loadpatents
Patent applications and USPTO patent grants for Ohashi; Takeyoshi.The latest application filed is for "electron microscope and method of adjusting focus of electron microscope".
Patent | Date |
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Image processing device, image processing method and charged particle microscope Grant 11,430,106 - Ohashi , et al. August 30, 2 | 2022-08-30 |
Scanning electron microscope and method for measuring pattern Grant 11,276,554 - Ohashi , et al. March 15, 2 | 2022-03-15 |
Electron Microscope And Method Of Adjusting Focus Of Electron Microscope App 20210384006 - Ohashi; Takeyoshi ;   et al. | 2021-12-09 |
Inspection system, image processing device and inspection method Grant 10,943,762 - Ohashi , et al. March 9, 2 | 2021-03-09 |
Scanning Electron Microscope And Method For Measuring Pattern App 20210043420 - Ohashi; Takeyoshi ;   et al. | 2021-02-11 |
Charged particle beam device and aberration correction method for charged particle beam device Grant 10,727,024 - Urano , et al. | 2020-07-28 |
Image Processing Device, Image Processing Method And Charged Particle Microscope App 20200219243 - OHASHI; Takeyoshi ;   et al. | 2020-07-09 |
Aberration correction method, aberration correction system, and charged particle beam apparatus Grant 10,446,361 - Cheng , et al. Oc | 2019-10-15 |
Inspection System, Image Processing Device And Inspection Method App 20190244783 - OHASHI; Takeyoshi ;   et al. | 2019-08-08 |
Charged Particle Beam Device And Aberration Correction Method For Charged Particle Beam Device App 20190214222 - URANO; Kotoko ;   et al. | 2019-07-11 |
Scanning electron microscope Grant 10,134,558 - Sohda , et al. November 20, 2 | 2018-11-20 |
Aberration Correction Method, Aberration Correction System, And Charged Particle Beam Apparatus App 20180190469 - CHENG; Zhaohui ;   et al. | 2018-07-05 |
Method for estimating shape before shrink and CD-SEM apparatus Grant 9,830,524 - Sekiguchi , et al. November 28, 2 | 2017-11-28 |
Scanning Electron Microscope App 20170018394 - SOHDA; Yasunari ;   et al. | 2017-01-19 |
Electron beam equipment Grant 9,543,053 - Sohda , et al. January 10, 2 | 2017-01-10 |
Measurement method, image processing device, and charged particle beam apparatus Grant 9,536,170 - Ohashi , et al. January 3, 2 | 2017-01-03 |
Charged-particle beam device Grant 9,443,695 - Ohashi , et al. September 13, 2 | 2016-09-13 |
Measuring method, data processing apparatus and electron microscope using same Grant 9,305,744 - Ohashi , et al. April 5, 2 | 2016-04-05 |
Aberration corrector and charged particle beam apparatus using the same Grant 9,287,084 - Cheng , et al. March 15, 2 | 2016-03-15 |
Charged particle instrument Grant 9,230,775 - Ohashi , et al. January 5, 2 | 2016-01-05 |
Charged-particle Beam Device App 20150348747 - OHASHI; Takeyoshi ;   et al. | 2015-12-03 |
Specimen potential measuring method, and charged particle beam device Grant 9,129,775 - Ishijima , et al. September 8, 2 | 2015-09-08 |
Aberration Corrector And Charged Particle Beam Apparatus Using The Same App 20150248944 - Cheng; Zhaohui ;   et al. | 2015-09-03 |
Measurement Method, Image Processing Device, And Charged Particle Beam Apparatus App 20150110406 - Ohashi; Takeyoshi ;   et al. | 2015-04-23 |
Method For Estimating Shape Before Shrink And Cd-sem Apparatus App 20150036914 - Sekiguchi; Tomoko ;   et al. | 2015-02-05 |
Electron Beam Equipment App 20150034836 - Sohda; Yasunari ;   et al. | 2015-02-05 |
Measuring Method, Data Processing Apparatus And Electron Microscope Using Same App 20140246585 - Ohashi; Takeyoshi ;   et al. | 2014-09-04 |
Pattern evaluation method, device therefor, and electron beam device Grant 8,816,277 - Yamanashi , et al. August 26, 2 | 2014-08-26 |
Electron beam device Grant 8,735,814 - Sohda , et al. May 27, 2 | 2014-05-27 |
Scanning electron microscope Grant 8,704,175 - Sohda , et al. April 22, 2 | 2014-04-22 |
Scanning electron microscope and inspection method using same Grant 8,637,820 - Sohda , et al. January 28, 2 | 2014-01-28 |
Electron Beam Device App 20130270435 - Sohda; Yasunari ;   et al. | 2013-10-17 |
Scanning Electron Microscope App 20130175447 - Sohda; Yasunari ;   et al. | 2013-07-11 |
Pattern Evaluation Method, Device Therefor, And Electron Beam Device App 20130026361 - Yamanashi; Hiromasa ;   et al. | 2013-01-31 |
Charged Particle Instrument App 20120286160 - OHASHI; Takeyoshi ;   et al. | 2012-11-15 |
Scanning Electron Microscope And Inspection Method Using Same App 20120286158 - Sohda; Yasunari ;   et al. | 2012-11-15 |
Specimen Potential Measuring Method, And Charged Particle Beam Device App 20120119085 - Ishijima; Tatsuaki ;   et al. | 2012-05-17 |
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