Ohsaki; Yumiko

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ohsaki; Yumiko.The latest application filed is for "measuring apparatus and exposure apparatus having the same".

Company Profile

0.13.11

Ohsaki; Yumiko - Utsunomiya JP
Ohsaki; Yumiko - Utsunomiya-shi JP
Ohsaki; Yumiko - Tokyo JP
Ohsaki; Yumiko - Tochigi JP
Ohsaki; Yumiko - Tochigi-ken JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Measuring apparatus and exposure apparatus having the same Grant 8,223,315 - Ohsaki July 17, 2	2012-07-17
Measurement apparatus, exposure apparatus, and device manufacturing method Grant 7,956,987 - Ohsaki June 7, 2	2011-06-07
Measurement apparatus, exposure apparatus, and device fabrication method Grant 7,688,424 - Ohsaki , et al. March 30, 2	2010-03-30
Exposure apparatus and device manufacturing method using a common path interferometer to form an interference pattern and a processor to calculate optical characteristics of projection optics using the interference pattern Grant 7,675,629 - Ohsaki , et al. March 9, 2	2010-03-09
Measuring Apparatus And Exposure Apparatus Having The Same App 20090274964 - Ohsaki; Yumiko	2009-11-05
Measuring apparatus and exposure apparatus having the same Grant 7,538,854 - Ohsaki May 26, 2	2009-05-26
Exposure apparatus and device manufacturing method Grant 7,508,493 - Takeuchi , et al. March 24, 2	2009-03-24
Measurement Apparatus, Exposure Apparatus, And Device Fabrication Method App 20090066925 - Ohsaki; Yumiko ; et al.	2009-03-12
Measurement Apparatus, Exposure Apparatus, And Device Manufacturing Method App 20080316448 - Ohsaki; Yumiko	2008-12-25
Exposure apparatus and device manufacturing method using the apparatus Grant 7,466,395 - Ohsaki , et al. December 16, 2	2008-12-16
Exposure Apparatus And Device Manufacturing Method App 20080062427 - Ohsaki; Yumiko ; et al.	2008-03-13
Exposure Apparatus And Device Manufacturing Method App 20070188730 - Takeuchi; Seiji ; et al.	2007-08-16
Exposure Apparatus And Device Manufacturing Method Using The Apparatus App 20070019175 - Ohsaki; Yumiko ; et al.	2007-01-25
Image processing apparatus and method for converting data dependent on a first illuminating light into data dependent on a second illuminating light Grant 7,158,144 - Shiraiwa , et al. January 2, 2	2007-01-02
Measuring Apparatus And Exposure Apparatus Having The Same App 20060187435 - Ohsaki; Yumiko	2006-08-24
Projection optical system and exposure apparatus Grant 6,975,385 - Ohsaki , et al. December 13, 2	2005-12-13
Interferometer and interferance measurement method Grant 6,842,255 - Ohsaki , et al. January 11, 2	2005-01-11
Projection optical system and exposure apparatus App 20040095567 - Ohsaki, Yumiko ; et al.	2004-05-20
Exposure method based on multiple exposure process Grant 6,709,794 - Ohsaki March 23, 2	2004-03-23
Exposure method based on multiple exposure process App 20030203318 - Ohsaki, Yumiko	2003-10-30
Mask for multiple exposure Grant 6,620,556 - Ohsaki September 16, 2	2003-09-16
Exposure method based on multiple exposure process Grant 6,586,168 - Ohsaki July 1, 2	2003-07-01
Interferometer and interferance measurement method App 20020176090 - Ohsaki, Yumiko ; et al.	2002-11-28
Image Processing Apparatus, Method And Recording Medium Therefor App 20010040588 - SHIRAIWA, YOSHINOBU ; et al.	2001-11-15

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