 20050206887 - Morioka, Hiroshi ; et al.	2005-09-22
Method of inspecting a semiconductor device and an apparatus thereof App 20050196033 - Hamamatsu, Akira ; et al.	2005-09-08
Method and its apparatus for inspecting particles or defects of a semiconductor device Grant 6,936,835 - Nishiyama , et al. August 30, 2	2005-08-30
Method and apparatus for reviewing defects App 20050122508 - Uto, Sachio ; et al.	2005-06-09
Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process Grant 6,894,773 - Morioka , et al. May 17, 2	2005-05-17
Method of inspecting a semiconductor device and an apparatus thereof Grant 6,888,959 - Hamamatsu , et al. May 3, 2	2005-05-03
Method for inspecting defect and apparatus for inspecting defect App 20040160599 - Hamamatsu, Akira ; et al.	2004-08-19
Inspection method and inspection apparatus App 20040105093 - Hamamatsu, Akira ; et al.	2004-06-03
Apparatus for detecting foreign particle and defect and the same method Grant 6,731,384 - Ohshima , et al. May 4, 2	2004-05-04
Semiconductor device producing method, system for carrying out the same and semiconductor work processing apparatus included in the same system Grant 6,650,409 - Noguchi , et al. November 18, 2	2003-11-18
Apparatus and method of inspecting foreign particle or defect on a sample Grant 6,597,448 - Nishiyama , et al. July 22, 2	2003-07-22
Semiconductor device inspection method App 20030022401 - Hamamatsu, Akira ; et al.	2003-01-30
Method and its apparatus for inspecting particles or defects of a semiconductor device App 20030001120 - Nishiyama, Hidetoshi ; et al.	2003-01-02
Optical apparatus for defect and particle size inspection Grant 6,411,377 - Noguchi , et al. June 25, 2	2002-06-25
Apparatus for detecting foreign particle and defect and the same method App 20020041374 - Ohshima, Yoshimasa ; et al.	2002-04-11
Method of inspecting a semiconductor device and an apparatus thereof App 20010048761 - Hamamatsu, Akira ; et al.	2001-12-06
Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process App 20010021015 - Morioka, Hiroshi ; et al.	2001-09-13
Method and apparatus for analyzing the state of generation of foreign particles in semiconductor fabrication process Grant 5,463,459 - Morioka , et al. October 31, 1	1995-10-31
Method and apparatus for inspecting foreign particles on real time basis in semiconductor mass production line Grant 5,274,434 - Morioka , et al. December 28, 1	1993-12-28
Method and apparatus of inspecting foreign matters during mass production start-up and mass production line in semiconductor production process Grant 5,233,191 - Noguchi , et al. August 3, 1	1993-08-03
Method of and apparatus for inspecting surface defects Grant 5,135,303 - Uto , et al. August 4, 1	1992-08-04
Method of and apparatus for detecting foreign substance Grant 4,922,308 - Noguchi , et al. May 1, 1	1990-05-01
Method of detecting pattern defect and its apparatus Grant 4,614,430 - Hara , et al. September 30, 1	1986-09-30
Test apparatus for defects of plate Grant 4,460,273 - Koizumi , et al. July 17, 1	1984-07-17
Focusing position detecting device in optical magnifying and observing apparatus Grant 4,433,235 - Akiyama , et al. February 21, 1	1984-02-21