Patent | Date |
---|
Inter-reflection detection apparatus and inter-reflection detection method Grant 11,441,896 - Ohnishi September 13, 2 | 2022-09-13 |
Three-dimensional measurement apparatus, three-dimensional measurement method and non-transitory computer readable medium Grant 11,321,860 - Matsumoto , et al. May 3, 2 | 2022-05-03 |
Three-dimensional measurement system and three-dimensional measurement method Grant 11,302,022 - Ohnishi , et al. April 12, 2 | 2022-04-12 |
Three-dimensional Measurement System And Three-dimensional Measurement Method App 20210358157 - OHNISHI; Yasuhiro ;   et al. | 2021-11-18 |
Three-dimensional Measurement Apparatus, Three-dimensional Measurement Method And Non-transitory Computer Readable Medium App 20210358147 - MATSUMOTO; Shinya ;   et al. | 2021-11-18 |
Three-dimensional shape measurement device, three-dimensional shape measurement method, and program Grant 11,055,863 - Hayashi , et al. July 6, 2 | 2021-07-06 |
Robot Control Device, Robot Control Method, And Robot Control Non-transitory Computer Readable Medium App 20210197391 - OHNISHI; Yasuhiro ;   et al. | 2021-07-01 |
Three-dimensional-shape measurement device, three-dimensional-shape measurement method, and program Grant 10,997,738 - Ohnishi , et al. May 4, 2 | 2021-05-04 |
Inter-reflection Detection Apparatus And Inter-reflection Detection Method App 20200033119 - OHNISHI; Yasuhiro | 2020-01-30 |
Three-dimensional Shape Measurement Device, Three-dimensional Shape Measurement Method, And Program App 20200020119 - HAYASHI; Kennosuke ;   et al. | 2020-01-16 |
Three-dimensional-shape Measurement Device, Three-dimensional-shape Measurement Method, And Program App 20190392599 - OHNISHI; Yasuhiro ;   et al. | 2019-12-26 |
Image processing device, method for controlling same, program, and inspection system Grant 9,752,994 - Kojima , et al. September 5, 2 | 2017-09-05 |
Inspection Apparatus App 20150253129 - OHNISHI; Yasuhiro | 2015-09-10 |
Image Processing Device, Method For Controlling Same, Program, And Inspection System App 20140372075 - KOJIMA; Takeshi ;   et al. | 2014-12-18 |
Profilometer, measuring apparatus, and observing apparatus Grant 8,717,578 - Ohnishi , et al. May 6, 2 | 2014-05-06 |
Apparatus and method for inspecting surface state Grant 8,615,125 - Mori , et al. December 24, 2 | 2013-12-24 |
Shape measurement apparatus and calibration method Grant 8,363,929 - Kojima , et al. January 29, 2 | 2013-01-29 |
Shape measuring apparatus and shape measuring method Grant 8,334,985 - Sho , et al. December 18, 2 | 2012-12-18 |
Shape Measuring Apparatus And Shape Measuring Method App 20120086950 - Sho; To ;   et al. | 2012-04-12 |
Apparatus And Method For Inspecting Surface State App 20120087566 - Mori; Yasumoto ;   et al. | 2012-04-12 |
Profilometer, Measuring Apparatus, And Observing Apparatus App 20120044504 - Ohnishi; Yasuhiro ;   et al. | 2012-02-23 |
Shape Measurement Apparatus And Calibration Method App 20110262007 - KOJIMA; Takeshi ;   et al. | 2011-10-27 |
Three-dimensional Measurement Apparatus And Method App 20110228052 - Ohnishi; Yasuhiro ;   et al. | 2011-09-22 |
Profilometer App 20100259746 - Ohnishi; Yasuhiro ;   et al. | 2010-10-14 |
Phosphate Compound And Preparation Process Thereof, Phosphate Copper Compound And Preparation Process Thereof, Near Infrared Ray Absorber, And Infrared Ray-absorbing Acrylic Resin Composition App 20020068778 - OHNISHI, YASUHIRO ;   et al. | 2002-06-06 |
Device for controlling tension of tape for use in automatic tape affixing apparatus Grant 5,032,211 - Shinno , et al. July 16, 1 | 1991-07-16 |
Automatic tape affixing apparatus Grant 5,011,563 - Shinno , et al. April 30, 1 | 1991-04-30 |
Automatic tape affixing apparatus Grant 4,997,510 - Shinno , et al. March 5, 1 | 1991-03-05 |
Automatic tape affixing apparatus Grant 4,981,545 - Shinno , et al. January 1, 1 | 1991-01-01 |