Ohshima; Takashi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Ohshima; Takashi.The latest application filed is for "electron beam apparatus".
Company Profile
11.72.65
- Ohshima; Takashi - Tokyo JP
- Ohshima; Takashi - Fukuoka JP
- OHSHIMA; Takashi - Fukuoka-shi JP
- Ohshima; Takashi - Saitama JP
- Ohshima; Takashi - Kumagaya JP
- Ohshima; Takashi - Fussa JP
- Ohshima; Takashi - Yokohama N/A JP
- Ohshima; Takashi - Osaka JP
- Ohshima; Takashi - Kohoku-ku JP
- Ohshima; Takashi - Higashimurayama JP
- Ohshima; Takashi - Suita-shi JP
- Ohshima; Takashi - Suita JP
- Ohshima, Takashi - Bunkyo-Ku JP
- Ohshima; Takashi - Akishima JP
- Ohshima; Takashi - Fuchu JP
- Ohshima; Takashi - Kokubunji JP
- Ohshima; Takashi - Oyama JP
Patent Activity
| Patent | Date |
|---|---|
| Electron Beam Apparatus App 20220165536 - Ohshima; Takashi ; et al. | 2022-05-26 |
| Electron source, method for manufacturing the same, and electron beam device using the same Grant 11,322,329 - Kusunoki , et al. May 3, 2 | 2022-05-03 |
| Electron microscope Grant 11,251,011 - Ohshima , et al. February 15, 2 | 2022-02-15 |
| Polymer-supported metal Grant 11,185,851 - Matsushima , et al. November 30, 2 | 2021-11-30 |
| Electron Source, Method For Manufacturing The Same, And Electron Beam Device Using The Same App 20210327674 - KUSUNOKI; Toshiaki ; et al. | 2021-10-21 |
| Electron Beam Application Device App 20210319970 - Ohshima; Takashi ; et al. | 2021-10-14 |
| Electron microscope Grant 11,087,947 - Ohshima , et al. August 10, 2 | 2021-08-10 |
| Charged particle detector including a light-emitting section having lamination structure, charged particle beam device, and mass spectrometer Grant 11,062,892 - Imamura , et al. July 13, 2 | 2021-07-13 |
| Charged particle detector and charged particle beam apparatus Grant 10,984,979 - Imamura , et al. April 20, 2 | 2021-04-20 |
| Electron Microscope App 20200303152 - OHSHIMA; Takashi ; et al. | 2020-09-24 |
| Electron source and electron beam device using the same Grant 10,707,046 - Kusunoki , et al. | 2020-07-07 |
| Field emission electron source, method for manufacturing same, and electron beam device Grant 10,586,674 - Kusunoki , et al. | 2020-03-10 |
| Electron beam apparatus Grant 10,522,319 - Kasuya , et al. Dec | 2019-12-31 |
| Electron Source and Electron Beam Device Using the Same App 20190385809 - KUSUNOKI; Toshiaki ; et al. | 2019-12-19 |
| Charged Particle Detector And Charged Particle Beam Apparatus App 20190355549 - IMAMURA; Shin ; et al. | 2019-11-21 |
| Electron Beam Apparatus App 20190237289 - KASUYA; Keigo ; et al. | 2019-08-01 |
| Ion beam device and sample observation method Grant 10,340,117 - Matsubara , et al. | 2019-07-02 |
| Charged particle beam device, sample observation method, sample platform, observation system, and light emitting member Grant 10,241,062 - Ominami , et al. | 2019-03-26 |
| Polymer-supported Metal App 20190060887 - MATSUSHIMA; Yoshimasa ; et al. | 2019-02-28 |
| Field Emission Electron Source, Method for Manufacturing Same, and Electron Beam Device App 20190066966 - KUSUNOKI; Toshiaki ; et al. | 2019-02-28 |
| Charged Particle Detector, Charged Particle Beam Device, And Mass Spectrometer App 20190027351 - IMAMURA; Shin ; et al. | 2019-01-24 |
| Charged particle beam device Grant 10,134,564 - Okumura , et al. November 20, 2 | 2018-11-20 |
| Time measurement device Grant 10,012,957 - Ohshima , et al. July 3, 2 | 2018-07-03 |
| Time Measurement Device App 20170371301 - Ohshima; Takashi ; et al. | 2017-12-28 |
| Ion pump and charged particle beam device using the same Grant 9,837,243 - Kasuya , et al. December 5, 2 | 2017-12-05 |
| Charged Particle Beam Device App 20170330724 - OKUMURA; Taiga ; et al. | 2017-11-16 |
| Sample holder with light emitting and transferring elements for a charged particle beam apparatus Grant 9,812,288 - Shouji , et al. November 7, 2 | 2017-11-07 |
| Transesterification Reaction By Means Of Iron Catalyst App 20170275241 - OHSHIMA; Takashi ; et al. | 2017-09-28 |
| Floor panel Grant 9,771,724 - Ohshima , et al. September 26, 2 | 2017-09-26 |
| Base isolation floor structure Grant 9,752,330 - Ohshima , et al. September 5, 2 | 2017-09-05 |
| Ion Beam Device And Sample Observation Method App 20170229284 - MATSUBARA; Shinichi ; et al. | 2017-08-10 |
| Floor panel Grant 9,683,374 - Ohshima , et al. June 20, 2 | 2017-06-20 |
| Zinc complex Grant 9,611,279 - Ohshima , et al. April 4, 2 | 2017-04-04 |
| Lid member and floor panel using the same Grant 9,593,492 - Ohshima , et al. March 14, 2 | 2017-03-14 |
| Sample Holder, Observation System, And Image Generation Method App 20170069458 - SHOUJI; Minami ; et al. | 2017-03-09 |
| Electron gun, charged particle gun, and charged particle beam apparatus using electron gun and charged particle gun Grant 9,570,268 - Imai , et al. February 14, 2 | 2017-02-14 |
| Sample base, charged particle beam device and sample observation method Grant 9,508,527 - Ominami , et al. November 29, 2 | 2016-11-29 |
| Floor Panel App 20160237698 - OHSHIMA; Takashi ; et al. | 2016-08-18 |
| Ion Pump And Charged Particle Beam Device Using The Same App 20160233050 - KASUYA; Keigo ; et al. | 2016-08-11 |
| Floor Panel App 20160201340 - OHSHIMA; Takashi ; et al. | 2016-07-14 |
| Lid Member And Floor Panel Using The Same App 20160153201 - OHSHIMA; Takashi ; et al. | 2016-06-02 |
| Electron microscope and electron beam detector Grant 9,355,815 - Imamura , et al. May 31, 2 | 2016-05-31 |
| Free access floor panel Grant D754,368 - Ohshima , et al. April 19, 2 | 2016-04-19 |
| Free access floor panel Grant D754,369 - Ohshima , et al. April 19, 2 | 2016-04-19 |
| Electron Gun, Charged Particle Gun, And Charged Particle Beam Apparatus Using Electron Gun And Charged Particle Gun App 20160104597 - IMAI; Yuta ; et al. | 2016-04-14 |
| Base Isolation Floor Structure App 20160097205 - OHSHIMA; Takashi ; et al. | 2016-04-07 |
| Production method for compound comprising amino group and/or hydroxyl group Grant 9,278,905 - Ohshima , et al. March 8, 2 | 2016-03-08 |
| Electronic Device And Method Recorded-program Processing Method App 20160044369 - Ohshima; Takashi | 2016-02-11 |
| Charged Particle Beam Device, Sample Observation Method, Sample Platform, Observation System, and Light Emitting Member App 20160025659 - OMINAMI; Yusuke ; et al. | 2016-01-28 |
| Zinc Complex App 20160002268 - OHSHIMA; Takashi ; et al. | 2016-01-07 |
| Lid for opening portion of free access floor panel Grant D745,193 - Ohshima , et al. December 8, 2 | 2015-12-08 |
| Charged particle beam apparatus Grant 9,208,995 - Ominami , et al. December 8, 2 | 2015-12-08 |
| Electron beam apparatus for visualizing a displacement of an electric field Grant 9,208,994 - Ohshima , et al. December 8, 2 | 2015-12-08 |
| Charged particle radiation device with bandpass detection Grant 9,202,667 - Hatano , et al. December 1, 2 | 2015-12-01 |
| Sample Base, Charged Particle Beam Device and Sample Observation Method App 20150318143 - OMINAMI; Yusuke ; et al. | 2015-11-05 |
| Electron Microscope And Electron Beam Detector App 20150214002 - Imamura; Shin ; et al. | 2015-07-30 |
| Scanning electron microscope Grant 9,029,766 - Morishita , et al. May 12, 2 | 2015-05-12 |
| Production Method For Compound Comprising Amino Group And/or Hydroxyl Group App 20150105559 - Ohshima; Takashi ; et al. | 2015-04-16 |
| Charged Particle Beam Apparatus App 20150014530 - Ominami; Yusuke ; et al. | 2015-01-15 |
| Scanning Electron Microscope App 20140361167 - Morishita; Hideo ; et al. | 2014-12-11 |
| Electric field discharge-type electron source Grant 8,866,371 - Katagiri , et al. October 21, 2 | 2014-10-21 |
| Electric Field Discharge-type Electron Source App 20140197725 - Katagiri; Souichi ; et al. | 2014-07-17 |
| Charged particle beam apparatus, and method of controlling the same Grant 8,772,735 - Kasuya , et al. July 8, 2 | 2014-07-08 |
| Knee airbag Grant 8,714,585 - Okamoto , et al. May 6, 2 | 2014-05-06 |
| Charged particle beam apparatus Grant 8,686,380 - Katagiri , et al. April 1, 2 | 2014-04-01 |
| Airbag Grant 8,651,513 - Okamoto , et al. February 18, 2 | 2014-02-18 |
| Charged particle beam apparatus Grant 8,629,395 - Morishita , et al. January 14, 2 | 2014-01-14 |
| Gas field ion source, charged particle microscope, and apparatus Grant 8,530,865 - Shichi , et al. September 10, 2 | 2013-09-10 |
| Acylation Reaction Of Hydroxyl Group App 20130190502 - Mashima; Kazushi ; et al. | 2013-07-25 |
| Electron Beam Apparatus App 20130146766 - Ohshima; Takashi ; et al. | 2013-06-13 |
| Electron beam device and electron beam application device using the same Grant 8,450,699 - Ohshima , et al. May 28, 2 | 2013-05-28 |
| Acylation reaction of hydroxyl group Grant 8,431,709 - Mashima , et al. April 30, 2 | 2013-04-30 |
| Charged particle radiation device Grant 8,426,835 - Kasuya , et al. April 23, 2 | 2013-04-23 |
| Charged Particle Beam Apparatus, And Method Of Controlling The Same App 20130063029 - KASUYA; Keigo ; et al. | 2013-03-14 |
| Charged Particle Radiation Device App 20130043388 - Hatano; Michio ; et al. | 2013-02-21 |
| Knee Airbag App 20130015646 - Okamoto; Masakazu ; et al. | 2013-01-17 |
| Airbag App 20120313358 - Okamoto; Masakazu ; et al. | 2012-12-13 |
| Charged Particle Beam Apparatus App 20120298864 - Morishita; Hideo ; et al. | 2012-11-29 |
| Charged particle beam apparatus, and method of controlling the same Grant 8,319,193 - Kasuya , et al. November 27, 2 | 2012-11-27 |
| Small electron gun Grant 8,232,712 - Katagiri , et al. July 31, 2 | 2012-07-31 |
| Scanning electron microscope Grant 8,217,363 - Hatano , et al. July 10, 2 | 2012-07-10 |
| Gas Field Ion Source, Charged Particle Microscope, And Apparatus App 20120119086 - Shichi; Hiroyasu ; et al. | 2012-05-17 |
| Charged Particle Radiation Device App 20120085925 - Kasuya; Keigo ; et al. | 2012-04-12 |
| Gas field ion source, charged particle microscope, and apparatus Grant 8,115,184 - Shichi , et al. February 14, 2 | 2012-02-14 |
| Electron Beam Device And Electron Beam Application Device Using The Same App 20110240855 - Ohshima; Takashi ; et al. | 2011-10-06 |
| Electron Source, Electron Gun, And Electron Microscope Device And Electron Beam Lithography Device Using It App 20110186735 - FUJIEDA; Tadashi ; et al. | 2011-08-04 |
| Condensation Reaction By Metal Catalyst App 20110098479 - MASHIMA; KAZUSHI ; et al. | 2011-04-28 |
| Charged Particle Beam Apparatus, And Method Of Controlling The Same App 20110089336 - Kasuya; Keigo ; et al. | 2011-04-21 |
| Condensation reaction by metal catalyst Grant 7,888,513 - Mashima , et al. February 15, 2 | 2011-02-15 |
| Acylation Reaction Of Hydroxyl Group App 20100249422 - Mashima; Kazushi ; et al. | 2010-09-30 |
| Charged particle beam system and method for evacuation of the system Grant 7,781,743 - Katagiri , et al. August 24, 2 | 2010-08-24 |
| Electron lens and charged particle beam apparatus Grant 7,759,652 - Ohshima , et al. July 20, 2 | 2010-07-20 |
| Transmission electron microscope Grant 7,755,046 - Kohashi , et al. July 13, 2 | 2010-07-13 |
| Charged particle beam apparatus App 20090294697 - Katagiri; Souichi ; et al. | 2009-12-03 |
| Small electron gun App 20090289186 - Katagiri; Soichi ; et al. | 2009-11-26 |
| Charged particle beam apparatus Grant 7,615,765 - Katagiri , et al. November 10, 2 | 2009-11-10 |
| Charged particle beam apparatus Grant 7,582,885 - Katagiri , et al. September 1, 2 | 2009-09-01 |
| Condensation Reaction by Metal Catalyst App 20090198070 - Mashima; Kazushi ; et al. | 2009-08-06 |
| Gas field ion source, charged particle microscope, and apparatus App 20090173888 - SHICHI; Hiroyasu ; et al. | 2009-07-09 |
| Charged Particle Application Apparatus App 20090101817 - OHSHIMA; Takashi ; et al. | 2009-04-23 |
| Charged Particle Beam System And Method For Evacuation Of The System App 20080315122 - Katagiri; Souichi ; et al. | 2008-12-25 |
| Scanning electron microscope App 20080237465 - Hatano; Michio ; et al. | 2008-10-02 |
| Transmission electron microscope App 20080210868 - Kohashi; Teruo ; et al. | 2008-09-04 |
| Electron Lens and Charged Particle Beam Apparatus App 20080067396 - Ohshima; Takashi ; et al. | 2008-03-20 |
| Charged particle beam apparatus Grant 7,339,167 - Ohshima , et al. March 4, 2 | 2008-03-04 |
| Small electron gun App 20070236143 - Katagiri; Soichi ; et al. | 2007-10-11 |
| Small electron gun Grant 7,238,939 - Katagiri , et al. July 3, 2 | 2007-07-03 |
| Charged particle beam apparatus App 20070102650 - Katagiri; Souichi ; et al. | 2007-05-10 |
| Charged particle beam apparatus App 20060231773 - Katagiri; Souichi ; et al. | 2006-10-19 |
| Charged particle beam apparatus App 20060076489 - Ohshima; Takashi ; et al. | 2006-04-13 |
| Absorption current image apparatus in electron microscope Grant 6,888,138 - Ohshima , et al. May 3, 2 | 2005-05-03 |
| Small electron gun App 20050052103 - Katagiri, Soichi ; et al. | 2005-03-10 |
| Absorption Current Image Apparatus In Electron Microscope App 20050045820 - Ohshima, Takashi ; et al. | 2005-03-03 |
| Complex and method for producing epoxides by using the complex Grant 6,833,442 - Shibasaki , et al. December 21, 2 | 2004-12-21 |
| Complex and method for producing epoxides by using the complex App 20030130488 - Shibasaki, Masakatsu ; et al. | 2003-07-10 |
| Schottky emission cathode and a method of stabilizing the same Grant 5,616,926 - Shinada , et al. April 1, 1 | 1997-04-01 |
| Transistor provided with strained germanium layer Grant 5,241,197 - Murakami , et al. August 31, 1 | 1993-08-31 |
| Method of forming a metal silicide film Grant 5,047,111 - Ishizaka , et al. September 10, 1 | 1991-09-10 |
| Automatic IC mounting process and apparatus for performing the process Grant 4,621,419 - Hino , et al. November 11, 1 | 1986-11-11 |
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