Ohlhoff; Carsten

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ohlhoff; Carsten.The latest application filed is for "semiconductor device test system and method".

Company Profile

0.15.18

Ohlhoff; Carsten - Dresden DE
Ohlhoff; Carsten - Munich DE
Ohlhoff; Carsten - Munchen DE
Ohlhoff, Carsten - Presden DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Test apparatus and method for testing a circuit unit Grant 7,574,643 - Gollmer , et al. August 11, 2	2009-08-11
Method and apparatus for masking known fails during memory tests readouts Grant 7,490,274 - Hoffmann , et al. February 10, 2	2009-02-10
Semiconductor Device Test System And Method App 20080246505 - Kollwitz; Markus ; et al.	2008-10-09
Memory module, test system and method for testing one or a plurality of memory modules Grant 7,231,562 - Ohlhoff , et al. June 12, 2	2007-06-12
Test circuit and method for testing an integrated memory circuit Grant 7,197,678 - Ohlhoff , et al. March 27, 2	2007-03-27
Method and apparatus for masking known fails during memory tests readouts Grant 7,137,049 - Hoffmann , et al. November 14, 2	2006-11-14
Method and apparatus for masking known fails during memory tests readouts App 20060242492 - Hoffmann; Jochen ; et al.	2006-10-26
Data generator for generating test data for word-oriented semiconductor memories Grant 7,120,841 - Ohlhoff October 10, 2	2006-10-10
Test apparatus and method for testing a circuit unit App 20060202706 - Gollmer; Stefan ; et al.	2006-09-14
Test device, test system and method for testing a memory circuit Grant 7,107,501 - Ohlhoff , et al. September 12, 2	2006-09-12
Dynamic memory and method for testing a dynamic memory Grant 7,092,303 - Ohlhoff August 15, 2	2006-08-15
Electronic circuit App 20060120199 - Ohlhoff; Carsten ; et al.	2006-06-08
Integrated semiconductor circuit configuration Grant 6,891,431 - Beer , et al. May 10, 2	2005-05-10
Memory module, test system and method for testing one or a plurality of memory modules App 20040260987 - Ohlhoff, Carsten ; et al.	2004-12-23
Dynamic memory and method for testing a dynamic memory App 20040233745 - Ohlhoff, Carsten	2004-11-25
Method and apparatus for masking known fails during memory tests readouts App 20040221210 - Hoffmann, Jochen ; et al.	2004-11-04
Integrated circuit having a current measuring unit Grant 6,756,787 - Ohlhoff , et al. June 29, 2	2004-06-29
Integrated semiconductor circuit configuration App 20040066209 - Beer, Peter ; et al.	2004-04-08
Test circuit and method for testing an integrated memory circuit App 20040015757 - Ohlhoff, Carsten ; et al.	2004-01-22
Memory module with improved electrical properties Grant 6,670,665 - Beer , et al. December 30, 2	2003-12-30
Semiconductor chip with trimmable oscillator Grant 6,671,221 - Beer , et al. December 30, 2	2003-12-30
Testing device for testing a memory Grant 6,661,718 - Ohlhoff , et al. December 9, 2	2003-12-09
Test device, test system and method for testing a memory circuit App 20030226074 - Ohlhoff, Carsten ; et al.	2003-12-04
Configuration for measurement of internal voltages of an integrated semiconductor apparatus Grant 6,657,452 - Beer , et al. December 2, 2	2003-12-02
Memory chip having a test mode and method for checking memory cells of a repaired memory chip Grant 6,639,856 - Beer , et al. October 28, 2	2003-10-28
Memory module with improved electrical properties App 20030146461 - Beer, Peter ; et al.	2003-08-07
Integrated circuit having a current measuring unit App 20030057987 - Ohlhoff, Carsten ; et al.	2003-03-27
Data generator for generating test data for word-oriented semiconductor memories App 20030018934 - Ohlhoff, Carsten	2003-01-23
Memory chip having a test mode and method for checking memory cells of a repaired memory chip App 20020191454 - Beer, Peter ; et al.	2002-12-19
Semiconductor chip with trimmable oscillator App 20020177267 - Beer, Peter ; et al.	2002-11-28
Testing device for testing a memory App 20020149975 - Ohlhoff, Carsten ; et al.	2002-10-17
Configuration for measurement of internal voltages in an integrated semiconductor apparatus App 20010005143 - Beer, Peter ; et al.	2001-06-28
Configuration for trimming reference voltages in semiconductor chips, in particular semiconductor memories App 20010004126 - Ohlhoff, Carsten	2001-06-21

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