Ohashi; Takeyoshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ohashi; Takeyoshi.The latest application filed is for "electron microscope and method of adjusting focus of electron microscope".

Company Profile

7.25.23

Ohashi; Takeyoshi - Tokyo JP
Ohashi; Takeyoshi - Tachikawa N/A JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Image processing device, image processing method and charged particle microscope Grant 11,430,106 - Ohashi , et al. August 30, 2	2022-08-30
Scanning electron microscope and method for measuring pattern Grant 11,276,554 - Ohashi , et al. March 15, 2	2022-03-15
Electron Microscope And Method Of Adjusting Focus Of Electron Microscope App 20210384006 - Ohashi; Takeyoshi ; et al.	2021-12-09
Inspection system, image processing device and inspection method Grant 10,943,762 - Ohashi , et al. March 9, 2	2021-03-09
Scanning Electron Microscope And Method For Measuring Pattern App 20210043420 - Ohashi; Takeyoshi ; et al.	2021-02-11
Charged particle beam device and aberration correction method for charged particle beam device Grant 10,727,024 - Urano , et al.	2020-07-28
Image Processing Device, Image Processing Method And Charged Particle Microscope App 20200219243 - OHASHI; Takeyoshi ; et al.	2020-07-09
Aberration correction method, aberration correction system, and charged particle beam apparatus Grant 10,446,361 - Cheng , et al. Oc	2019-10-15
Inspection System, Image Processing Device And Inspection Method App 20190244783 - OHASHI; Takeyoshi ; et al.	2019-08-08
Charged Particle Beam Device And Aberration Correction Method For Charged Particle Beam Device App 20190214222 - URANO; Kotoko ; et al.	2019-07-11
Scanning electron microscope Grant 10,134,558 - Sohda , et al. November 20, 2	2018-11-20
Aberration Correction Method, Aberration Correction System, And Charged Particle Beam Apparatus App 20180190469 - CHENG; Zhaohui ; et al.	2018-07-05
Method for estimating shape before shrink and CD-SEM apparatus Grant 9,830,524 - Sekiguchi , et al. November 28, 2	2017-11-28
Scanning Electron Microscope App 20170018394 - SOHDA; Yasunari ; et al.	2017-01-19
Electron beam equipment Grant 9,543,053 - Sohda , et al. January 10, 2	2017-01-10
Measurement method, image processing device, and charged particle beam apparatus Grant 9,536,170 - Ohashi , et al. January 3, 2	2017-01-03
Charged-particle beam device Grant 9,443,695 - Ohashi , et al. September 13, 2	2016-09-13
Measuring method, data processing apparatus and electron microscope using same Grant 9,305,744 - Ohashi , et al. April 5, 2	2016-04-05
Aberration corrector and charged particle beam apparatus using the same Grant 9,287,084 - Cheng , et al. March 15, 2	2016-03-15
Charged particle instrument Grant 9,230,775 - Ohashi , et al. January 5, 2	2016-01-05
Charged-particle Beam Device App 20150348747 - OHASHI; Takeyoshi ; et al.	2015-12-03
Specimen potential measuring method, and charged particle beam device Grant 9,129,775 - Ishijima , et al. September 8, 2	2015-09-08
Aberration Corrector And Charged Particle Beam Apparatus Using The Same App 20150248944 - Cheng; Zhaohui ; et al.	2015-09-03
Measurement Method, Image Processing Device, And Charged Particle Beam Apparatus App 20150110406 - Ohashi; Takeyoshi ; et al.	2015-04-23
Method For Estimating Shape Before Shrink And Cd-sem Apparatus App 20150036914 - Sekiguchi; Tomoko ; et al.	2015-02-05
Electron Beam Equipment App 20150034836 - Sohda; Yasunari ; et al.	2015-02-05
Measuring Method, Data Processing Apparatus And Electron Microscope Using Same App 20140246585 - Ohashi; Takeyoshi ; et al.	2014-09-04
Pattern evaluation method, device therefor, and electron beam device Grant 8,816,277 - Yamanashi , et al. August 26, 2	2014-08-26
Electron beam device Grant 8,735,814 - Sohda , et al. May 27, 2	2014-05-27
Scanning electron microscope Grant 8,704,175 - Sohda , et al. April 22, 2	2014-04-22
Scanning electron microscope and inspection method using same Grant 8,637,820 - Sohda , et al. January 28, 2	2014-01-28
Electron Beam Device App 20130270435 - Sohda; Yasunari ; et al.	2013-10-17
Scanning Electron Microscope App 20130175447 - Sohda; Yasunari ; et al.	2013-07-11
Pattern Evaluation Method, Device Therefor, And Electron Beam Device App 20130026361 - Yamanashi; Hiromasa ; et al.	2013-01-31
Charged Particle Instrument App 20120286160 - OHASHI; Takeyoshi ; et al.	2012-11-15
Scanning Electron Microscope And Inspection Method Using Same App 20120286158 - Sohda; Yasunari ; et al.	2012-11-15
Specimen Potential Measuring Method, And Charged Particle Beam Device App 20120119085 - Ishijima; Tatsuaki ; et al.	2012-05-17

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