Ohgarane; Daisuke

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ohgarane; Daisuke.The latest application filed is for "transmission electron diffraction measurement apparatus and method for measuring transmission electron diffraction pattern".

Company Profile

0.8.6

Ohgarane; Daisuke - Hadano JP
Ohgarane; Daisuke - Kanagawa N/A JP
Ohgarane; Daisuke - Atsugi N/A JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Transmission electron diffraction measurement apparatus and method for measuring transmission electron diffraction pattern Grant 9,244,025 - Ohgarane , et al. January 26, 2	2016-01-26
Transmission Electron Diffraction Measurement Apparatus And Method For Measuring Transmission Electron Diffraction Pattern App 20150008321 - OHGARANE; Daisuke ; et al.	2015-01-08
Thin film transistor with metal silicide layer Grant 8,664,722 - Shingu , et al. March 4, 2	2014-03-04
Semiconductor device and method for manufacturing the same Grant 8,546,210 - Yamamoto , et al. October 1, 2	2013-10-01
Semiconductor Device And Manufacturing Method Thereof App 20120049276 - SHINGU; Takashi ; et al.	2012-03-01
Manufacturing method for thin film transistor on insulator Grant 8,053,289 - Shingu , et al. November 8, 2	2011-11-08
Method for manufacturing semiconductor device Grant 8,048,749 - Yokoi , et al. November 1, 2	2011-11-01
Semiconductor Device And Method For Manufacturing The Same App 20100237354 - YAMAMOTO; Yoshiaki ; et al.	2010-09-23
Semiconductor device, and method for manufacturing the same Grant 7,736,964 - Yamamoto , et al. June 15, 2	2010-06-15
Semiconductor Device And Manufacturing Method Thereof App 20090096024 - SHINGU; Takashi ; et al.	2009-04-16
Method For Manufacturing Semiconductor Device App 20090029514 - YOKOI; Tomokazu ; et al.	2009-01-29
Semiconductor device, and method for manufacturing the same App 20060110863 - Yamamoto; Yoshiaki ; et al.	2006-05-25

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