OH; Se-jang

Patent Applications and Registrations

Patent applications and USPTO patent grants for OH; Se-jang.The latest application filed is for "built off testing apparatus".

Company Profile

0.11.11

OH; Se-jang - Seongnam-si KR
Oh; Se-Jang - Gyeonggi-do KR
Oh; Se-Jang - Anyang KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Built Off Testing Apparatus App 20140139258 - OH; Se-jang ; et al.	2014-05-22
Built off testing apparatus Grant 8,674,718 - Oh , et al. March 18, 2	2014-03-18
Test interface device, test system and optical interface memory device Grant 8,606,102 - Lee , et al. December 10, 2	2013-12-10
Electrical signal transmission module, method of transmitting electric signals and electrical inspection apparatus having the same Grant 8,139,949 - Lee , et al. March 20, 2	2012-03-20
Interface structure of wafer test equipment Grant 8,026,733 - Lee , et al. September 27, 2	2011-09-27
Semiconductor device test apparatus including interface unit and method of testing semiconductor device using the same Grant 7,973,550 - Byun , et al. July 5, 2	2011-07-05
Interposer and probe card having the same Grant 7,884,628 - An , et al. February 8, 2	2011-02-08
Wireless interface probe card for high speed one-shot wafer test and semiconductor testing apparatus having the same Grant 7,880,490 - Lee , et al. February 1, 2	2011-02-01
Built Off Testing Apparatus App 20100289517 - OH; Se-jang ; et al.	2010-11-18
Semiconductor Device Test Apparatus Including Interface Unit And Method Of Testing Semiconductor Device Using The Same App 20100182035 - Byun; Eun-Jo ; et al.	2010-07-22
Test interface device, test system and optical interface memory device App 20100150549 - Lee; Sang-Hoon ; et al.	2010-06-17
Interface structure of wafer test equipment App 20100117673 - Lee; Sang-hoon ; et al.	2010-05-13
Interface device for wireless testing, semiconductor device and semiconductor package including the same, and method for wirelessly testing using the same App 20100025682 - Lee; Sang-Hoon ; et al.	2010-02-04
Interposer and a probe card assembly for electrical die sorting and methods of operating and manufacturing the same App 20090189624 - Oh; Se-Jang ; et al.	2009-07-30
Electrical test system including coaxial cables Grant 7,538,566 - An , et al. May 26, 2	2009-05-26
Interposer and probe card having the same App 20090102500 - An; Young-Soo ; et al.	2009-04-23
Wireless Interface Probe Card For High Speed One-shot Wafer Test And Semiconductor Testing Apparatus Having The Same App 20090066350 - LEE; Sang-Hoon ; et al.	2009-03-12
Electrical Signal Transmission Module, Method Of Transmitting Electric Signals And Electrical Inspection Apparatus Having The Same App 20090028571 - Lee; Sang-Hoon ; et al.	2009-01-29
Electrical Test System Including Coaxial Cables App 20080100314 - AN; Young-soo ; et al.	2008-05-01
Tester of semiconductor memory device and test method thereof Grant 6,625,766 - Oh , et al. September 23, 2	2003-09-23

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